Jsm 6700f scanning

Transmission electron microscopy (TEM) measurements were carried out using a JEOL JSM2100-F microscope operated at 10 kV. UV-vis absorption spectra were recorded on a Varian Technologies Cary 5000 with diffuse reflectance accessories (DRA). The metal nanostructures were observed using a JEOL JSM6700-F scanning electron microscope (SEM). Atomic force microscopy (AFM) studies on the surface morphologies of the metal nanostructure on the PDMS substrate were performed with a Digital Instruments Dimension 3100 scanning force microscope in tapping mode. Raman spectra were obtained with a Raman Spectrometer from HORIBA Jobin Yvon at an excitation wavelength of 633 nm and a Nikon microscope with a ×50 objective lens and a numerical aperture (NA) of 0.75. The acquisition and accumulation time of each spectrum were 10 s and 5 s, respectively. The scan range was 200 to 2000 cm -1 . SERS substrates were cut into 3 × 3 cm 2 pieces and incubated in 1 mM p-aminothiolpheol (p-ATP) solutions and washed with ethanol, prior to measurements. p-ATP was used as the SERS probe with two critical Raman peaks at 1076 and 1140 cm -1 .