Atomic force microscopy measurements were performed using a scanning probe microscope (MFP-3D Coax; Asylum Research, Santa Barbara, CA, USA) to create a topographical map of the surface. The analyses were performed in air and under a constant applied force condition (non-contact mode) with a cantilever (Asylum Research; #AC160TS) resonant frequency of ~360 kHz and a theoretical spring constant of k: 42 N·m−1. Images were processed and analyzed using Image Processing Data Analysis Igor Pro 6 software (WaveMetrics, Tigard, OR, USA).
Ac160ts
Manufactured by Oxford Instruments
The AC160TS is a compact and versatile alternating current (AC) power source designed for a range of laboratory and industrial applications. It provides a stable and adjustable AC output voltage, allowing users to power and test various electrical devices and systems. The core function of the AC160TS is to generate a controlled AC voltage, enabling users to conduct testing, calibration, and evaluation tasks in a laboratory setting.
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4 protocols using ac160ts
1
Atomic Force Microscopy Surface Mapping
2
Graphene AFM Characterization on Silicon
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All AFM experiments with graphene on silicon wafers
were carried out on a Multimode Bruker (ex-DI) Nanoscope V. The experiments
were performed using a silicon 254 probe (AC160TS, Asylum Research)
with 300 kHz nominal resonance frequency. The images were scanned
in an intermittent contact mode at room temperature with 512 ×
512 pixels. All the samples have been annealed at 400 °C prior
to the imaging.
were carried out on a Multimode Bruker (ex-DI) Nanoscope V. The experiments
were performed using a silicon 254 probe (AC160TS, Asylum Research)
with 300 kHz nominal resonance frequency. The images were scanned
in an intermittent contact mode at room temperature with 512 ×
512 pixels. All the samples have been annealed at 400 °C prior
to the imaging.
3
Langmuir-Blodgett Film Deposition and AFM Characterization
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Freshly-cleaved
mica substrates (S&J Trading Inc.; Glen Oaks, NY) connected to
a computer-controlled dipping mechanism in a commercial circular NIMA
L-B trough (Biolin Scientific, Inc., Linthicum Heights, MD) were pulled
through the monolayer at 5 mm/min at a constant surface pressure of
20 mN/m. Transfer ratios were determined by recording the interfacial
area change of the trough during transfer and comparing this to the
surface area of the mica substrate. A transfer ratio of 1 means that
these areas are equal; only films with transfer ratios of ∼1
were examined. The mica substrates were glued to stainless steel discs
and affixed to the magnetic holder of an MMAFM-2 AFM (Digital Instruments;
Santa Barbara, CA) with a cantilever tip (Asylum Research, AC160TS;
Santa Barbara, CA) designed for tapping mode operation.
mica substrates (S&J Trading Inc.; Glen Oaks, NY) connected to
a computer-controlled dipping mechanism in a commercial circular NIMA
L-B trough (Biolin Scientific, Inc., Linthicum Heights, MD) were pulled
through the monolayer at 5 mm/min at a constant surface pressure of
20 mN/m. Transfer ratios were determined by recording the interfacial
area change of the trough during transfer and comparing this to the
surface area of the mica substrate. A transfer ratio of 1 means that
these areas are equal; only films with transfer ratios of ∼1
were examined. The mica substrates were glued to stainless steel discs
and affixed to the magnetic holder of an MMAFM-2 AFM (Digital Instruments;
Santa Barbara, CA) with a cantilever tip (Asylum Research, AC160TS;
Santa Barbara, CA) designed for tapping mode operation.
4
Microscopic Characterization of Thin Films
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SEM images were recorded by using an FEI NOVA nano SEM 200 scanning electron microscope. Samples intended for indentation experiments were only imaged on a small part of the TEM grids, to prevent contamination by electron beam exposure. TEM experiments were conducted on an image-side Cs-corrected FEI Titan 80–300 microscope operated at 300 kV (Supplementary Fig. 4 ). AFM images of the films on Si/SiO2 wafer were recorded on a JPK Nano Wizard Ultra Speed machine with a silicon 254 probe (AC 160 TS, Asylum Research) with 300 kHz nominal resonance frequency (Supplementary Fig. 5 ). The images were scanned in intermittent contact mode in air at room temperature. Both the AFM images and the force curves were processed using JPK Data Processing software.
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