The electronic microstructures of E-Al82Cu18 and Al2Cu alloy sheets were characterized by a field-emission scanning electron microscope equipped with an X-ray energy-dispersive spectroscopy (JEOL, JSM-6700F, 8 kV) and a field-emission transmission electron microscope (JEOL, JEM-2100F, 200 kV). The metallographic microstructure of E-Al82Cu18 alloy was observed on a confocal laser scanning microscope (OLS3000, Olympus) after a chemical etching in a Keller solution. X-ray diffraction measurements of all specimens were performed on a D/max2500pc diffractometer with a Cu Kα radiation. Raman spectra were measured on a micro-Raman spectrometer (Renishaw) at the laser power of 0.5 mW, in which the laser with a wavelength of 532 nm was equipped. X-ray photoelectron spectroscopy analysis was conducted on a Thermo ECSALAB 250 with an Al anode. Charging effects were compensated by shifting binding energies based on the adventitious C 1s peak (284.8 eV). O2 concentrations and Cu/Al ion concentrations in electrolytes were analyzed by portable DO meter (az8403) and inductively coupled plasma optical emission spectrometer (ICP-OES, Thermo electron), respectively.
Ols3000
Manufactured by Olympus
Sourced in Japan
The OLS3000 is a laser microscope designed for high-resolution surface analysis. It features a non-contact measurement method to capture 3D images of sample surfaces with high precision and accuracy.
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Lab products found in correlation
Icp oes, by Thermo Fisher Scientific (2 mentions)
Ecsalab 250, by Thermo Fisher Scientific (2 mentions)
Jem 2100f, by JEOL (2 mentions)
Jsm 6700f, by JEOL (2 mentions)
Micro raman spectrometer, by Renishaw (1 mentions)
Phantom v711, by Ametek (1 mentions)
S 4800, by Hitachi (1 mentions)
Equinox 55, by Bruker (1 mentions)
Oca20, by Dataphysics (1 mentions)
Fib sem system, by Thermo Fisher Scientific (1 mentions)
Stereo discovery v20, by Zeiss (1 mentions)
Uv 2550 spectrophotometer, by Shimadzu (1 mentions)
Duh 211, by Shimadzu (1 mentions)
Jcm 5700, by JEOL (1 mentions)
E 1010, by Hitachi (1 mentions)
Jed 2300, by JEOL (1 mentions)
10 protocols using ols3000
1
Microstructural Characterization of E-Al82Cu18 and Al2Cu Alloys
2
Comprehensive Characterization of Surface Morphology and Wettability
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The surface morphology was characterized FESEM (Hitachi, S-4800) at an accelerating voltage of 2 kV. Measurements of surface roughness were carried out using a LSCM (Olympus, Ols 3000). The chemical constituents and their contents were identified with the help of EDS (Oxford, X-MaxN 150). FTIR (Bruker, Equinox 55) measurements were performed to examine the various chemical bonds. The dropping of water and oil droplets on the coated surfaces and the movement of oil droplets on coated glass slides contaminated with or immersed in oil were monitored using a high-speed camera (Vision Research, Phantom V711) at 6000 frame s−1 and 1000 frame s−1, respectively. The contact angles and sliding angles were measured at ambient temperature using an optical contact angle meter (OCA 20, Dataphysics). Water and oil droplets (5 μL) were carefully dropped onto the surfaces, and the average contact angle was obtained by measuring different positions on the same surface.
3
Elytron Surface Morphology Analysis
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Elytron scales were dissected from female adult beetles to observe the surface morphology. Each specimen was fixed on a glass slide and viewed under stereoscopic microscope (SteREO Discovery V20, Zeiss, Germany) and confocal laser scanning microscope (CLSM; OLS3000, Olympus, Japan). The details of pits on elytron surface were obtained by environmental scanning electron microscope (ESEM; JEOL JSM-6700F, FEI Company, USA).
To determine the internal three-dimensional structure of the cuticle, FIB-SEM was performed using a FIB-SEM system (GAIA3, Tescan, Czech Republic). In addition, three-dimensional reconstruction was conducted by the three-dimensional visualization software Dragonfly Pro 2.0. The FIB-SEM system is equipped with a dual beam consisting of a scanning electron beam (SEM beam) and a focused ion beam (FIB). Each milling step of the ion beam was performed with 119 µA emission and 5 kV acceleration voltage. In case of possible structural damage to the cut edge by the scalpel, the middle position of the elytron surface was chosen for the tests. Serial sectioning was performed by 200 consecutive millings, each with a thickness of 30 nm. The depth of focus was 9.3 µm. The volume of each serial section was 12.7 µm × 6 µm × 9.3 µm.
To determine the internal three-dimensional structure of the cuticle, FIB-SEM was performed using a FIB-SEM system (GAIA3, Tescan, Czech Republic). In addition, three-dimensional reconstruction was conducted by the three-dimensional visualization software Dragonfly Pro 2.0. The FIB-SEM system is equipped with a dual beam consisting of a scanning electron beam (SEM beam) and a focused ion beam (FIB). Each milling step of the ion beam was performed with 119 µA emission and 5 kV acceleration voltage. In case of possible structural damage to the cut edge by the scalpel, the middle position of the elytron surface was chosen for the tests. Serial sectioning was performed by 200 consecutive millings, each with a thickness of 30 nm. The depth of focus was 9.3 µm. The volume of each serial section was 12.7 µm × 6 µm × 9.3 µm.
4
Wear Mechanism Analysis of Composite Materials
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The worn surface features of FMSF, FMUF, and FMHF were inspected using SEM at a 20 kV voltage to obtain the corresponding wear mechanisms. The composite materials for the SEM observations were gold-sputtered prior to inspection to make these tested composite materials conductive to the conditions. The three-dimensional profiles and surface roughness of FMSF, FMUF, and FMHF were measured using confocal laser scanning microscopy (CLSM, OLS3000, OLYMPUS, Beijing, China).
5
Microstructural Analysis of Zn-Al Alloy Sheets
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The metallographic microstructure of ZnxAl100−x alloy sheets was investigated by using a confocal laser scanning microscope (OLS3000, Olympus) after conventional grinding and mechanical polishing, followed by chemical etching in acetic picric solution (5 ml HNO3 and 5 ml HF, 90 ml ultrapure water). The electron micrographic structures were characterized by using a field-emission scanning electron microscope (JEOL, JSM-6700F, 15 kV) equipped with an X-ray energy-dispersive microscopy, and a field-emission transmission electron microscope (JEOL, JEM-2100F, 200 kV). XRD measurements were conducted on a D/max2500pc diffractometer using Cu Kα radiation. Ion concentrations in electrolytes were analyzed by inductively coupled plasma optical emission spectrometer (ICP-OES, Thermo electron). XPS analysis was conducted on a Thermo ECSALAB 250 with an Al anode. Charging effects were compensated by shifting binding energies based on the adventitious C 1s peak (284.8 eV).
6
Characterizing Laser-Treated TiO2-Ag Nanocomposite
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The sample’s morphology post-laser-treatment was examined using field emission scanning electron microscopy (FESEM; Zeiss SUPRA). The surface chemical composition of the sample was determined through an energy dispersive spectrometer (Genesis Apollo XL). The laser-induced grating structure was characterized using an Olympus laser confocal microscope (OLS3000). The distribution of Ag nanoparticles on the TiO2 nanowires was assessed via transmission electron microscopy (TEM; JEM-2100F), whereas lattice fringe analyses were conducted via a high-resolution transmission electron microscope (HRTEM). The results confirmed that the TiO2 type was anatase, with Ag nanoparticles integrated into the TiO2 nanowires, forming a micro-/nanocomposite structure. The MB solution, serving as a representative organic pollutant, was utilized at a concentration of 5 g/L. The light source for the experiment was a simulated solar system (PL-XQ500W, provided by Beijing Princes Technology Co., Ltd., Beijing, China). Photocatalytic degradation tests were performed under sunlight intensity. The efficacy of different samples was juxtaposed, with the characteristic peak changes of the MB solution at 664 nm being verified using a Shimadzu UV-2550 spectrophotometer. The photocatalytic reaction was initiated upon lamp illumination.
7
Characterizing Irradiated Dentin Surface Roughness
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Three-dimensional images of the irradiated dentin surface were obtained using a confocal laser microscope. The arithmetic mean of roughness (Ra) and the maximum height of roughness (Rz) were used to analyze the surface roughness of the irradiated samples using a threedimensional laser profilometer (OLS3000, Olympus, Tokyo, Japan). Ra and Rz values of the laser irradiation were obtained for an area of 1,280×960 µm 2 using the corresponding analysis software. Five measurements were taken for each group.
8
Laser-Induced Surface Hardness Analysis
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Following the irradiation experiments, the ablation depths were measured using a confocal laser microscope (OLS3000, Olympus, Japan). The Vickers hardness around the irradiation spots was measured by a dynamic ultramicrohardness tester (DUH-211, Shimadzu, Japan) with a maximum indentation load and a depth of 196 mN and 3 μm, respectively. Next, the samples were gold-coated by an ion sputtering system (E-1010, Hitachi, Japan), applied for 60 s at 15 mA discharge current. The irradiated regions were then observed using a scanning electron microscope (SEM) (JCM-5700, JEOL, Japan). Additionally, the Ca contents were measured at 10 positions and averaged over the irradiation spots by an energy dispersive x-ray spectrometer (JED-2300, JEOL, Japan) coupled to SEM at an accelerating voltage of 20 kV at 37-fold magnification.
9
Surface Roughness Measurement Protocol
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The arithmetic average surface roughness Ra, and the root mean squared surface roughness Rq were measured using a confocal laser scanning microscope (OLS 3000, Olympus, Tokyo, Japan). The scanning distance was 256 μm and the cutoff value was 87.4 μm. Five different profiles for each specimen were obtained.
10
Titanium Alloy Surface Roughness Characterization
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Discs of titanium alloy (Ti6Al4V, chemical composition: 6% aluminium, 4% vanadium, 0.25% (maximum) iron, 0.2% (maximum) oxygen, and the remainder titanium), 10 mm in diameter and 1 mm in height, were processed by polishing with different grades of silicon carbide paper (#100, #320, #600, #1000 and #2000). Surface roughness of Ti6Al4V samples is quantified by R a , which is the arithmetic average of the absolute values of the profile height deviations from the mean line, recorded within the evaluation length. In this study, six individual measurements of surface roughness were performed on each sample using a confocal laser scanning microscope (OLS3000, Olympus Corporation) with the dimension of scanning area equal to 65×65 μm 2 . The data of surface roughness reported below are the mean values of six measurements. Metallic substrata were ultrasonically cleaned with acetone for once, 75% ethanol for once and demineralized water for three times, before sterilization by steam for cell culture.
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