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S 4700 cold cathode field emission sem

Manufactured by Hitachi
Sourced in United States

The S-4700 Cold Cathode Field Emission SEM is a scanning electron microscope (SEM) manufactured by Hitachi. It utilizes a cold cathode field emission source to generate electrons for high-resolution imaging. The S-4700 is capable of producing detailed, high-magnification images of samples with a wide range of applications.

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4 protocols using s 4700 cold cathode field emission sem

1

Comprehensive Particle Characterization and cGAMP Release

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All particle characterization methods were completed as previously reported [22 (link), 27 (link), 35 (link)]. Briefly, all particles were deemed to have undetectable endotoxin (<0.125 EU/mg) per the LAL Chromogenic Endotoxin Quantitation Kit (Waltham, MA). For imaging by scanning electron microscopy (SEM), particles were cast on an aluminum stub (Ted Pella, Redding, CA), and after being sputter coated with palladium, were imaged on a S-4700 Cold Cathode Field Emission SEM (Hitachi, Tokyo, Japan). The particle hydrodynamic size by volume was acquired using a Nanobrook 90Plus Zeta (Brookhaven Instruments Corporation, Holtsville, NY). cGAMP loading was determined as previously described[22 (link)] using a high-performance liquid chromatography (HPLC) method by detecting cGAMP at 254 nm. Briefly, HPLC was run using an isocratic mobile phase (80% water:20% methanol v/v) at a rate of 0.6 mL/min through a Aquasil C18 (Thermo Fisher Scientific, Waltham, MA). To determine the cGAMP release profile, the particles were incubated in PBS in the presence or absence of 10% v/v FBS pH 7.4 at 37 °C and at predetermined time points the same HPLC method was used to measure percent cGAMP released.
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2

Spray-Dried Powder Characterization

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Spray-dried powders were deposited on an aluminum stub with adhered double-sided carbon tape. The stubs and powders were coated with 10–12 nm of Au/Pd using a Cressington 108 Auto Sputter Coater (Watford, UK). Scanning electron microscopy (SEM) images were captured using a Hitachi S-4700 cold cathode field emission SEM (Schaumburg, IL, USA). The geometric diameter of the spray-dried powder was determined by measuring 600 individual particles using ImageJ software (National Institutes of Health, Bethesda, MD, USA).
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3

Scaffold Morphology Characterization by SEM

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Cross-sectioned HCCS-PDA scaffolds were fixed on a holder, sputter-coated with platinum (4 nm) in a vacuum and imaged using a Hitachi S-4700 Cold Cathode Field Emission SEM (Hitachi High Technologies America, Inc., Schaumburg, IL USA). The scaffolds were fixed in 10% neutral formalin for 24 hours, washed 3 times with deionized water, and followed by critical point drying process using EMS 850 Critical Point Dryer (Electron Microscopy Sciences, Hatfield, PA USA) before acquiring image using the SEM.
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4

Microstructural Analysis of Bone Particles

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Cross-sectioned HCCS-PDA, HCCS, and calvaria particles were fixed on a holder, sputter-coated with platinum (4 nm) in a vacuum and imaged using a Hitachi S-4700 Cold Cathode Field Emission SEM (Hitachi High Technologies America, Inc., Schaumburg, IL USA). EDX analysis was conducted to determine the chemical elementary composition of the samples on three random cross-sectional regions using INCA operator software (Oxford Instruments Analytical, High Wycombe UK).
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