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Axis nova x ray photoelectron spectrometer

Manufactured by Shimadzu

The Axis Nova X-ray photoelectron spectrometer is a laboratory instrument used for surface analysis. It measures the kinetic energy of photoelectrons emitted from a sample when irradiated with X-rays, providing information about the elemental composition, chemical states, and electronic structure of the sample's surface.

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2 protocols using axis nova x ray photoelectron spectrometer

1

Quantifying Au Nanoparticles on TiO2

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For quantifying the loading amount of Au, Au NPs loaded on TiO2 were dissolved by using aqua regia, and the concentration was determined by inductively coupled plasma spectroscopy. The samples for TEM and HR-TEM observation were prepared by dropping a suspension of the samples in ethanol onto a copper grid with a carbon support film (grid-pitch 150 μm, Okenshoji Co., Ltd, #10-1006). The measurements were performed by using a JEOL JEM-2100F at an applied voltage of 200 kV. The Au particle size (dAu) was determined from the image analysis of ∼200 Au particles observed in TEM images. Diffuse reflectance UV-vis-NIR absorption spectra were measured by using a UV-2600 spectrometer (Shimadzu) with an integrating sphere unit (Shimadzu, ISR-2600Plus). BaSO4 was used as a reference for the reflectance (R). The Kubelka–Munk function [F(R) = (1 − R)2/2R] was used for expressing the relative absorption coefficient. The measurement was carried out by using sample powder without dilution. X-ray photoelectron spectra (XPS) were collected by using a Kratos Axis Nova X-ray photoelectron spectrometer at 15 kV and 10 mA using Al Kα as the X-ray source. For the energy reference, the peak of C 1s (284.6 eV) was used.
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2

Characterization of Au-CdS Nanocomposites

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The loading amounts
of Au and CdS were quantified by inductively coupled plasma spectroscopy
(ICPS-7500, Shimadzu). X-ray diffraction (XRD) analysis was carried
out with a Rigaku SmartLab X-ray diffractometer. Diffuse reflectance
UV–vis spectra of the samples were recorded on a UV-2600 spectrometer
(Shimadzu) with an integrating sphere unit (Shimadzu, ISR-2600Plus)
at room temperature. BaSO4 was used as a reference material
to evaluate the reflectance (R) of the samples. The reflectance was transformed to the Kubelka–Munk
function [F(R)] presenting the relative absorption coefficient by the equation F(R) = (1 – R)2/2R.43 (link) Transmission electron
microscopy (TEM) measurements were performed using a JEOL JEM-2100F
at an applied voltage of 200 kV. X-ray photoelectron (XP) spectroscopy
measurements were performed using a Kratos Axis Nova X-ray photoelectron
spectrometer with a monochromated Al Kα X-ray source (hν = 1486.6 eV) operated at 15 kV and 10 mA. The takeoff
angle was 90°, and multiplex spectra were obtained for Cd 3d
and Au 4f photopeaks.
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