Mfp 3d origin

The SEM images were taken with a secondary-electron scanning electron microscope (EVO18, ZEISS), and the samples were subjected to supercritical drying and coated with a gold film for 120 s beforehand. The optical microscopy images were obtained using an inverted microscope (DMI 3000B, Leica). The thickness and roughness of the Ag NPs layer were measured by a commercial Atomic Force Microscope (MFP-3D Origin, Asylum Research). The mechanical property (Young’s modulus (E₀)) of hydrogels with different components were measured by a Micromechanical Testing System (FemtoTools, FT-MTA02). The rheological properties of the hydrogels were measured by a rotational rheometer (Physical MCR 301, Anton Paar, Austria).

X‐ray diffraction (XRD, Rigaku Smartlab) was used to examine the crystal structure. Atomic force microscopy (AFM, Asylum Research, MFP‐3D Origin+) was used to study the surface morphology. The X‐ray photoelectron spectroscopy (XPS, Thermo Fisher Scientific EscaLab 250) was performed using Al Kα (hv = 1486.6 eV) radiation as the excitation source. Raman spectroscopy was carried out with a HORIBA HR800 Raman microscope with laser excitation at 532 nm.

Optical microscope images were captured using a Nikon ECLIPSE Ci microscope. Scanning Electron Microscope (SEM) images were acquired by a JSM-7610F PLUS operating at 1 kV. Transmission Electron Microscope (TEM) images were obtained by a JEOL ARM200F at 200 kV. Crystal structures were analyzed through powder XRD analysis conducted on a Smart lab Rigaku instrument. Height profiles were measured using AFM (Asylum Research MFP-3D Origin) in noncontact mode. Raman spectra were recorded under 532-nm excitation with an output of 10 µW, while PL spectra were recorded under 405 nm excitation with 1 µW, where the laser beam was focused to a spot size of ≈2 µm (Zolix Finder Smart FST2-MPL501-405C1). All photoelectric measurements were performed using a Keithley 2612B instrument. Unless specified otherwise, all the measurements were performed at room temperature.

The MFM images of Fe₃GaTe₂ flakes on a SiO₂/Si wafer were measured at room temperature using an Asylum Research MFP-3D Origin⁺ scanning probe microscope. The zero-field skyrmion lattices were induced by an MFM tip with a strong stray field. A low stray field of MFM tips was used to measure the MFM image to avoid magnetic interactions of the tip with the sample or an applied field. The spatial magnetic resolution was better than 25 nm. We used a two-step method in frequency-modulation mode to measure the MFM images. The distance between the sample surface and the MFM tip was fixed at 50 nm.

SEM images were obtained using a JSM-7600F (JEOL) instrument at an accelerating voltage of 5 kV in lower secondary electron detection mode. The water contact angles and surface free energies were obtained using a contact angle meter (DMo-502, Kyowa Interface Science). The surface free energies of the receiving substrates were calculated using the contact angles of water and diiodomethane, and the theoretical equation by Owens and Wendt^{55 (link)}. TGA was performed using a TGA Q50 instrument (TA Instruments) with a Pt pan to hold the sample. The analysis was performed in a closed chamber with an air flow of 40 ml/min at a temperature increase rate of 10 °C/min. The surface roughness and texture were measured using an AFM (MFP-3D Origin, Asylum Research) at a scan rate of 0.2 Hz. The adhesion forces of the receiving substrates were measured using an ENT-5X instrument (ELIONIX Inc.) at a stage speed of 200 nm/s and load step of 1 µN (20 ms intervals).

AFM (MFP-3D Origin, Oxford Instruments) in the tapping mode with 268 scan lines and 268 scan points with a scan rate of 0.10 Hz was used to capture the topography of the graphene layer over a large area (Fig. 1d).