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720es spectrometer

Manufactured by Agilent Technologies
Sourced in United States

The 720ES spectrometer is a high-performance laboratory instrument designed for elemental analysis. It utilizes inductively coupled plasma optical emission spectroscopy (ICP-OES) technology to precisely measure the concentration of elements in a wide range of sample types.

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4 protocols using 720es spectrometer

1

Multitechnique Characterization of Noble Metal-Loaded Sorbent

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The concentration of noble metal ions was determined via ICP-OES (inductively coupled plasma–optical emission spectrometry) method using a Varian 720ES spectrometer. The values of ICP-OES operating parameters are presented in Table 3.
The impregnated sorbent samples were shaken using a laboratory shaker Elpin+ type 358, Lubawa, Poland, at an amplitude of 8 and a speed of 160 c.p.m.
An FTIR-ATR (Fourier transform infrared spectroscopy–attenuated total reflectance) spectrometer Agilent Technologies Cary 630 was used for sample investigations.
FTIR-ATR spectra were recorded for Nitrolite, Aliquat 336, and Nitrolite after its impregnation by Aliquat 336.
A conductivity value was measured using an electrode (type PS-2Z) connected to the Elmetron CP-401 multifunction meter.
Scanning electron microscopy (SEM) measurements were conducted by means of a Quanta 3D FEG scanning electron microscope produced by FEI Company (Oregon, OH, USA).
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2

Iodine Content in Sutures Analysis

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The total iodine loading was determined using inductively coupled optical emission spectrometry (ICP-OES). Briefly, approximately 98 mg of iodine-infused sutures were digested in concentrated nitric acid at room temperature to completely dissolve the sutures, and then the suture solution in nitric acid was diluted with DMSO (2% nitric acid in DMSO) and aliquoted. Control, such as nascent PDDO, was used. The amount of iodine in the suture solution in parts per million (ppm) was analyzed using a Varian 720-ES spectrometer (Varian, Santa Clara, CA). The experiments were conducted in triplicate with a single suture in each container. The elemental analysis data were analyzed using the regression results obtained from calibration curves (R2 ≥ 0.998) plotted between the concentration and absorption of iodine at 179.85 nm.
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3

Structural and Compositional Analysis of Catalysts

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The morphology in SEM image was observed on Hitachi SU‐70 field emission scanning electron microscope with an accelerating voltage of 5 kV. In order to carry out the TEM analysis, the alloy was ultrasonicated from the CC electrode in ethanol, and dropped on the carbon‐coated copper grid. The TEM and EDX results were obtained by a FEI Tecnai G2 F20 transmission electron microscope equipped with Oxford X‐Max 80T. The working voltage was 200 keV. GIXRD patterns of the catalysts were recorded on a Rigaku Smartlab diffractometer with monochromatized Cu Kα radiation (λ = 1.5418 Å), while the grazing incidence was 0.5°. XPS was conducted on a Thermo Scientific K‐Alpha+ spectrometer equipped with a monochromatic Al Kα X‐ray source (1486.6 eV) operating at 100 W. Samples were analyzed under vacuum (P < 10−8 mbar) with a pass energy of 150 eV (survey scans) or 25 eV (high‐resolution scans). All peaks were calibrated with C1s peak binding energy at 284.6 eV for adventitious carbon. The EPR spectrum was measured by a Bruker Elexsys EPR system at 9.43 GHz. The loading of catalyst was determined by ICP‐OES with an Agilent 720ES spectrometer.
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4

Mineral Element Analysis in Leaf Samples

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The concentration of mineral elements (N, P, K, Ca, Fe, S and Zn) was analyzed in five replicates of leaf samples. For that purpose, freeze-dried and ground samples were calcined at 450°C for 8 h, and ashes were dissolved in HCl : HNO3:H2O (1:1:8). Then, P, K, Ca, Fe, S and Zn contents were determined by inductively coupled plasma atomic emission spectroscopy (ICP-OES) in a Varian 720-ES spectrometer (Agilent, USA). Carbon and Nitrogen contents were analyzed by the Dumas combustion method in a C-N analyzer (Leco CHN-628, USA).
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