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Arm 200

Manufactured by JEOL
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Sourced in Japan

The ARM 200 is a high-performance atomic resolution microscope (ARM) designed and manufactured by JEOL. The core function of the ARM 200 is to provide ultra-high-resolution imaging and analysis of materials at the atomic scale.

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Lab products found in correlation

Centurio sdd, by JEOL (1 mentions) Orius 833 ccd camera, by Ametek (1 mentions) Jem 2100f, by Ametek (1 mentions) Nova 600, by Thermo Fisher Scientific (1 mentions) Quanta 3d feg, by Thermo Fisher Scientific (1 mentions) S 4800 microscope, by Hitachi (1 mentions) Jem 2100f, by JEOL (1 mentions) Jem 1400, by JEOL (1 mentions) Talos f200s, by Bruker (1 mentions) Jsm it500hr la, by JEOL (1 mentions) Talos f200, by Thermo Fisher Scientific (1 mentions) Smartlab 9 kw, by Rigaku (1 mentions) Av 300, by Bruker (1 mentions) Microtof q 2, by Bruker (1 mentions) Digiscan, by Ametek (1 mentions) Axs d8 discover diffractometer, by Bruker (1 mentions) Jem 2010 microscope, by JEOL (1 mentions) Mark 4, by Thermo Fisher Scientific (1 mentions)

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ARM-200 microscope (3 citations)

13 protocols using arm 200

1

Cross-sectional TEM Analysis of Perovskite Solar Cells

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Cross-sectional TEM samples of the stack comprising of perovskite/ALD
Al2O3/Spiro-OMeTAD are prepared using a standard
Focused Ion Beam liftout procedure. In the transfer step, the samples
are mounted on molybdenum support grids upon which the final thinning
is performed. The TEM studies are performed using a JEOL ARM 200 probe
corrected TEM, operated at 200 kV, and equipped with a 100 mm2 Centurio SDD energy dispersive X-ray spectroscopy (EDX) detector.
EDX mappings of 256*256 full spectra are acquired using a 0.1 ms dwell
time, summing up over 37, 128, and 105 full frame acquisitions. Quantification
of the EDX maps is performed using standard k-factors.
Koushik D., Hazendonk L., Zardetto V., Vandalon V., Verheijen M.A., Kessels W.M, & Creatore M. (2019). Chemical Analysis of the Interface between Hybrid Organic–Inorganic Perovskite and Atomic Layer Deposited Al2O3. ACS Applied Materials & Interfaces, 11(5), 5526-5535.
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2

Epitaxial BFO Film Growth and Characterization

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BFO film was grown epitaxially on a (100) KTO substrate using ultra high vacuum (<2 × 10−6 Pa) r.f. magnetron sputtering at 550 °C. Cross sectional TEM samples were prepared using FEI Nova 600 dual beam focused ion beam. Ga ion energy was gradually decreased from 30 to 2 keV with to minimize ion beam induced damage. TEM analysis was performed using (1) JEOL JEM-2100F equipped with Gatan Orius 833 CCD camera specifically designed for precise electron diffraction analysis with electron beam damage resistant scintillator, and (2) JEOL ARM 200 equipped with a probe corrector for atomic resolution scanning TEM (STEM) imaging. For XRD analysis, Bruker D8 discover four circle x-ray diffractometer was used with Cu Kα radiation. RSM was recorded using two dimensional area detector (Hi-STAR).
Bae I.T., Ichinose T., Han M.G., Zhu Y., Yasui S, & Naganuma H. (2018). Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3. Scientific Reports, 8, 893.
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3

Characterization of Bi2Te3 Nanoplatelets

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Scanning electron microscopy (SEM) images were recorded on a Hitachi S4800 microscope while the size distribution of the Bi2Te3 nanoplatelets were obtained by measuring 100 randomly selected Bi2Te3 platelets in the SEM image. STEM images and their energy-dispersive X-ray (EDX) elemental mappings were measured using a JEOL JEM-2100F. High-resolution TEM and STEM images were acquired using a Jeol ARM200 with probe Cs-corrector, operated at 200 kV. Cross-sectional TEM samples were prepared by FIB in KBSI (Quanta 3D FEG, FEI). Atomic-coordinates analysis from HAADF images was performed via intensity refinement method. The atomic coordinates analysis was performed with the following steps: (i) HAADF image normalization, (ii) Laplacian of Gaussian filtering, (iii) image erosion, (iv) atom position detection using circular pattern matching, (v) pattern matching errors correction, (vi) center position of atoms correction, (vii) computation of the average pixel intensity around the center of atoms, and finally (viii) two kind of markers based on intensity values has been depicted on the HAADF image, so that the coordinates of Bi and Te are clearly identified from each other.
Papawassiliou W., Jaworski A., Pell A.J., Jang J.H., Kim Y., Lee S.C., Kim H.J., Alwahedi Y., Alhassan S., Subrati A., Fardis M., Karagianni M., Panopoulos N., Dolinšek J, & Papavassiliou G. (2020). Resolving Dirac electrons with broadband high-resolution NMR. Nature Communications, 11, 1285.
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4

High-Resolution STEM Imaging Protocol

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Scanning transmission electron microscopy (STEM) images were acquired at 200 kV in scanning mode using a high angle annular dark field detector in Z-contrast configuration using a Jeol ARM200 equipped with a cold FEG electron source, CEOS condenser aberration corrector and at 100 mm2 (JEOL Ltd., Akishima, Tokyo, Japan).
Sanzaro S., Zontone F., Grosso D., Bottein T., Neri F., Smecca E., Mannino G., Bongiorno C., Spinella C., La Magna A, & Alberti A. (2019). Bimodal Porosity and Stability of a TiO2 Gig-Lox Sponge Infiltrated with Methyl-Ammonium Lead Iodide Perovskite. Nanomaterials, 9(9), 1300.
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5

Aerosol Sampling and Analysis by TEM

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An aerosol impactor-sampler19 onboard the aircraft was used to collect aerosol samples on the Cu TEM grids with collodion substrate at 12-min intervals during each flight. A 120-kV transmission electron microscope (JEM-1400, JEOL) equipped with an energy-dispersive X-ray spectrometer (Oxford Instruments) was used for the STEM–EDS analysis. A 200-kV transmission electron microscope (ARM 200, JEOL) was used for the EELS analysis.
Moteki N., Adachi K., Ohata S., Yoshida A., Harigaya T., Koike M, & Kondo Y. (2017). Anthropogenic iron oxide aerosols enhance atmospheric heating. Nature Communications, 8, 15329.
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6

Characterization of Fe3C Micro-flakes

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The scanning electron microscope (SEM) was characterized by the JEOL JSM-IT500HR/LA with an accelerating voltage of 20 kV. The microstructure and morphology of the micro-flakes were characterized by the field-emission transmission electron microscope (FE-TEM) (Thermo Scientific Talos F200S), and the energy-dispersive X-ray spectroscopy (EDS) was obtained by Bruker Super Lite X2. The high-resolution TEM images were obtained by the spherical aberration-corrected transmission electron microscope (JEOL ARM-200). The statistic of the micro-flake thickness is calculated via the SEM images using the open-access ImageJ software. The crystalline structure of Fe3C micro-flakes was calculated by the open-access VESTA software. The magnetic properties were measured via the vibrating sample magnetometer (VSM, ADE EV9) with a maximum applied field of 15 kOe. The Lorentz transmission electron microscope (L-TEM) images under a static magnetic field were analyzed by Thermo Scientific Talos F200S. X-ray diffraction (XRD) was performed using a SmartLab9kW (Rigaku) with a scan step of 0.04°.
Zhao R., Gao T., Li Y., Sun Z., Zhang Z., Ji L., Hu C., Liu X., Zhang Z., Zhang X, & Qin G. (2024). Highly anisotropic Fe3C microflakes constructed by solid-state phase transformation for efficient microwave absorption. Nature Communications, 15, 1497.
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7

Multifaceted Materials Characterization

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STEM/EDS (JEOL ARM200F equipped with ASCOR probe corrector, Oxford X-Max 100TLE, at 200 kV), XPS (Axis Ultra DLD monochromatic Al Kα), x-ray diffraction (XRD; Bruker D8), ICP-OES (Perkin Elmer 5300DV), NMR (Bruker AV300), gas chromatography–mass spectrometry (MS) (Agilent 5975 C inert MSD with triple-axis detector), MS (Bruker MicroTOF-QII), electron paramagnetic resonance (EPR) (Jeol FA200), Raman (Horiba Jobin Yvon), TPD (Quantachrome chemBET pulsar), AFM (Dimension Fast Scan), BET (Quantachrome Autosorb-iQ), and Fourier transform infrared (Varian 3100). XANES and EXAFS: 150 mg of sample was first ground into fine powder using a mortar and pestle before being pressed into a 10-mm pellet. Measurements were carried out at Singapore Synchrotron Light Source, x-ray absorption fine structure for catalysis beamline in fluorescence mode (43 (link)). Data analysis and simulation were carried out on Athena and Artemis (version 0.9.26) (44 (link)). Details on NMR spectra and single-crystal XRD data can be found in the Supplementary Materials.
Liu C., Chen Z., Yan H., Xi S., Yam K.M., Gao J., Du Y., Li J., Zhao X., Xie K., Xu H., Li X., Leng K., Pennycook S.J., Liu B., Zhang C., Koh M.J, & Loh K.P. (2019). Expedient synthesis of E-hydrazone esters and 1H-indazole scaffolds through heterogeneous single-atom platinum catalysis. Science Advances, 5(12), eaay1537.
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8

Characterization of Phase Impurity

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The phase impurity was characterized by X-ray diffraction (Dandong Haoyuan Instrument Co. LTD). The samples for the transmission electron microscope observation were prepared by mechanical polishing, dimpling and ion milling with liquid nitrogen. STEM images were taken with a JEOL ARM 200 equipped with a probe corrector. The obtained pellet samples showed a density higher than 98% of the theoretical one, where microvoids with a size of microns can be occasionally observed.
Lin S., Li W., Chen Z., Shen J., Ge B, & Pei Y. (2016). Tellurium as a high-performance elemental thermoelectric. Nature Communications, 7, 10287.
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9

Morphology of Annealed NPs by TEM

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The morphology of the NPs annealed at different temperatures was studied by TEM (ARM200, JEOL). A null ellipsometer (Multiskop, Optrel, Germany) equipped with a 532 nm Nd:YAG laser was used for measuring the thickness of the SiO2 layers.
Oras S., Vlassov S., Vigonski S., Polyakov B., Antsov M., Zadin V., Lõhmus R, & Mougin K. (2020). The effect of heat treatment on the morphology and mobility of Au nanoparticles. Beilstein Journal of Nanotechnology, 11, 61-67.
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10

TEM Imaging and EDX Analysis

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Samples were prepared as described above for TEM and viewed on an aberration-corrected JEOL ARM 200 cold field-emission gun transmission electron microscope in high-angle annular dark-field scanning transmission (HAADF STEM) mode using spot size 6. The sample was held in a JEOL Be double tilt holder tilted by about 12° toward the X-ray detector. STEM images were collected using a JEOL annular dark-field detector on a Gatan Digiscan with 2,048 by 2,048 pixels and a dwell time of 10 µs. Energy-dispersive X-ray maps were collected using an Oxford Aztec system with an 0.7-sr collection solid angle by scanning the beam with multiple frames over a period of about 5 min at a resolution of 512 by 512 pixels.
Keogh D., Lam L.N., Doyle L.E., Matysik A., Pavagadhi S., Umashankar S., Low P.M., Dale J.L., Song Y., Ng S.P., Boothroyd C.B., Dunny G.M., Swarup S., Williams R.B., Marsili E, & Kline K.A. (2018). Extracellular Electron Transfer Powers Enterococcus faecalis Biofilm Metabolism. mBio, 9(2), e00626-17.
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