Axis nova x ray photoelectron spectrometer
The Axis Nova X-ray photoelectron spectrometer is a laboratory instrument used for surface analysis. It measures the kinetic energy of photoelectrons emitted from a sample when irradiated with X-rays, providing information about the elemental composition, chemical states, and electronic structure of the sample's surface.
2 protocols using axis nova x ray photoelectron spectrometer
Quantifying Au Nanoparticles on TiO2
Characterization of Au-CdS Nanocomposites
of Au and CdS were quantified by inductively coupled plasma spectroscopy
(ICPS-7500, Shimadzu). X-ray diffraction (XRD) analysis was carried
out with a Rigaku SmartLab X-ray diffractometer. Diffuse reflectance
UV–vis spectra of the samples were recorded on a UV-2600 spectrometer
(Shimadzu) with an integrating sphere unit (Shimadzu, ISR-2600Plus)
at room temperature. BaSO4 was used as a reference material
to evaluate the reflectance (R∞) of the samples. The reflectance was transformed to the Kubelka–Munk
function [F(R∞)] presenting the relative absorption coefficient by the equation F(R∞) = (1 – R∞)2/2R∞.43 (link) Transmission electron
microscopy (TEM) measurements were performed using a JEOL JEM-2100F
at an applied voltage of 200 kV. X-ray photoelectron (XP) spectroscopy
measurements were performed using a Kratos Axis Nova X-ray photoelectron
spectrometer with a monochromated Al Kα X-ray source (hν = 1486.6 eV) operated at 15 kV and 10 mA. The takeoff
angle was 90°, and multiplex spectra were obtained for Cd 3d
and Au 4f photopeaks.
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