X ray diffractometer smartlab 3

XRD measurements were performed by Rigaku X-ray diffractometer (SmartLab (3)). SEM measurements were confirmed by Regulus8100 (Hitachi). Water contact angles were measured in air by Dataphysics OCA20. TGA measurements were checked by Q500-TA. Hardness was measured by a nanoindentation instrument (DUH-211, SHIMADZU, Japan) with a pyramidal indenter (pyramidal indenter, TOKYO DIAMOND Tools MFG. Co., Ltd., Japan). AFM measurements were supported by the instrument BRUKER ICON-XR, and measured with RTESPA-300 type tips. High-Resolution Ultraviolet Photoemission Spectra (UPS) were measured by an integrated ultrahigh vacuum system equipped with a multi-technique surface analysis system (VG ESCALAB MK II spectrometer). Infrared Spectroscopy (IR) was measured by VERTEX 80 V-ATR. The photolithography and oxygen reactive ion etching (RIE) process was achieved by Plasmalab Oxford 80 Plus system.

TEM images were recorded on a Hitachi HT-7700 microscope equipped with a tungsten filament, operating at 100 kV. HRTEM imaging, HAADF-STEM imaging, and EDS elemental mapping were performed on a JEM-2100F (JEOL) equipped with a built-in EDS. The percentages of Pd and Pt in the samples were determined using ICP-MS (Agilent 7500ce ICP-MS). Powder XRD patterns were recorded using a diffractometer (X-ray Diffractometer SmartLab(3), Rigaku) operated at 3 kW.