To resolve surface irregularities in the sub-micrometer range, we complement our surface analysis with atomic force microscope (AFM) measurements. We operate the AFM in tapping mode using a MMAFMLN Multimode AFM (Veeco Metrology) equipped with a HQ:NSC19/AL BS tip (MikroMasch, radius 8 nm) and a Nanoscope IV controller (Digital Instruments, Veeco Metrology Group). We scan an area of 13.7 µm × 13.7 µm with a rate of 0.5 Hz. To process the data and analyze the surface roughness we use the open source software Gwyddion.
Nanoscope 4 controller
The Nanoscope IV controller is a core component of the Nanoscope scanning probe microscope system. It provides the necessary control and interface functionality to operate the scanning probe microscope. The Nanoscope IV controller is responsible for managing the scanning, feedback, and data acquisition processes of the microscope.
Lab products found in correlation
3 protocols using nanoscope 4 controller
Surface Topography Analysis of Printed Surfaces
To resolve surface irregularities in the sub-micrometer range, we complement our surface analysis with atomic force microscope (AFM) measurements. We operate the AFM in tapping mode using a MMAFMLN Multimode AFM (Veeco Metrology) equipped with a HQ:NSC19/AL BS tip (MikroMasch, radius 8 nm) and a Nanoscope IV controller (Digital Instruments, Veeco Metrology Group). We scan an area of 13.7 µm × 13.7 µm with a rate of 0.5 Hz. To process the data and analyze the surface roughness we use the open source software Gwyddion.
Synthesis of Prussian Blue Nanoparticles
Synthesis and Characterization of Germanium Nanotubes
0.4 nm and average length of 85 ± 56 nm (statistics performed
on 100 nanotubes observed by transmission electron microscopy), with
very long aspect DW Ge-INTs also observed at ca.
500 nm. Micrographs of synthesized DW Ge-INT can be found in
images were taken using a JEOL-2010F electron microscope, JEOL Ltd.,
GB, or on a JEOL1400 electron microscope operating at 80 kV. One drop
of a dilute imogolite suspension (∼1 mg L–1) was deposited on a carbon-coated copper grid (lacey carbon films
on 200 mesh, Agar Scientific, GB) lying on an absorbent paper and
dried in air. Atomic force microscopy (AFM) micrographs were taken
in tapping mode using a Digital Instruments Multimode VIII AFM with
a Nanoscope IV controller. All AFM micrographs were recorded with
a resolution of 512 lines and with a typical scanning speed of 1 Hz
on prepared silicon substrates (Si wafer chips, Agar Scientific Ltd.,
GB), which were submerged in a freshly prepared 3:1 mixture of H2SO4 (98%) and H2O2 (32%),
before washing with copious deionized water and drying at 120 °C.
All micrographs were processed using NanoScope Analysis v1.40 (R2Sr),
Bruker Corporation, US.
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