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Jem 2100uhr

Manufactured by JEOL
Sourced in Japan

The JEM-2100UHR is a high-resolution transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-quality, high-resolution imaging of samples at the nanoscale level. The core function of the JEM-2100UHR is to enable the observation and analysis of materials, structures, and biological specimens with a high degree of detail and resolution.

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20 protocols using jem 2100uhr

1

Synthesis and Characterization of Compounds

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Chemicals were purchased from the Sigma-Aldrich and Merck in high purity. All of the materials were of commercial reagent grade and were used without further purification. The synthesis and characterization of the studied compounds were previously reported [49 (link)]. Melting points of products were determined by Electro thermal 9200. 1H NMR and 13C NMR spectra were obtained on Bruker 400 MHz spectrometer with DMSO-d6 as solvent using TMS as an internal standard. FT-IR spectrum was recorded on Magna-IR, spectrometer 550. The elemental analyses (C, H, N) were obtained from a Carlo ERBA Model EA 1108 analyzer. Powder X-ray diffraction (XRD) was carried out on a Philips diffractometer of X’pert Company with mono chromatized Cu Kα radiation (λ = 1.5406 Å). Microscopic morphology of products was visualized by SEM (LEO 1455VP). The compositional analysis was done by energy dispersive analysis of X-ray (EDX, Kevex, Delta Class I). Transmission electron microscopy (TEM) was performed with a Jeol JEM-2100UHR, operated at 200 kV.
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2

Characterization of Enzyme-Loaded Microcapsules

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The morphologies of the microcapsules were characterized by scanning electronic microscopy (SEM, JSM-6700F, JEOL, Japan) after sprayed gold on the surface. To verify the hollow structures of microcapsules, the microcapsules were characterized by Transmission Electron Microscope (TEM, JEM-2100UHR, JEOL, Japan), and approximately 100 different microcapsules were analyzed to determine their size distribution of the inner and outer diameters. Hydrophobicity of the microcapsules was evaluated using a contact angle instrument (DSA100, Kruss, Germany).
In order to characterize the localization of different enzymes in the PDM bioreactor, HRP, GOD, and CALB were pre-labeled by FITC, Sulforhodamine, and Fluorescamine, respectively, prior to being assembled on the outer surface, in the shell and inside lumen of the microcapsules. The microcapsules were characterized by confocal laser scanning microscopy (CLSM) with Leica TCS SP5 microscope (Leica Camera AG, Germany). The laser provided excitation of Sulforhodamine 101 at 586 nm and emitted fluorescent light was detected at 605 nm. Similarly, FITC (ex 488 nm, em 525 nm) and Fluorescamine (ex 395 nm em 475 nm) were observed.
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3

Fracture Surface Analysis of Tensile Specimens

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SEM was performed to evaluate the fracture surfaces of all specimens. The fracture surfaces of the tensile samples and the microstructure of the PVAF-reinforced TPS with or without pre-soaking were investigate by SEM (JEM-2100 UHR, JEOL) with an acceleration voltage of 15 kV. The sample used for analysis is the section remaining after the tensile tests produced plastic or brittle fracture. The fractured part of specimen was cut into 10 mm × 5 mm × 4 mm near the fracture surface. The fractured faces were coated with gold using plasma sputtering for about 20 min prior to analysis.
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4

Characterization of SrTiO3/Cu2Se Nanoparticles

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The zeta potential and corresponding size of SrTiO3/Cu2Se NPs were detected through Dynamic Light Scattering. The morphology of SrTiO3/Cu2Se NPs was observed with transmission electron microscopy (TEM, JEM-2100UHR, JEOL, Japan) and atomic force microscopy (AFM, FASTSCANBIO, Germany). Piezoresponse force microscopic (PFM) measurements were characterized by an AFM (NTEGRA, NT-MDT, Russian) equipped with a ferroelectric test system. The SrTiO3/Cu2Se NPs chemical constituents were detected by energy-dispersive X-ray spectroscope (EDS) (Inca X-MAX, Oxford, UK), X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi, Japan), and fourier transform infrared spectrophotometry (FTIR, Nexus 470, Nicolet, Madison, WI, USA). The SrTiO3/Cu2Se NPs chemical structures were characterized by employing X-ray powder diffraction (XRD, Bruker D8 multipurpose). As for thermoelectric properties, a laser flash method (LFA 457, NETZSCH) was utilized to measure thermal diffusivity (D), while a ZEM-3, ULVAC was used for the analysis of σ and S.
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5

Characterization of Nanostructured Materials

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Transmission electron microscopy (TEM, JEM-2100UHR, JEOL, Japan) and scanning electronic microscopy (SEM, JSM-6700F, JEOL, Japan) were used for direct observation of the morphology of NSs. Atomic-force microscopy (AFM, FASTSCANBIO, Germany) and dynamic light scattering were applied to characterize the thickness and size of the NSs. The chemical constituent of FCL NSs was detected via energy-dispersive X-ray spectroscopy (EDX) (Inca X-MAX, Oxford, UK), Fourier-transform infrared spectrophotometry (FTIR, Nexus 470, Nicolet, Madison, WI, USA), and X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi, Japan). The absorption of FCL NSs and VMT powder was detected by solid UV–vis-NIR spectrophotometer (Hitachi, UH4150, Japan).
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6

Characterization of Cellulose Nanofibers and Composites

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Cellulose nanofibers as well NFC/PS particles were investigated by scanning electron microscopy (SEM) by JEOL JIB4501 multibeam system and transmission electron microscopy (TEM) by JEOL JEM2100 UHR.
The non-conductive samples for SEM investigation were placed on conductive carbon tape and coated by 15 nm gold layer using ion sputter coater Q150R ES Plus (Quorum Technologies ltd). The acceleration voltage was set to 10 kV range.
The diluted suspensions of NFC and NFC/PS were placed on carbon/formvar TEM Cu grids (TedPella, Inc.) and investigated at 200 kV acceleration voltage. The micrographs were acquired by Quemesa 11MegaPixel Olympus CDD camera.
The images were treated using ImageJ software [28] (link), [29] (link).
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7

Comprehensive Material Characterization Techniques

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Fluorescence spectra were evaluated by an LS55 fluorescence spectrometer (Perkin Elmer, Waltham, MA, USA). UV-vis absorption spectra were collected with a Lambda 35 UV-visible spectrometer (Perkin Elmer, Waltham, MA, USA). X-ray photoelectron spectroscopy (XPS) was measured with an Escalab 250Xi spectrometer (Thermo Fisher Scientific, Waltham, MA, USA). X-ray diffraction (XRD) was recorded with a D8 DISCOVER diffractometer (Bruker, Bremen, Germany). Transmission electron microscopic (TEM) patterns were obtained by a TecnaiG20 transmission electron microscope (FEI, Hillsboro, AL, USA). High-resolution transmission electron microscopic (HRTEM) images were observed using a JEM-2100 UHR (JEOL, Tokyo, Japan). Scanning electron microscopic (SEM) images were taken with a Zeiss SIGMA field-emission scanning electronic microscope (Carl Zeiss, Jena, Germany). An SX-4-10 box electric resistance furnace was purchased from Beijing Yongguangming Medical Instrument Factory (Beijing, China). An RZ10 medical centrifuge was purchased from Changsha Ordinary Instrument Co., Ltd. (Changsha, China).
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8

Physicochemical Characterization of PEGylated MoS2 Nanosheets

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The morphology of MoS2 after PEG coating was characterized by colloidal stability, ζ potential, size distribution, AFM (FASTSCANBIO, Germany), and TEM (JEM-2100UHR, JEOL, Japan). UV–vis-NIR absorption spectra were recorded by an Infinite M200 Pro TECAN GENIOS. The compositions of the PEGylated MoS2 NSs collected from PBS and medium (after 48 h incubation) were analyzed by XPS (ESCALAB 250Xi, Japan).
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9

Characterization of Cesium Tungsten Oxide Nanoparticles

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The phase compositions of the CsxWO3 particles were determined by X-ray diffraction analysis (XRD, D/max-3B, Japan) using graphite-monochromized Cu Kα radiation. The size and shape of the nanoparticles were observed by scanning electron microscopy (SEM, JEOL JSM-7800F, Japan) and transmission electron microscopy (TEM, JEOL JEM-2100 UHR). The Fourier transform infrared (FTIR) spectra were recorded on a Spectrum two in the wave number range of 450 and 4000 cm−1. The surface composition of the sample and the binding energies of W in the sample were determined by X-ray photoelectron spectroscopy (XPS, ESCALAB 250). The UV-Vis-NIR transmittance spectra at wavelength 300–1100 nm and 300–2500 nm of the CsxWO3 sample powders were measured using a modular solar cell spectral performance testing system (7-SCSpecIII--Beijing Saifan Photoelectric Instrument Co., Ltd.) and a UV-Vis-NIR spectrophotometer (Lambda 950, Perkin Elmer), respectively. Moreover, the thermal insulation performance of the glasses coated with CsxWO3 film was evaluated by a simulated thermal insulation chamber with the top window glass being irradiated by a 250 W infrared lamp.
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10

Multi-Technique Characterization of Materials

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The morphology of as-prepared materials was analyzed by scanning electron microscopy (SEM, JSM-6700F, JEOL, Tokyo, Japan). Transmission electron microscopy (TEM) and energy dispersive spectrum (EDS) mapping images of samples were acquired on a JEM-2100UHR (JEOL, Tokyo, Japan) at an accelerating voltage of 100 kV. X-ray diffraction (XRD) patterns were recorded by PANalytical X’Pert Pro (Panalytical, Almelo, Netherland) with Cu Kα radiation (λ = 1.54178 Å). The surface chemical states of samples were characterized by X-ray photoelectron spectra (XPS) on an ESCALAB MK II (Thermo Scientific, Waltham, MA, USA) with Mg Kα (hυ = 1253.6 eV) as the excitation source. The pore structures were tested by a Multipoint N2 adsorption–desorption experiment on an automatic Micromeritics ASAP 2020 (Micromeritics, Norcross, GA, USA) analyzer at 77 K. The specific surface area was calculated by the BET method and the pore size distribution was generated from the desorption branch of the isotherm by the non-local density functional theory (NLDFT) method.
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