Empyrean panalyticaldiffractometer

The wide-angle
PXRD spectra of the freeze-dried G-quadruplex hydrogel at 1.5% (w/v),
HA-PBA and G were collected at 25 °C on an Empyrean PANalytical
diffractometer (Malvern PANalytical, U.K.) equipped with a PIXcel1D
detector (active length = 3.3473°) and a spinner flat sample
holder in a Bragg–Brentano para-focusing optics configuration.
Diffraction intensity data were collected in the 2θ range between
1° and 40° using CuKα radiation filtered in Ni under
beam conditions of 45 kV and 40 mA. Data were collected by the continuous
counting method assuming a scanning step size of 0.0263° and
a scanning rate of 0.02° min^–1. The wide-angle
PXRD patterns were analyzed with the HighScore Plus software and ICDD
PDF4+ (2019 release) database. The stacking distance (d) was calculated according to the Bragg’s law.^{55 (link)}

The produced NPs were characterized using various characterization techniques to confirm the functionalization and to explore its effects on GO properties. XPS measurements were conducted over a 0–1200 eV range on a Kratos AXIS Ultra DLD (Kratos Analytical Ltd, Manchester, UK) with Al-Kα source and X-ray power of 15 Kv and 20 mA. The elemental compositions of GO and GO-PDA were analyzed using FLASH 2000 elemental analyzer (Thermo Scientific™, Waltham, MA, USA). XRD measurements were carried out using EMPYREAN PANalytical diffractometer (Malvern Panalytical B.V., Eindhoven, Netherlands) equipped with a Cu-Kα radiation source (λ = 1.5406 Å). FTIR-UATR spectra were determined using FTIR Perkin Elmer 2000 in the range of 400–4000 cm⁻¹ to study the surface functional groups of pristine GO and GO-PDA.
Raman spectra of the prepared NPs were obtained with DXR Raman Spectrometer operated with a 532 nm laser and a 10× objective (Thermo Scientific™). Moreover, the morphological structure of GO and GO-PDA NPs was investigated using SEM analysis that was conducted using the JEOL model JSM-6390LV. TGA analysis was conducted to assess the thermal stability of both samples using Pyris 6 TGA (PerkinElmer, Waltham, MA, USA) under nitrogen gas at a 10 °C/min heating rate and over a temperature range of 30–800 °C.

In order to determine the accuracy of the results obtained during image analysis, an X-ray analysis based on the Rietveld method was performed. X-ray investigations were performed using an Empyrean Panalytical diffractometer (Malvern Panalytical, Malvern, UK) working at voltage of 40 kV and a current of 30 mA. The Co source with an iron filter in configuration with a Pixel detector was applied. The registration of diffraction signal was performed for the 2Θ angles ranging from 45 to 110°.