Optical microscopy investigation was effectuated using a transmitted light biological microscope (ZEISS Axioscope 5, Oberocken, Germany).
Scanning Electron Microscopy was effectuated using a Hitachi SU8230 Scanning Electron Microscope, Tokyo, Japan, at an acceleration voltage of 30 kV in low-vacuum mode without sample metallization. Elemental analysis was effectuated with an Energy-Dispersive Spectroscopy (EDS) detector: X-Max 1160 EDX (Oxford Instruments, Oxford, UK). The culture medium within wells was removed before SEM investigation and afterwards rinsed with ultrapure water and stored under a desiccator for 1 h until their surface was completely dry.
Fourier-transform infrared spectroscopy (FTIR) was performed using an FTIR 610 spectrometer (Jasco Corporation, Tokyo, Japan) in the wavenumber range of 4000–400 cm−1, using the potassium bromide pellet technique. Each spectrum was registered at a resolution of 4 cm−1 and represents the average of 100 scans.
Scanning Electron Microscopy was effectuated using a Hitachi SU8230 Scanning Electron Microscope, Tokyo, Japan, at an acceleration voltage of 30 kV in low-vacuum mode without sample metallization. Elemental analysis was effectuated with an Energy-Dispersive Spectroscopy (EDS) detector: X-Max 1160 EDX (Oxford Instruments, Oxford, UK). The culture medium within wells was removed before SEM investigation and afterwards rinsed with ultrapure water and stored under a desiccator for 1 h until their surface was completely dry.
Fourier-transform infrared spectroscopy (FTIR) was performed using an FTIR 610 spectrometer (Jasco Corporation, Tokyo, Japan) in the wavenumber range of 4000–400 cm−1, using the potassium bromide pellet technique. Each spectrum was registered at a resolution of 4 cm−1 and represents the average of 100 scans.