Scanning electron microscopy (SEM) images were acquired on a NEON 40 EsB CrossBeam scanning electron microscope (Carl Zeiss NTS GmbH, Germany), operating at 3 keV in the secondary electron and InLens mode. In order to enhance electron density contrast, samples were coated with platinum (3.5 nm) using a Leica EM SCD500 sputter coater.
Neon 40 esb crossbeam
Manufactured by Zeiss
Sourced in Germany
The NEON 40 EsB CrossBeam is a versatile electron microscopy platform that combines a field emission scanning electron microscope (SEM) with a focused ion beam (FIB) column. This instrument enables high-resolution imaging and precise sample preparation for a wide range of applications.
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Lab products found in correlation
2 protocols using neon 40 esb crossbeam
1
Platinum-coated SEM Imaging Protocol
2
Comprehensive Zeiss SEM Imaging
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The BS-SEM imaging (Zeiss Neon40 EsB CrossBeam, Zeiss, Germany) was performed at 20 keV and a magnification of 250X, using an automatic stitching system (SmartStitch, Zeiss, Germany), which automatically stitches acquired images together to form one micrograph of the entire sample.
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