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6700 f field emission scanning electron microscope

Manufactured by JEOL
Sourced in Japan

The JEOL 6700 F is a field emission scanning electron microscope (FE-SEM) that provides high-resolution imaging capabilities. It utilizes a field emission electron gun to generate a finely focused electron beam, enabling the observation of a wide range of samples with high magnification and resolution. The JEOL 6700 F is a versatile instrument suitable for various applications in materials science, nanotechnology, and related fields.

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4 protocols using 6700 f field emission scanning electron microscope

1

Acanthocephalan Specimen Preparation and Imaging

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Acanthocephalan specimens were cleared and mounted temporarily in beechwood creosote for photography. Measurements were made using ImageJ software (Wayne Rasband, NIH, USA) from photographs taken on an Olympus BX51 compound microscope mounted with DP25 camera attachment (Olympus, Tokyo). All measurements are in micrometres unless otherwise indicated, and in descriptions are given as range, followed by mean in parentheses, where numbers permit. To compare overall size between sexes a two-tailed Student’s t-test was computed in Excel (Microsoft, 2017). Drawings were made from photographic series.
Specimens chosen for scanning electron microscopy (SEM) were transferred to 2.5 % gluteraldehyde in 0.1 M phosphate buffer, post-fixed in 1% osmium tetroxide and dehydrated through a gradient series of ethanols, critical-point dried in a CPD030 BalTec critical-point dryer (BalTec AG, Balzers, Liechtenstein) using carbon dioxide, mounted on aluminium stubs, and sputter coated with gold/palladium (60:40) to a thickness of 10 nm in an Emitech K575X Peltier-cooled high-resolution sputter coater (EM Technologies, Ashford, Kent, UK). The specimens were viewed with a JEOL 6700 F field emission scanning electron microscope (JEOL Ltd., Tokyo, Japan) at the Otago Centre for Electron Microscopy (OCEM, University of Otago, New Zealand).
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2

Cestode Specimen Preparation and Imaging

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Cestode specimens were stained using acetic iron carmine, dehydrated in an ethanol series, cleared in clove oil and mounted in Canada Balsam. Measurements were made using ImageJ software (Wayne Rasband, NIH, USA) from photographs taken on an Olympus BX51 compound microscope mounted with DP25 camera attachment (Olympus, Tokyo). All measurements are in micrometres unless otherwise indicated, and in the description are given as range, followed by mean in parentheses, where numbers permit. Drawings were made by hand from photographic series using a light box.
Specimens chosen for scanning electron microscopy (SEM) were transferred to 2.5 % gluteraldehyde in 0.1 M phosphate buffer, post-fixed in 1% osmium tetroxide and dehydrated through a gradient series of ethanols, critical-point dried in a CPD030 BalTec critical-point dryer (BalTec AG, Balzers, Liechtenstein) using carbon dioxide, mounted on aluminium stubs, and sputter coated with gold/palladium (60:40) to a thickness of 10 nm in an Emitech K575X Peltier-cooled high-resolution sputter coater (EM Technologies, Ashford, Kent, UK). The specimens were viewed with a JEOL 6700 F field emission scanning electron microscope (JEOL Ltd., Tokyo, Japan) at the Otago Centre for Electron Microscopy (OCEM, University of Otago, New Zealand).
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3

Scanning Electron Microscopy of Flow Diverters

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Following gentle rinsing in PlasmaLyte A to remove nonadherent blood elements and fixation in Karnovsky's reagent, a ~1.0 cm length of each flow diverter was cut out of loops leaving the tubing sheath present. These samples were secondarily fixed in osmium tetroxide for 1 h and dehydrated in graded ethanol from 40% to 100%. They were then subjected to critical point drying using a Tousimous Autosamdri‐815 critical point dryer. The stents were then carefully removed from the PVC sheaths, longitudinally hemisected, mounted, and sputter coated with Au/Pd coated for 30–80 s using a Denton Vacuum Desk II sputter coater. A JEOL 6700F field emission scanning electron microscope was then used to take representative 30–2000× micrographs of the flow diverter luminal surfaces.
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4

Comprehensive Materials Characterization

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An ESCALAB MKII X-ray photoelectron spectrometer was used to obtain X-ray photoelectron spectroscopy (XPS) data. An XD-3 X-ray diffractometer was used to record the X-ray diffraction patterns (XRD). The scanning electron microscopy images were obtained by a JEOL-6700F field emission scanning electron microscope. The scanning transmission electron microscopy (STEM) images were recorded on JEM-2100F. The BET specific surface area was measured by a Micrometrics ASAP2020 analyzer (USA).
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