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4700 scanning electron microscope

Manufactured by Hitachi
Sourced in Germany

The Hitachi 4700 scanning electron microscope is a high-performance instrument designed for advanced materials analysis. It provides high-resolution imaging and analytical capabilities, enabling detailed examination of a wide range of samples. The 4700 model's core function is to capture detailed, high-quality images and data through the use of a focused electron beam, allowing users to study the surface topography and composition of materials at the micro- and nano-scale.

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4 protocols using 4700 scanning electron microscope

1

Developmental Stages of Floral Buds

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Floral buds at different developmental stages were fixed in acetic acid/formaldehyde (1:3), dehydrated in a graded ethanol series, embedded in Technovit 7,100 resin, and sectioned (3-µm thick sections) using a Leica RM2265 microtome. Sections were stained with a 0.01% (w/v) toluidine blue solution before being imaged with a Zeiss Axio Imager.Z2.
For scanning electron microscopy analysis, dehiscent anthers were mounted on stubs over carbon double-sided tape and coated with gold using a sputter coater. Samples were observed in a Hitachi 4,700 scanning electron microscope.
For transmission electron microscopy analysis, floral buds were fixed with 2.5% glutaraldehyde on ice, rinsed in 0.1-M sodium phosphate-buffered saline (PBS, pH 7.0), postfixed in 2% osmium tetroxide (dissolved in 0.1-M PBS), and embedded in EPON 812 resin. Ultra-thin sections (50 nm) were double stained with 0.5% uranyl acetate and lead citrate (2.6% lead nitrate and 3.5% sodium citrate, pH 12) and observed with a transmission electron microscope (Tecnai G2 Spirit Bio-TWIN).
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2

Microscopic Imaging of Plant Samples

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Plant images were captured using Olympus SZX7 Stereomicroscope equipped with DP73 camera. Fluorescent images and time lapses were captured using EVOS® FL Cell Imaging System equipped with CCD camera. Excitation wavelengths and emission filters were 488 nm/band-pass 505–530 nm for GFP or YFP and 552 nm/ band-pass 580–620 nm for dsRED. Scanning electron microscopy was performed as described previously [50 (link)] using a Hitachi 4700 scanning electron microscope.
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3

Microscopic Analyses of Plant Seedlings

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Plant images were captured using an Olympus SZX7 Stereomicroscope. Scanning electron microscopy was performed as described previously (Bowman et al., 1989 (link)) using a Hitachi 4700 scanning electron microscope. For histology analyses, 9-day-old seedlings were fixed, embedded and sectioned as described previously (Carles et al., 2004 (link)), and stained in Toluidine Blue solution.
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4

Characterization of Chitosan Bead Topology

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The topology of the chitosan beads was evaluated by scanning electron microscopy. Before using scanning electron microscopy, chitosan beads were dried using different concentrations of ethanol for moisture removal. Beads were immersed in an increasing ethanol/ water mixtures ranging from 30 to 100% ethanol. The beads were left for 10 min in each solution and then dried at 30°C for 5 h. Dried beads were coated with electronic conductive materials, consisting of 60% gold and 40% palladium, before observation. Micrographs were taken using a 4700 Scanning Electron Microscope (Hitachi, Krefeld, Germany).
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