The crystallinity and structure of TiO2 photocatalysts doped with N and metal ions were determined by XRD using a high-resolution XRD system (Rigaku, D/Max Ultima III, Tokyo, Japan). The shapes and microstructures of the photocatalysts were observed by an SEM instrument (Hitachi, S-4850/EX-400, Tokyo, Japan). The TEM images of the photocatalysts were measured using a TEM instrument (JEOL, JEM-2100F). The N2 isotherms of the photocatalyst were probed using a volumetric adsorption apparatus (MSI, Nanoporosity PQ, Gwangju, Korea) at −197 °C. The samples were pre-treated at 150 °C for 2 h and exposed to N2 gas. The surface area was determined by applicating the BET theory [40 (link)]. The binding state of the components of the photocatalyst was investigated with the XPS system (VG Co., MultiLab 2000, East Grinstead, UK). The PL of the photocatalyst was analyzed using a PL spectrometer (Acton Research Co., Spectrometer ioinsgraph 5000i, Massachusetts, USA). The HeCd laser was used for excitation at 325 nm.
D max ultima 3
Manufactured by Rigaku
Sourced in Japan
The D/MAX Ultima III is a state-of-the-art X-ray diffractometer manufactured by Rigaku. It is designed to provide high-resolution, precise, and reliable X-ray diffraction analysis for a wide range of materials. The core function of the D/MAX Ultima III is to perform qualitative and quantitative analysis of crystalline samples, enabling the identification and characterization of materials.
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Lab products found in correlation
Nicolet 6700, by Thermo Fisher Scientific (3 mentions)
Jem 2100f, by JEOL (2 mentions)
S 4700, by Hitachi (2 mentions)
Jsm 6301f, by JEOL (1 mentions)
Nova nanosem 450, by Thermo Fisher Scientific (1 mentions)
Park xe 15, by Park Systems (1 mentions)
Mdc 25sb, by Mitutoyo (1 mentions)
Asap 2020, by Micromeritics (1 mentions)
Tecnai f20, by Philips (1 mentions)
Ft ir 4100, by Jasco (1 mentions)
Nrs 5100, by Jasco (1 mentions)
Asap 2020 analyzer, by Micromeritics (1 mentions)
Su8010, by Hitachi (1 mentions)
Sta449f3, by Netzsch (1 mentions)
Tg 209 f3, by Netzsch (1 mentions)
Mpms xl 7, by Quantum Design (1 mentions)
Ppms 9, by Quantum Design (1 mentions)
11 protocols using d max ultima 3
1
Photocatalytic TiO2 Characterization
2
Comprehensive Microstructural Analysis of Powders and Thin Films
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Several complementary techniques were used for the characterization of the powders and thin film microstructure. Field emission-scanning electron microscopy (FE-SEM) images were obtained using a JEOL JSM 6301F microscope operating at 7 kV. High resolution TEM images, high angle annular dark field scanning transmission electron microscopy (HAADF-STEM) images and energy-dispersive (EDX) spectra/maps were acquired by using a high resolution transmission electron microscope (HRTEM), JEM-2100F (JEOL Co.), equipped with an EDX detector. Powder X-ray diffraction (XRD) patterns were acquired using a D/MAX Ultima III (Rigaku Co.) diffractometer using Cu Kα radiation (λ = 1.5418 Å) over a range of 20° < 2θ < 90°. Diffuse reflectance UV-Vis-NIR and direct transmission spectra were collected using an integrating sphere equipped with a V-7200 spectrometer (Jasco Co.). Dynamic light scattering (DLS) measurements for measuring the particle size distribution in solution were performed on an Osaka zeta-sizer.
3
Comprehensive Materials Characterization Protocol
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The powder sample phase was studied by powder X-ray diffraction (XRD). It was carried out using a Cu-Kα radiation as an electron source on a Rigaku D/max ULTIMA III diffractometer (Japan). The surface morphology and particle shape were investigated by field emission scanning electron microscope (FE-SEM) and elemental analysis was done by energy dispersive X-ray spectroscopy (EDX) using the scanning electron microscope Nova NanoSEM450 (FEI company). Additionally, the surface compositions and their corresponding element valences were characterized by X-ray photoelectron spectrum (XPS) at a pressure in the 10−9 mbar range, using an ESCA M-probe Spectrometer from Surface Science Instruments, equipped with a monochromatic Al Kα excitation source (λ = 8.33 Å). The survey spectra were measured with 0.5 eV resolution, and the step size of high-resolution spectra was set to 0.05 eV step size. The spectra were charge-corrected and binding energies (BE) were assigned using adventitious carbon C 1s line position. The correction (BE estimation) process has an associated error of at least ±0.1 eV up to 0.2 ± eV for insulating samples [33 (link)]. High-resolution spectra deconvoluted peaks were fitted with GL(30) line shapes and Shirley-type backgrounds. Utilizing CasaXPS software (Casa Software), spectral adjustments, and peak deconvolution were carried out.
4
Comprehensive Characterization of Advanced Membranes
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Surfaces and cross-sectional microstructures of BGM, FC/GG, and FC/GG-BGM membranes were examined with a scanning electron microscope (SEM, S-4700, HITACHI, Tokyo, Japan). Before SEM observation, all dried samples (5 × 5 mm) were sputter-coated with gold. SEM imaging was carried out in the low-vacuum mode at an accelerating voltage of 15 kV. Thicknesses of FC/GG and FC/GG-BGM membranes were measured using a digital micrometer (MDC-25 SB, Mitutoyo Co., Tokyo, Japan). Chemical groups in FC/GG and BGM were determined via Fourier-transform infrared spectroscopy (FT-IR). Infrared spectra were obtained using an AIM-9000 model (Shimadzu Co., Ltd., Kyoto, Japan) to confirm the preparation of the FC/GG-BGM membrane. X-ray diffraction patterns of BGM, FC/GG membrane, and FC/GG-BGM membrane were recorded using an X-ray diffractometer (XRD, Rigaku D/Max Ultima III, Tokyo, Japan) operating at 40 kV with 40 mA at a scan rate of 2°/min. The Cu Kα X-ray was filtered with nickel. Atomic force microscopy (AFM) was performed with an atomic force microscope (Park XE-15, Park Systems Corp., Suwon, South Korea) to determine the surface roughness, morphology, and dispersion of BGM.
5
Characterization of Zinc Ferrite Oxides
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The surface morphologies of ZFOs were analyzed by the field emission scanning electron microscopy (FE-SEM, S-4700, Hitachi Japan). The nanostructured morphology and elemental mappings of ZFOs were scrutinized by the transmission electron microscopy (TEM, TECNAI F20, Philips, Netherlands) in the Korean Basic Science Institute (KBSI, Gwangju Center). The determination of crystallinity was investigated by the X-ray diffraction (XRD, D/MAX Ultima III, Rigaku, JAPAN). The thermal characterization of ZFOs was illustrated by thermogravimetric analysis (TGA, Shimadzu, TA-50, JAPAN) at a ramping rate of 5 °C min−1 under air atmosphere. The porous characteristics of the samples were verified at 77 K in nitrogen atmosphere by the Brunauer-Emmett-Teller (BET, Micromeritics ASAP2020, USA) method.
6
Comprehensive Characterization of Synthesized Materials
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The FT-IR (Fourier transform infrared spectrometer) spectrum was characterized by a Fourier transform infrared spectrometer (JASCO FT-IR 4100, JASCO Inc., Easton, MD, USA). X-ray photoelectron spectroscopy (XPS) spectra were obtained on a Thermo Scientific, Waltham, MA, USA Kα XPS spectrometer with a monochromatized, microfocused Al Kα line source. The crystal structure of all studied samples was obtained with the Rigaku D/max Ultima III instrument with Cu Kα radiation (λ = 0.154056 Å) (Rigaku, TX, USA). Raman spectroscopy was conducted on an Aberration-corrected Czerny–Turner monochromator (NRS-5100, JASCO Inc., Easton MD, USA) at 532.13 nm. The surface morphologies of the synthesized materials were studied by field-emission scanning electron microscopy (FE-SEM, HITACHI, SU-70, Fukuoka, Japan) and high-resolution transmission electron microscopy (HR-TEM, TECNAI F20 UT, FEI CO., Hillsboro, OR, USA). Energy-dispersive spectroscopy (EDS) elemental mapping was performed on a field-emission scanning electron microscopy (FE-SEM, HITACHI, EDX-200, Fukuoka, Japan). Nitrogen adsorption and desorption isotherms were determined by nitrogen physisorption at 77 K on a Micromeritics ASAP 2020 analyzer (Norcross, GA, USA). The samples were degassed at 150 °C for 12 h under vacuum before analysis.
7
Characterization of Magnesium Hydride
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All chemicals used in our experiments were purchased from Sigma-Aldrich (St. Louis, MO, United States) unless stated otherwise. MgH2 was obtained from the Center of Hydrogen Science, Shanghai Jiao Tong University (Ma et al., 2019 (link)). MgH2 was further characterized by using scanning electron microscopy (SU-8010, Hitachi, Tokyo, Japan), X-ray diffraction (D/MAX-Ultima III, Rigaku, Tokyo, Japan) with Cu K radiation source, differential scanning calorimetry (STA449F3, Netzsch, Selb, Germany), and thermogravimetry (TG209F3, Netzsch, Selb, Germany). In addition, sodium hydrosulfide (NaHS) and hypotaurine (HT) were used as an H2S releasing compound and a specific H2S-scavenger, respectively (Ortega et al., 2008 (link)). H2S fluorescent probe 3-oxo-3H-spiro[isobenzofuran-1,9’-xanthene]-3’,6’-diyl bis(2-(pyridin-2-yldisulfanyl)benzoate) (WSP-5; MKBio, Shanghai, China) was used to monitored endogenous H2S in cut flowers (Peng et al., 2014 (link)). The concentrations of these chemicals were selected based on the results of pilot experiments.
8
Synthesis and Characterization of MgO Nanoparticles
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MgO nanoparticles were prepared using the method described by Parashar et al. (41 (link)) using MgCl2 0.6H2O, sodium dodecyl sulfate, and 2.5 M NaOH solution. The preparation protocol has been described in our previous study. XRD and SEM analysis was performed to determine the shape and dimensions of MgO nanoparticles. XRD analysis of nanoparticles was carried out using a powder diffractometer Rigaku D/max Ultima III operated at 40 kV and 0.130 A. Cu-Kα radiation was applied as a source emitting at a wavelength of 0.15406 nm, and a Quanta 250 SEM operating at 30 kV was used to obtain images of the nanoparticles (42 (link)).
9
Characterization of PHA and FPHA Disks
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Changes in the crystallinity of the PHA and FPHA disks were examined using x-ray diffraction (XRD, D/MAX Ultima III, Rigaku, Japan). A diffracted beam graphite monochromator was used to produce Cu Kα radiation at a scanning speed of 10° (2θ)/min. Diffraction patterns were compared to reference patterns of HA (JCPDS72-1243). The chemical composition of the PHA and FPHA disks was examined by energy dispersive spectroscopy (EDS, Quanta 400 FEG, the Netherlands). The functional groups of PHA and FPHA were identified using Fourier transform infrared spectroscopy (FTIR, Nicolet 6700, Thermo Fisher Scientific, USA). Infrared (IR) spectra were collected in transmittance mode with a scanning range of 400–4000 cm−1.
10
Growth and Characterization of Ca0.9Ce0.1Fe2As2 Crystals
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The Ca0.9Ce0.1Fe2As2 single crystals were grown by using FeAs self-reflux method as adopted in Ref. 24 . Structural phase was identified by X-ray diffraction (Rigaku D/MAX-Ultima III) by using Cu Kα (λ = 0.154 nm) radiation at ambient conditions. Magnetic measurements were done by using superconducting quantum interference device (SQUID)-magnetometry (MPMS-XL-7, Quantum Design). The ac susceptibility measurements were performed by the same SQUID-magnetometer. Electrical resistivity was measured by using physical property measurement system (PPMS-9, Quantum Design).
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