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8 protocols using g2 60 300

1

Ultrastructural Analysis of Myocardial Tissue

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The myocardial tissue at the apex of the heart was cut into 1.0 mm fragments. The fragments were fixed in 2.5 % glutaraldehyde at 4°C for 2 h. After rinsing with phosphate buffer, the samples were fixed in 1 % osmic acid for 1 h followed by dehydration using a series of acetone washes. Tissues were embedded, cut into ultrathin sections, and stained with toluidine blue. The slides were observed under Cs-corrected transmission electron microscope with a monochromator (Titan G2 60-300, FEI).
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2

Characterization of ZnO and LaB6 Nanowires

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The structure of the ZnO nanowire and LaB6 nanowire were characterized by transmission electron microscopy (FEI Titan G2 60–300). The EDX analysis of the droplet of a ZnO nanowire was done using an Oxford Instruments X-MAXN 20 silicon drift detector in a Zeiss SUPRA 60 SEM system.
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3

Structural Characterization of Mo2C Hybrids

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Morphological structure characterizations of Mo2C hybrids were performed on SEM (JEOL-JSM-7001F) and TEM (FEI Talos F200X, FEI Titan ChemisSTEM, FEI Titan Themis). HAADF-STEM images were carried out by a Cs-corrected FEI Titan G2 60-300 equipped with a Super-X EDS detector. The LADIA package was used to analysis the strain states of Mo2C nanocrystals during the loading and unloading of tensile stress32 (link). The surface electronic structure was checked by XPS spectra (XPX, PHI-5702). The C and N K-edge NEXAFS spectra were measured at the photoemission end-station at beamline BL10B in the National Synchrotron Radiation Laboratory (NSRL) in Hefei, China. X-ray absorption spectra (XANES and EXAFS) of Mo K-edge were measured on VESPERS beamline at the Canadian Light Source, by scanning a double crystal Si (111) monochromator and collecting emitted X-ray fluorescence.
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4

Characterizing Copper Oxide Surface

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Crystal phase structures were characterized by an XRD diffractometer (Equinox 1000, Thermo Fisher Scientific) with Cu Kα radiation (λ = 1.54 Å). Morphology was observed by field-emission SEM (FEI Inspect F50). Elemental analysis was implemented by using EDS. TEM and HRTEM images were acquired by using an FEI Titan G2 60-300 electron microscope. The surface chemistry of the Cu electrode/plate was investigated using XPS (Thermo ESCALAB 250XI) with Al Kα X-rays (1486.6 eV). The depth 16O and 18O contents of CuOx species formed at the surface of the Cu plate were analyzed by applying TOF-SIMS (ION TOF-SIMS 5) with 30 keV-Bi3+ as an analysis gun and 2 keV-Cs+ as the sputtering source.
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5

Comprehensive Material Characterization

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The morphologies were investigated by SEM (Hitachi SU8010), AFM (JEOL JSPM‐5200), and field emission transmission electron microscope (FE‐TEM, G2 60–300, FEI) equipped with EDS (Super‐X). The chemistry information was examined by XRD (Bruker D2 Phaser X‐Ray Diffractometer with Cu Kα radiation) and Raman spectroscopy (a Kr‐Ar ion laser at 633 nm produced by Spectra‐Physics Beamlok 2060‐RS laser combining Symphony CCD‐1LS detection system). The nitrogen adsorption–desorption isotherms were measured with a Quantachrome Autosorb AS‐6B system. The near surface chemical state of different elements was also done via XPS (ESCALAB 250 Xi). TGA was conducted by SDT Q600 (TA Instruments) in air with a ramp rate of 10 °C min−1.
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6

In Situ Electron Microscopy of Temperature-Induced Restructuring

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A probe-corrected FEI Titan3 (link) G2 60-300
is used to record high-angle annular dark-field (HAADF) images of
the temperature-induced restructuring processes in situ. Elemental analysis is provided by a four-quadrant EDX spectroscopy
detector and a Gatan Quantum energy filter for electron energy loss
spectroscopy (EELS). The in situ heating experiments
are carried out in a DENSsolutions Wildfire D5 holder.
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7

Comprehensive Characterization of Samples

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XRD characterization of the samples was carried out on a German Bruker D8 Advance X-ray diffractometer using the Ni-filtered Cu Kα radiation at 40 kV and 40 mA. XPS data were recorded with the Axis Ultra Photoelectron Spectrometer (Kratos Analytical Ltd.) by means of a monochromatized Al Kα anode (225 W, 15 mA, 15 kV). The C 1s peak at 284.8 eV was used as the reference to calibrate the binding energies (BE). A Tecnai F20 electron microscope operating at 200 kV equipped with an EDS unit (Si(Li) detector) was used for the TEM investigations. The samples for electron microscopy were prepared by grinding and subsequent dispersing the powder in ethanol and applying a drop of very dilute suspension on carbon-coated grids. High resolution TEM, EDS mapping, and HADDF-STEM were performed on an FEI Titan G2 (60-300) probe-corrected TEM system with a field emission gun operated at 300 kV.
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8

Characterization of MoS2 Nanocrystals

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MoS2 NCs were analyzed using an FEI Titan G2 60–300 transmission electron microscope operating at a voltage of 200 kV. Optical measurements of MoS2 NC were performed using a Varian Cary UV-vis. spectrometer in the 250–1000 nm wavelength range. Raman measurements were carried out using a micro-Raman spectrometer at an excitation wavelength of 532 nm at 295 K. The current-voltage characteristics were investigated using a Keithley 617 semiconductor parameter analyzer. The solar simulator (Newport, AM 1.5) was used to study the photomemristive switching of the device under illumination.
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