Transmission electron microscopy was performed at the Cellular Imaging Shared Resource of Wake Forest Baptist Health Center (Winston‐Salem, NC). EVs were stained with uranyl acetate for transmission electron microscopy. A Carbon grid (Ted Pella, CA) was immersed into 50 μl of concentrated EVs (about 6.0 × 1011 vesicles/ml). Excess sample was wicked from the grid leaving a wet film. One drop of 2% aqueous uranyl acetate was applied to the grid for 1 min. Excess stain was wicked from the grid with filter paper. Grid was allowed to dry while being held by anti‐capillary forceps and then placed on filter paper with the sample side up. The samples were observed under a FEI Tecnai G2 30 electron microscope and images were captured using 80 kV (FEI, Hillsboro, OR). The diameters of the particles were measured with NIH ImageJ software (Version 1.49).
Tecnai g2 30
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Tecnai G2 30 is a high-resolution transmission electron microscope (TEM) designed for advanced materials analysis and research. It offers a maximum accelerating voltage of 300 kV and provides a range of imaging and analytical capabilities to support various applications in materials science, nanotechnology, and related fields.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Carbon grid, by Ted Pella (1 mentions)
Feg sem, by JEOL (1 mentions)
Su8010, by Hitachi (1 mentions)
Inspect f50, by Thermo Fisher Scientific (1 mentions)
200 mesh copper grid, by Electron Microscopy Sciences (1 mentions)
Sputter coater 108 auto, by Cressington (1 mentions)
Helios nanolab 600, by Thermo Fisher Scientific (1 mentions)
Smartlab, by Rigaku (1 mentions)
6 protocols using tecnai g2 30
1
Transmission Electron Microscopy of EVs
2
Nanogap Device Characterization by TEM and SEM
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TEM samples are prepared by FIB milling. A thin film of Au/Al2O3/Au is cut across a nanogap at one side of the rectangular pattern. The lamella is then picked up by an Omniprobe and was attached to a TEM copper grid. The lamella is further thinned with ion beam milling to less than 100 nm, and is imaged in a TEM (FEG-TEM, FEI Tecnai G2 30). For preparation of SEM samples, the top alumina layers on the metal surface are etched using reactive ion etching (RIE) with an inductively coupled plasma (Plasmalab System100 ICP180, Oxford Ltd.), to avoid charging effects. The samples are then imaged in an SEM (FEG-SEM, JEOL 6700).
3
Comprehensive Characterization of Exfoliated MXene
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The morphological
feature of exfoliated MXene was observed from a scanning
electron microscope (FESEM, SU8010, Hitachi) inbuilt with an energy-dispersive
spectroscope (EDS). Assembly of the different stacked layer structures
of MXene was further characterized using transmission
electron microscopy (TEM) using an FEI Tecnai G230. The crystalline
structural features of MXene after chemical exfoliation
were examined using an X-ray diffractometer (XRD, PANalytical, X’Pert
PRO, Netherlands) with Cu Kα radiation (λ = 1.54 Å)
operated at 30 kV at a measured step size of 0.05°. The elemental
distribution of exfoliated MXene was characterized
using X-ray photoelectron spectroscopy (XPS, Thermo Scientific ESCALAB
250Xi, UK).
feature of exfoliated MXene was observed from a scanning
electron microscope (FESEM, SU8010, Hitachi) inbuilt with an energy-dispersive
spectroscope (EDS). Assembly of the different stacked layer structures
of MXene was further characterized using transmission
electron microscopy (TEM) using an FEI Tecnai G230. The crystalline
structural features of MXene after chemical exfoliation
were examined using an X-ray diffractometer (XRD, PANalytical, X’Pert
PRO, Netherlands) with Cu Kα radiation (λ = 1.54 Å)
operated at 30 kV at a measured step size of 0.05°. The elemental
distribution of exfoliated MXene was characterized
using X-ray photoelectron spectroscopy (XPS, Thermo Scientific ESCALAB
250Xi, UK).
4
Characterization of Rectangular Plate Structures
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SEM images were obtained using a field-emission scanning electron microscope (Inspect F50, FEI, USA) at an accelerating voltage of 10.0 kV, after Pt coating (sputter coater 108auto, Cressington Scientific Instruments, UK). Transmission electron microscopy image and selected area electron diffraction patterns of the rectangular plate foldectures F2 were obtained using a transmission electron microscope (Tecnai G2 30, FEI, USA) operated at 200 kV. Samples were deposited on a formvar carbon film on a 200-mesh copper grid (Electron Microscopy Sciences, USA). Optical microscopy movies were recorded using a three-dimensional digital microscope system equipped with a charge-coupled device camera (KH-8700, Hirox, Japan).
5
Cas9/gRNA RNP VLP Visualization
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The suspension of Cas9/gRNA RNP VLP was added to carbon coated copper grids (200-mesh), and the particles were stained with phosphotungstic acid. The samples were dried and detected under TEM (Tecnai G2 30, FEI, Hillsboro, OR, USA).
6
Characterization of Fe2O3@SBA-15 Nanocomposite
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The scanning electron microscope measurements were performed with FEI Helios Nanolab 600, with the voltage of 10 kV and the current of 0.17 mA. The TEM images were obtained with a FEI Tecnai G2 30 at 300 kV.
The surface area of the sample was analyzed by NOVA 4200e. The sample was first degassed at 300 °C for over 10 h. Then isothermal N2 adsorption was performed at −196 °C. The surface area of both SBA-15 and Fe2O3@SBA-15 was determined by Brunauer–Emmett–Teller method, while the pore size distribution was calculated by Brunauer–Joyner–Halenda method32 (link) with adsorption branch.
Small-angle X-ray diffraction was conducted with Rigaku SmartLab equipped with Cu K-α radiant. Data were collected from 0.7° to 3° with a scanning rate of 0.1° per minute.
The surface area of the sample was analyzed by NOVA 4200e. The sample was first degassed at 300 °C for over 10 h. Then isothermal N2 adsorption was performed at −196 °C. The surface area of both SBA-15 and Fe2O3@SBA-15 was determined by Brunauer–Emmett–Teller method, while the pore size distribution was calculated by Brunauer–Joyner–Halenda method32 (link) with adsorption branch.
Small-angle X-ray diffraction was conducted with Rigaku SmartLab equipped with Cu K-α radiant. Data were collected from 0.7° to 3° with a scanning rate of 0.1° per minute.
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