X-ray diffraction (XRD) data was acquired from a LabX XRD-6100 X-ray diffractometer with a Cu Kα radiation (40 kV, 30 mA) of wavelength of 0.154 nm (SHIMADZU, Japan). Scanning electron microscope (SEM) images were collected on a GeminiSEM 300 scanning electron microscope (ZEISS, Germany) at an accelerating voltage of 5 kV. Transmission electron microscopy (TEM), high-angle annular dark-field scanning TEM (HAADF-STEM), and Energy dispersive spectrometer (EDS) images were acquired on a JEM-2800 electron microscope (JEOL, Japan) operated at 200 kV. X-ray photoelectron spectroscopy (XPS) measurements were performed on an ESCALABMKII X-ray photoelectron spectrometer using Mg as the exciting source.
Jem 2800 electron microscope
Manufactured by JEOL
Sourced in Japan
The JEM-2800 is a high-performance electron microscope manufactured by JEOL. It is designed to provide high-resolution imaging and analysis capabilities for a variety of applications. The JEM-2800 utilizes an electron beam to magnify and focus on samples, allowing for detailed examination of their structure and composition at the nanoscale level.
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2 protocols using jem 2800 electron microscope
1
Comprehensive Materials Characterization Techniques
2
Characterizing Nanomaterials via STEM and DLS
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Scanning transmission electron
microscopy (STEM) images of NPs were recorded on a JEOL JEM-2800 electron
microscope equipped with a Schottky electron gun working at 200 kV.
The point-to-point resolution is 0.14 nm. Elemental mapping by energy-dispersive
X-ray (EDX) spectroscopy was obtained with JEOL double-SDD X-ray detectors,
with a 133 eV spectral resolution, a solid angle of 0.98 sr, and a
detection area of 100 mm2. Each sample was prepared by
drop-coating the NP suspensions on a PLANO S-160 TEM grid (carbon
film on 200 mesh copper grid). DLS was performed with a Zetasizer
Ultra (Malvern Panalytical GmbH). The NP suspensions were measured
with a HeNe Laser of 633 nm.
microscopy (STEM) images of NPs were recorded on a JEOL JEM-2800 electron
microscope equipped with a Schottky electron gun working at 200 kV.
The point-to-point resolution is 0.14 nm. Elemental mapping by energy-dispersive
X-ray (EDX) spectroscopy was obtained with JEOL double-SDD X-ray detectors,
with a 133 eV spectral resolution, a solid angle of 0.98 sr, and a
detection area of 100 mm2. Each sample was prepared by
drop-coating the NP suspensions on a PLANO S-160 TEM grid (carbon
film on 200 mesh copper grid). DLS was performed with a Zetasizer
Ultra (Malvern Panalytical GmbH). The NP suspensions were measured
with a HeNe Laser of 633 nm.
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