Jxa 840a electron probe micro analyzer

The morphology of all investigated uncoated and coated SPIONs was determined by scanning electron microscopy (SEM-JEOL, JXA-840A Electron Probe Micro-Analyzer, Japan). Energy-dispersive X-ray (EDX) spectroscopy was applied on an SEM-field emission microscope (Hitachi S-800, Oxford, USA) to assess the atomic concentration of various elements on the top surface of the considered samples. Confirmation of the nanostructure was performed using a transmission electron microscope (TEM, JEOL, Japan). X-ray diffraction analysis was used to determine the crystalline phases of the magnetite and their coated nanoparticles using a Bruker diffractometer (Bruker D8 advance, Germany). The patterns were run with a CuKa1 target with a second monochromator 40 kV, 40 mA. The molecular structure was studied qualitatively using a Fourier transform infrared spectroscopy (FTIR) (6100 JASCO) in the range of 4000–400 cm⁻¹. A vibrating sample magnetometer (VSM), (LakeShore 7400; Chicago, IL, USA) was used to investigate the magnetic properties of the magnetite nanoparticles at 300K.

The synthesized polymer was subjected to various evaluation methods: FT-IR spectra were obtained using KBr pellets on an FT-IR spectrometer (Nicolet 670, range: 4000 to 400 cm⁻¹, USA). Surface morphology was analyzed using a scanning electron microscope (JXA-840A Electron probe microanalyzer, JEOL, Japan) with an accelerating voltage of 30 kV after coating with a gold film via the S150A Sputter Coater (Edwards, England). Drug loading and release investigations were conducted using a double-beam spectrophotometer (Shimadzu UV-2401 PC, Japan). Microwave experiments utilized the CEM Discovering LabMate microwave device (300 W, ChemDriver software; Matthews, NC) in a sealed chamber with pressure, employing microwave-irradiated covered-Pyrex tubes.

The morphology and elemental analysis of the developed BGs before and after Ti doping were analysed by scanning electron microscopy coupled with energy-dispersive X-ray spectroscopy (EDX) (JEOL JXA-840A electron probe micro-analyzer) at 15 kV. Stainless steel stubs covered with carbon tape were used to monitor the glass samples. Prior to sample screening using SEM, the samples were covered with a thin film of gold.