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14 protocols using r928 pmt

1

Comprehensive Characterization of Compounds

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Nuclear magnetic resonance (NMR) spectra were recorded on an Avance III (400 MHz, Bruker) spectrophotometer. 19F NMR spectra were recorded using trifluoroacetic acid as a standard (δ = −76.55 ppm). Mass spectrometry was performed on an LC/MS 6545 Q-TOF (Agilent, Santa Clara, CA, USA) in APCI mode. Purity analysis by HPLC was performed on an Agilent 1100 system with diode array detector and C8 ZORBAX Eclipse Plus column (Agilent). Absorption data was collected on a Cary-100 UV–Vis spectrophotometer (Agilent) in double-beam mode using 1 cm path quartz cuvettes. Corrected fluorescence spectra were collected on a Fluorolog 3 fluorometer (Horiba Jobin-Yvon, Edison, NJ, USA) equipped with an R928 PMT (Hamamatsu, Shizuoka, Japan). Solutions were prepared such that absorption remained below 0.1 AU to prevent reabsorption and self-quenching. Fluorescence spectra were recording using an excitation wavelength corresponding to the maximum Q-band absorption.
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2

Afterglow Intensity Measurement Protocol

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The afterglow intensity was recorded by continuously irradiating 20 s under xenon lamp and then the afterglow signal was collected by Hamamatsu R928 PMT with the time interval of 10 ms.
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3

Photoluminescence Decay Curves of CsPbCl3 QDs

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Photoluminescence (PL) decay curves of the CsPbCl3 QDs were recorded by using an Edinburgh Instruments diode laser with an excitation wavelength of 376.8 nm (65 ps pulse width, 0.2‒20 MHz repetition rate) and a Hamamatsu H74220‒02 PMT in combination with the Edinburgh spectrofluorometer. PL decay measurements of the Mn2+ dopants were done using an optical parametric oscillator (OPO) system (Opotek HE 355 II) pumped by the third harmonic of a Nd:YAG laser as excitation source and a Hamamatsu R928 PMT as light detection. The samples for optical analysis were prepared by dissolving the crude QDs production in toluene in a quartz cuvette.
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4

Time-Resolved Photoluminescence Measurements

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Time-resolved photoluminescence
measurements were conducted with an Edinburgh Instruments LP980 laser
flash photolysis system. The excitation source was a frequency-tripled
(355 nm) spectroscopic quantum-ray INDI Nd:YAG laser, operating at
1 Hz with a 6–8 ns pulse width. The spectrometer was equipped
with an Andor i-Star ICCD camera for steady-state measurements and
a Hamamatsu R928 PMT for measuring single-wavelength kinetics. The
reported single-wavelength kinetic lifetimes were averaged over multiple
trials, and a long-pass filter with a 400 nm cutoff was used to block
ca. 99% of the 355 nm excitation pulses from entering the detection
system.
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5

Multitechnique Characterization of Materials

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Powder X-ray diffraction patterns (XRD) were measured using a Bruker AXS D8 Advance diffractometer (Billerica, MA, USA) in Bragg–Brentano geometry (Cu Kα radiation λ = 0.15406 nm). Transmission electron microscopy (TEM) (Hitachi HT7700, Ltd. Tokyo, Japan) images were taken with a Hitachi HT7700 transmission electron microscope (100 kV accelerating voltage). An Andor Shamrock 500i spectrometer (Andor Technology Ltd., Belfast, UK), coupled with a silicon iDus CCD camera, working as a detector, was used for the emission spectra measurements. The samples were excited by the use of the fiber-coupled, solid-state diode pumped (SSDP) 975 and 785 nm lasers, i.e., FC-975-2W (CNI; Changchun, China) and LW-785-120-C12-DM (Lambdawave, Wrocław, Poland), respectively.
In both cases, the beam spot sizes were ≈200 µm (Gauss profile), and the laser power was adjusted to ≈100 mW, for both excitation wavelengths, which corresponds to the power densities of ≈50 W cm−2. The luminescence decay curves were recorded using a 200 MHz Tektronix MDO3022 oscilloscope, coupled to the R928 PMT (Hamamatsu, Shimokanzo, Japan) and a QuantaMaster™ 40 spectrophotometer (Photon Technology International, Birmingham Rd, Birmingham UK). A tunable Opolette 355LD UVDM, nano-second pulsed laser, with a repetition rate of 20 Hz (Opotek Inc., Faraday Ave Suite E, Carlsbad, CA, USA), was used as the excitation source.
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6

Characterization of Fluorescent Compounds

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Reagents and chemicals, including silica gel (60 Å, 230–400 mesh), were purchased from VWR (Radnor, PA, USA) and used without further purification unless otherwise noted. Nuclear magnetic resonance (NMR) spectra were recorded on an Avance III (400 MHz, Bruker, Billerica, MA, USA) spectrophotometer. 19F NMR spectra were recorded using trifluoroacetic acid as a standard (δ = −76.55 ppm). Mass spectrometry was performed on an LC/MS 6545 Q-TOF (Agilent, Santa Clara, CA, USA) in APCI mode. Purity analysis by HPLC was performed on an Agilent 1100 system with a diode array detector and C8 ZORBAX Eclipse Plus column (Agilent). Absorption data was collected on a Cary-100 UV-vis spectrophotometer (Agilent) in double-beam mode using 1-cm path quartz cuvettes. Corrected fluorescence spectra were collected on a Fluorolog 3 fluorometer (Horiba Jobin-Yvon, Kyoto, Japan) equipped with an R928 PMT (Hamamatsu, Bridgewater Township, NJ, USA). Solutions were prepared such that absorption remained below 0.1 AU to prevent reabsorption and self-quenching.
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7

X-ray Excited Photoluminescence Spectroscopy

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The RL spectra were acquired by using an Edinburgh FS5 spectrofluorometer (Edinburgh Instruments) equipped with an X-ray source (Amptek Mini-X tube with an Au target and 4 W maximum power output). The X-ray response intensity was examined and collected by a Hamamatsu R928 PMT. The scintillator light yield was estimated using the following equation. Here, the Ce:LuAG was used as the reference with a known light yield of 25,000 photon MeV−1. The spectrum of (C38H34P2)MnBr4 is similar to that of Ce:LuAG after correcting the intensity and wavelength from the correction files of R928 PMT. Then, the light yield could be estimated by comparing the corrected response amplitude (R) of the two samples using Eq. (1): LYC38H34P2MnBr4LYCe:LuAG=RC38H34P2MnBr4RCe:LuAG×ICe:LuAGλSλdλ/ICe:LuAGλdλIC38H34P2MnBr4λSλdλ/IC38H34P2MnBr4λdλ.
The radiation dose rate of the X-ray source was calibrated by using an ion chamber dosimeter. The X-ray images were acquired by using a digital camera (Nikon D90).
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8

Fluorescence-Based Protein Complex Analysis

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The rss measurements were collected using the Giblin-Parkhurst modification of the Wampler-Desa method as described previously [48 ]. The fluorescence signal was detected in a model A-1010 Alphascan fluorimeter (Photon Technologies, Inc., Birmingham, NJ) equipped with an R928 PMT (Hamamatsu, Bridgewater, NJ). The excitation was provided by an Ar+ ion laser (Coherent Innova 70–4 Argon, Santa Clara, CA) at 488 nm and 5–10 mW of power incident on the sample. A photoelastic modulator (PEM-80; HINDS International, Inc., Portland, OR) was placed between the laser source and the sample compartment with a retardation level of 1.22π, and the PEM stress axis orientated 45° with respect to the E vector of the laser beam. Two signals were acquired with the PEM alternating between “on” and “off” positions for 10 seconds and the data fitted to a least squared straight line to minimize noise. A minimum of six of these independent measurements were averaged to acquire the rss values. The fluorimeter G factor was determined using a film polarizer and analyzer with an excitation at 488 nm provided by a xenon arc lamp (model A1010, Photon Technologies Inc, Princeton, NJ). The dissociation reactions of dye-labeled B7 and protein complexes were monitored by fluorescence changes and were also collected in the fluorimeter described above.
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9

Photoluminescence and Microscopy Characterization

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Photoluminescence
measurements were performed on an Edinburgh Instruments FLS920 spectrometer
equipped with a TMS300 monochromator, 450 W Xe lamp, thermoelectrically
cooled Hamamatsu R928 PMT detector, and a liquid N2 cooled
R5509-72 NIR PMT for wavelengths beyond 825 nm. The recorded emission
spectra were corrected for the spectral responsivity of the detectors
and monochromators. Photoluminescence decay curves were recorded with
a pulsed Coherent 45 mW OBIS LX 445 nm laser (modulated with an Agilent
function generator) and an R5509-72 NIR PMT. Cryogenic measurements
were performed in a continuous-flow liquid helium cryostat from Oxford
Instruments. UV/Vis absorption spectra were measured on a PerkinElmer
950 UV/vis/NIR spectrophotometer. Transmission electron microscopy
(TEM) samples were made by drop-casting a diluted dispersion of NCs
on carbon-coated TEM copper grids. Bright-field (BF-TEM) and high-angle
annular dark-field scanning transmission electron microscopy (HAADF-STEM)
images were taken on a Talos F200X from FEI operating at 200 keV.
High-resolution HAADF-STEM imaging was performed on an aberration-corrected
Titan electron microscope from Thermofisher operating at 300 keV.
To minimize structural changes of NCs during imaging, a low beam current
of ∼5 pA was used with relatively low magnifications.
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10

Steady-State and Time-Resolved Absorption and Luminescence Characterization

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Steady state absorption spectra were recorded using a Shimadzu UV‐1601PC spectrophotometer. Measurements were performed with 10 mm quartz cuvettes (Hellma Precision). Steady state photoluminescence measurements were carried out employing a PTI Quantamaster 8075–22 (Horiba Scientific) equipped with Double Mono 300 spectrometer chambers for both excitation and emission. A Hamamatsu R928 PMT was used for detection in the range 185–950 nm. As light source the OB‐75X (75 W Xenon arc lamp) was used. Data acquisition and basic data‐handling of steady state luminescence data were carried out with the Felix Data Analysis software and further processed and presented using Origin Pro. Time‐resolved fluorescence decays were recorded using an IBH time‐correlated single photon counting (TCSPC) spectrometer system with 1 nm resolved emission monochromator (5000 M, Glaskow, UK). The system was equipped with a TBX‐04D picosecond photon detection module and the sample was excited using an IBH LED operating at 337, 403 and 469 nm. The measured decay‐trace was analyzed using deconvolution fitting with the IBH Data Station v 2.1 software and presented using the Origin Pro software.
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