Jsm 7001f scanning electron microscope
The JSM-7001F is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to produce high-resolution images of small-scale structures and surface features. The JSM-7001F uses a focused electron beam to scan the surface of a sample, generating signals that are used to create an image. The core function of this equipment is to provide detailed imaging and analysis of a wide range of materials and samples.
Lab products found in correlation
8 protocols using jsm 7001f scanning electron microscope
Surface Characterization Techniques
SEM Analysis of Cell Morphology
Multimodal Microscopy Imaging Protocol
In order to study the CA on cell cultures, image stacks were taken with a confocal laser scanning microscope (LSM 880, Zeiss) and 3D animations were obtained by means of the ImageJ program (NIH).
Ultrathin sections were examined using a JEOL JEM-1010 transmission electron microscope operated at an accelerating voltage of 80 kV. The images were obtained using a CCD Orius camera (Gatan).
SEM images were observed using a JEOL JSM-7001F scanning electron microscope.
Morphological Changes in E. coli by Raniseptins
Scanning Electron Microscopy of Femoral Heads
Topography and Apatite Formation on Ti Surface
Morphological Analysis of Nanomaterials
Ultrastructural Analysis of Zoea I and Adult Esophagus
Observations were made with a JEOL JSM-7001F scanning electron microscope. The post-fixative treatment and TEM and SEM observations were realized at CCiTUB (Hospital Clinic, University of Barcelona, Spain).
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