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Jsm 7001f scanning electron microscope

Manufactured by JEOL
Sourced in Japan

The JSM-7001F is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to produce high-resolution images of small-scale structures and surface features. The JSM-7001F uses a focused electron beam to scan the surface of a sample, generating signals that are used to create an image. The core function of this equipment is to provide detailed imaging and analysis of a wide range of materials and samples.

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8 protocols using jsm 7001f scanning electron microscope

1

Surface Characterization Techniques

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Contact angles were measured using a VCA Optima surface analysis/goniometry system. Surface composition was analyzed by X-ray Photoelectron Spectroscopy using using a Physical Electronics Quantum 2000 Microprobe with monochromatic Al X-rays. Films surface structures characterization was carried out using an Olympus optical microscope, DI Dimension-3000 atomic force microscope and JEOL JSM–7001F scanning electron microscope. Film thicknesses were analyzed using a Veeco Dektak Stylus Profilometer.
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2

SEM Analysis of Cell Morphology

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To visualize possible changes in cell shape and surface after treatments, cells were treated and analyzed under a scanning electron microscope (SEM). A total of 5 × 105 cells were seeded on 18x18mm coverslips placed at the bottom of the 6-well plate. After adhesion, the cells received the treatment for 72 h with SLN-DTX at concentrations of 1 µg/mL or did not. Then, the culture medium was discarded and the cells were washed twice with 1X PSB and then fixed with Karnovsky fixative solution (containing 2% glutaraldehyde, 2% paraformaldehyde, and 3% sucrose in sodium cacodylate buffer 0.1 M pH 7.2), overnight. The following day, cells were washed with 0.1 M sodium cacodylate buffer, pH 7.2. Coverslips were incubated in vapor of sodium tetroxide 2% osmium for 30 min and then washed with distilled water. Dehydration was carried out in increasing series with acetone (50–100%) and, finally, drying to a critical point using CPD 030 (BALZERS, Geneva, IL, USA) and SCD 500 metalization (LEICA, Wetzlar, Hesse, Germany), to be analyzed in a JSM 7001F scanning electron microscope (15 kV) (Jeol—Tokyo, Japan).
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3

Multimodal Microscopy Imaging Protocol

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Images were captured with a fluorescence laser in an optical microscope (BX41, Olympus) and stored in TIFF format. All of the images were acquired using the same microscope, laser, and software settings. Exposure time was adapted to each staining, but the respective control images were acquired with the same exposure time. Image analysis and treatment were performed using the ImageJ program (NIH). Images that were modified for contrast and brightness to enhance their visualization were processed in the same way as the images corresponding to their respective controls.
In order to study the CA on cell cultures, image stacks were taken with a confocal laser scanning microscope (LSM 880, Zeiss) and 3D animations were obtained by means of the ImageJ program (NIH).
Ultrathin sections were examined using a JEOL JEM-1010 transmission electron microscope operated at an accelerating voltage of 80 kV. The images were obtained using a CCD Orius camera (Gatan).
SEM images were observed using a JEOL JSM-7001F scanning electron microscope.
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4

Morphological Changes in E. coli by Raniseptins

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Scanning electron microscopy was used to visualize the morphological alterations of Escherichia coli (ATCC 25922) induced by the incubation with Raniseptins-3 and -6. After the mid-log period, the bacteria were centrifuged at 13,000 rpm for 10 min, washed with 10 mM PBS (pH 7.6) and resuspended with an OD = 0.3, and then incubated with the peptides for 1 h and 30 min, using concentrations that corresponded to the MIC value. At the end of the incubation time, the cells were washed 3 times with PBS and centrifuged at 13,000 rpm for 5 min. Then, the pellets were fixed overnight with 0.1% Karnovsky, washed with buffer and dehydrated in a gradual series of acetone. After drying at the critical point and metallization of the material, the samples were observed using a JEOL JSM-7001F scanning electron microscope (Jeol Ltd., Akishima, Tokyo, Japan).
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5

Scanning Electron Microscopy of Femoral Heads

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A field-emission-gun scanning electron microscope (JSM 7001F Scanning Electron Microscope, JEOL, Tokyo, Japan) was used to observe the fracture surface morphology of the femoral head samples. The instrument was equipped with an Electron Dispersive X-ray Diffraction (EDS) probe. All images were collected at an acceleration voltage of 10 kV and magnifications between 100× and 50,000×. All samples were sputter-coated (Cressington, Watford, UK) with a thin (20 to 30 Å) platinum layer.
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6

Topography and Apatite Formation on Ti Surface

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Ti surface topography generated by modifications of the thermochemical treatment and the formation of apatite on the surface after immersion in SBF was examined with a JSM-7001F scanning electron microscope (JEOL, Toyo, Tokyo, Japan), operating at a voltage of 10 kV. The chemical composition of the surfaces was analyzed using an energy-dispersive X-ray analyzer (EDS, JSM-6400 JEOL) at 20 kV. For the examination of the apatite formation, a Pt-Pd coating was used to provide conductivity.
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7

Morphological Analysis of Nanomaterials

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The morphology was examined using a JSM-7001F scanning electron microscope (SEM, JEOL, Tokyo, Japan), a JEM-2100F transmission electron microscope (TEM, JEOL, Tokyo, Japan), and a SPA-400/SPI3800N scanning probe microscope (SPM, Hitachi High-Technologies, Tokyo, Japan).
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8

Ultrastructural Analysis of Zoea I and Adult Esophagus

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Zoea I specimens and pieces of the esophagus of the adults were fixed with 2 % paraformaldehyde -2.5 % glutaraldehyde in cacodylate buffer (0.1 mol L -1 pH 7.4) in total darkness at 4 °C for 12 h. Then, the samples were rinsed twice with cacodylate buffer and post-fixed in 1 % osmium tetroxide solution in cacodylate buffer. After the post-fixation the samples were dehydrated in a graded series of acetone. For the transmission electron microscopy post-fixed samples were embedded in Spurr's resin and cut into semi-thin (0.5 µm) and ultrathin (50-70 nm) sections with an ultramicrotome (Leica UCT, Wetzlar, Germany). Before observation, grids were counterstained with uranyl acetate and lead citrate. The observations were realized in a JEOL EM-1010 electron microscope at 80 kV equipped with an image analysis system (AnalySIS, SIS, Münster, Germany), a single zoea I specimen and two adult specimens were observed. For scanning electron microscopy, post-fixed samples were criticalpoint-dried, mounted on SEM stubs with self-adhesive stickers and coated with carbon.
Observations were made with a JEOL JSM-7001F scanning electron microscope. The post-fixative treatment and TEM and SEM observations were realized at CCiTUB (Hospital Clinic, University of Barcelona, Spain).
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