Jsm 7500fam

The SEM/EDX analysis was carried out with a JSM-7500FAM (JEOL, Tokyo, Japan) at 5.0 kV. The working distance was about 3 × 4 mm. Samples were placed in a drying oven maintained at 27 °C for 30 min and were sputter-coated with gold before SEM imaging.

The SEM / EDX analysis was carried out with a JSM-7500FAM (JEOL) with 5.0 kV. The working distance was about 3 × 4 mm. Samples were placed in dried oven maintained at 27 °C for 30 min and were sputter-coated with gold before SEM imaging.

The SEM/EDX analysis was carried out with a JSM-7500FAM (JEOL, Tokyo, Japan) at 5.0 kV. The working distance was about 3 × 4 mm. Samples were placed in a drying oven, maintained at 27 °C for 30 min and were sputter-coated with gold before SEM imaging.

Powder X-ray diffraction (XRD) patterns of samples were obtained on a Rigaku RINT-2200 diffractometer using CuKα radiation. The SnO₂ content in samples was estimated by thermogravimetric analysis (TGA, SEIKO Instrument Inc, TG/DTA7300). The specific surface areas were determined by α_s-plot analysis^{23 (link),24 (link)} from the N₂ adsorption isotherm at 77 K (MicrotracBEL Co. Ltd. BELSORP-max). Pore size distribution and pore volume of samples were analyzed by Grand Canonical Monte Carlo (GCMC) method^{25 (link)}. The morphology of samples was observed by scanning electron microscope (SEM, JEOL JSM-7500FAM) and high-resolution scanning transmission electron microscope (HR-STEM; ARM-200CF, JEOL Ltd.). The SEM image and EDX analysis data of a cross-section of solid electrolyte/anode were taken on the material peeled off from the current collector sheet in an Ar-filled glove box after a half-cell construction described below.