Verios g4 uc

SEM was measured with Verios G4 UC (FEI) and UPS spectra were collected using a photoelectron spectrometer (Thermo FisherScientific Theta Probe) with a He I (21.22 eV) ultraviolet source in Hanyang LNC 3.0 Analytical Equipment Center (Seoul). PLQY measurement was conducted with a Quantaurus‐QY Absolute PL quantum yield spectrometer (HAMAMATSU) equipped with an integrating hemisphere, and samples were excited at the wavelength of 365 nm. Steady‐state PL measurements were carried out using a pulsed xenon lamp. And time‐resolved PL decay measurements were carried out using a He–Cd laser operating at a wavelength of 375 nm. For PeLEDs, J–V–L characteristics and device performances were measured using a Konica Minolta spectroradiometer (CS‐2000) with a Keithley 2450 sourcemeter. XRD patterns were measured using an X'Pert‐MPD diffractometer (Philips, Netherlands) employing CuKα radiation. UV–vis absorption spectra were measured by a V‐770 spectrophotometer (JASCO). TEM samples were prepared by diluted QD solution in hexane dropped on a carbon grid. TEM was measured with the JEM‐2100F model (JEOL). The Fourier transform infrared (FT‐IR) was recorded on PerkinElmer Spectrum Two FT‐IR Spectrometer.

The interfacial immersion depth of the nanoparticles trapped at the polymer-water interface during the Pickering emulsion formation and polymerization was studied with a Verios G4 UC (Thermo Fischer Scientific Inc., Eindhoven, The Netherlands) scanning electron microscope in field immersion mode, using either a Through-Lens-Detector (TLD) or a Mirror Detector (MD), using a stage bias of 1000 mV, a beam energy between 500 and 1 KeV, and an aperture of 500 pA–1 nA, to minimize the surface charging effects and also the impact of the electron beam on the polymer. The contact angle was determined from the circular traces left on the polymer’s surface by the nanoparticles.

The surface morphology, dispersion of the nanoparticles in PU nanocomposites, and elemental composition were evaluated with a Verios G4 UC scanning electron microscope (Thermo Scientific, Waltham, MA, USA) equipped with an energy-dispersive x-ray spectroscopy analyser (Octane Elect Super SDD detector(AMETEK, Tokyo, Japan). Before image acquisition, the samples were coated with 10 nm platinum using a Leica EM ACE 200 Sputter Coater (Leica Microsystems, Vienna, Austria) to provide electrical conductivity and to prevent charge build up during exposure to the electron beam. SEM investigations were performed in High Vacuum mode using a secondary electron detector (Everhart–Thornley detector, ETD) at an accelerating voltage of 5 kV. The pore diameters were determined from SEM images using ImageJ software. From each image, at least 50 different pores were randomly selected, and their diameters were measured to generate an average.

The pectin samples were fixed on aluminum stabs with thin gold layer. Then, their morphological characteristics were observed and photographed by using a Verios G4 UC type scanning electron microscopy (SEM; ThermoFisher scientific Ltd., MA, USA) with an accelerating voltage of 5 kV and amplification of 2000×.

Phase analysis was performed by X-ray diffraction (XRD, Smartlab Rigaku, Japan) with a Cu Kα radiation source (λ = 1.5406 Å). The XRD data were refined by TOPAS 4.2 software. The morphologies of raw materials and synthesized samples were characterized using scanning electron microscopy (SEM, Verios G4 UC, Thermo Fisher Scientific, Waltham, MA, USA). Microstructures of the samples were characterized using transmission electron microscopy (TEM, ARM200F, JEOL, Tokyo, Japan) with an accelerating voltage of 200 kV. The samples for TEM observation were prepared using a Ga-focused ion beam (Scios, FEI, Hillsboro, OR, USA), milling with an accelerating voltage of 30 kV. The pieces with a size of ~10 μm × 10 μm × 2 μm were first precut from the bulk samples by using a current of 30 nA. Ion beam currents from 7, 5, 3, 1, 0.5, to 0.1 nA were used in sequence to mill the pieces to electron-transparent slices with thicknesses of less than 100 nm. Subsequently, ion cleaning for approximately 10 min was applied to each side of the slice under a voltage of 5 kV and a current of 16 pA to minimize the knockout damage on the slices.

The morphologies and the elemental compositions of the developed biocomposites were analyzed by means of a Verios G4 UC scanning electron microscope (Thermo Scientific, Brno, Czech Republic) equipped with an energy dispersive X-ray spectroscopy analyzer (Octane Elect Super SDD detector, EDAX-AMETEK, Mahwah, NJ, USA) [67 (link)]. Before analysis, the samples were fractured in liquid nitrogen and dried, then fixed on aluminum stubs with double-adhesive carbon tape and coated with 10 nm gold using a Leica EM ACE200 Sputter coater (Leica Microsystem, Vienna, Austria) to provide material deterioration during electron beam exposure. SEM investigations were performed in high vacuum mode using a secondary electron detector (Everhart-Thornley detector, ETD) at an accelerating voltage of 10 kV.