Jem 2100uhr
The JEM-2100UHR is a high-resolution transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-quality, high-resolution imaging of samples at the nanoscale level. The core function of the JEM-2100UHR is to enable the observation and analysis of materials, structures, and biological specimens with a high degree of detail and resolution.
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20 protocols using jem 2100uhr
Synthesis and Characterization of Compounds
Characterization of Enzyme-Loaded Microcapsules
In order to characterize the localization of different enzymes in the PDM bioreactor, HRP, GOD, and CALB were pre-labeled by FITC, Sulforhodamine, and Fluorescamine, respectively, prior to being assembled on the outer surface, in the shell and inside lumen of the microcapsules. The microcapsules were characterized by confocal laser scanning microscopy (CLSM) with Leica TCS SP5 microscope (Leica Camera AG, Germany). The laser provided excitation of Sulforhodamine 101 at 586 nm and emitted fluorescent light was detected at 605 nm. Similarly, FITC (ex 488 nm, em 525 nm) and Fluorescamine (ex 395 nm em 475 nm) were observed.
Fracture Surface Analysis of Tensile Specimens
Characterization of SrTiO3/Cu2Se Nanoparticles
Characterization of Nanostructured Materials
Characterization of Cellulose Nanofibers and Composites
The non-conductive samples for SEM investigation were placed on conductive carbon tape and coated by 15 nm gold layer using ion sputter coater Q150R ES Plus (Quorum Technologies ltd). The acceleration voltage was set to 10 kV range.
The diluted suspensions of NFC and NFC/PS were placed on carbon/formvar TEM Cu grids (TedPella, Inc.) and investigated at 200 kV acceleration voltage. The micrographs were acquired by Quemesa 11MegaPixel Olympus CDD camera.
The images were treated using ImageJ software [28] (link), [29] (link).
Comprehensive Material Characterization Techniques
Physicochemical Characterization of PEGylated MoS2 Nanosheets
Characterization of Cesium Tungsten Oxide Nanoparticles
Multi-Technique Characterization of Materials
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