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Quanta 650 feg

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Quanta 650 FEG is a field emission gun scanning electron microscope (FEG-SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a Schottky field emission gun that provides a high-brightness electron beam for improved resolution and contrast. The microscope is equipped with advanced imaging and analytical capabilities, including secondary electron (SE) and backscattered electron (BSE) detectors, energy-dispersive X-ray spectroscopy (EDS), and electron backscatter diffraction (EBSD) capabilities.

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131 protocols using quanta 650 feg

1

Sputter Coating and FESEM Imaging

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The samples were sputter-coated (Jeol, JFC-1600, Japan) with a thin layer of gold approximately 6 nm for 60 s with sputter current of 30 mA. Digital morphology images of rcBCS were obtained by field emission environmental scanning electron microscopy (FE-ESEM, FEI Quanta 650 FEG, USA) at an accelerated voltage of 30 kV with XT Microscope Control software (version 6.28, FEI Quanta 650 FEG, USA). Following digital image acquisition, membrane thicknesses and pore sizes were measured the software described above.
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2

SEM Analysis of PEEK Scaffold Mineralization

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SEM was used for analyzing the surface morphological changes of the PEEK scaffold upon mineralization of the CaP. A Quanta FEG 650 Scanning Electron Microscope Quanta FEG 650 from FEI, Hillsboro, OR, USA) was used in high vacuum mode. An Au-Pd coating was sputtered onto the polymer due to the non-conductive nature of PEEK. For all samples, 10 KV at a spot size of 4 was used.
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3

FeSO4·7H2O Waste Analysis by SEM and EDX

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The surface morphology of FeSO4·7H2O waste and the sludge generated after coagulation were determined using field-emission scanning electron microscopy (FE-SEM) (Quanta FEG 650, FEI, Hillsboro, OR, USA). The sample was taken on an aluminum stub, then mounted with double side carbon tape, and sputter-coated with gold powder using a high-resolution sputter coater. The SEM image was taken at 10,000 magnification and an accelerating voltage of 5 kV. Moreover, the elemental compositions in FeSO4·7H2O waste and the sludge generated after coagulation were determined by Energy Dispersive X-Ray (EDX) analyses (Quanta FEG 650, FEI, Hillsboro, OR, USA). The presence of minerals compositions such as boron (b), calcium (Ca), iron (Fe), magnesium (mg), phosphorus (P), and Potassium (K) was identified by Inductively Coupled Plasma, equipped with the Optical Emission Spectroscopy (ICP-OES) (PerkinElmer Optima 7300 DV, Waltham, MA, USA).
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4

SEM Analysis of Carbon Nanostructures

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SEM analysis of the CN samples were performed in a SEM FEI Quanta 650 FEG (Quanta 650 FEG, FEI, Hillsboro, OR, USA), operating at high vacuum, an acceleration voltage of 5 kV and spot size of three. Five microliters of CN dispersion at a concentration of 50 µL/mL were drop-casted on a silicon wafer and left to dry. The CN-supported Si wafer was placed on pin stub (standard 12.7 mm, 8 mm pin length, Ted Pella Redding, CA, USA), and subsequently, the sample was coated with gold using an EM ACE600 coating system (Leica microsystems Lda, Portugal) to enhance the conductivity of the sample for SEM analysis.
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5

Morphological Characterization of Nano.Alg and MFS.Alg

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Transmission electron microscopy (TEM) and scanning electron microscopy (SEM) were performed to assess the morphological characteristics of Nano.Alg and MFS.Alg. For TEM, one drop of the sample was placed on a 300 mesh copper grid covered with FormVar film, contrasted with 2% phosphotungstic acid for 1 min and observed on the transmission electron microscope (Tecnai G20, FEI, Thermo Scientific, Hillsboro, Oregon, USA). For SEM, the glass coverslips were covered with poly-L-lysine for 30 min and rinsed before placing the samples on their surface. The samples were left at room temperature for 24 h for drying and metallized with platinum (10 nm) before analysis on the scanning electron microscope (Quanta 650 FEG, FEI, Thermo Scientific, Hillsboro, Oregon, USA).
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6

Shale Pore Characterization via SEM

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The surface to be observed
was initially polished with sandpaper and then polished under a Leica
EM TIC 3X argon ion polishing machine (Leica Microsystems Limited,
Germany). After polishing, the surface was gold-plated and then observed
under an FEI Quanta 650 FEG scanning electron microscope, and all
kinds of pores in the field of view were photographed and preserved.
At the same time, energy-dispersive X-ray spectroscopy (EDS) was also
used to identify minerals and organic matter and obtain information
on shale pore types and organic petrography.
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7

Scanning Electron Microscopy Analysis of US and Edible Films

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The surface morphology of US and edible films was examined by scanning electron microscopy (SEM; Quanta 650 FEG, FEI Company, Hillsboro, OR, USA). The samples were placed on stubs using double-sided carbon tape and covered with a gold layer using a rotary-pump coating system (Q150R, Quorum, Lewes, UK). Images were obtained at an accelerating voltage of 10 kV and varying degrees of magnification.
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8

Morphological Analysis of PLLA Fibers

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SEM was used to analyze fiber alignment, diameter, and morphology of the PLLA samples. Sections of the 7000 rpm, 3500 rpm, stationary (0 rpm), and various NaOH-treated samples were affixed to an SEM stub, sputter-coated with gold-palladium and observed under SEM (Quanta 650FEG, FEI Co., Hillsboro, OR, USA) at an accelerating voltage of 5 kV. The SEM micrographs were analyzed to measure fiber diameter utilizing image-analyzing software (Image-Pro Insight, Media Cybernetics, Silver Spring, MD, USA).
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9

Multimodal Characterization of Electrodes

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The phase constituents were determined by XRD (Bruker D8‐Advance) using a Cu radiation. The morphologies of all electrodes were observed by field emission scanning electron microscopy (FEI Quanta 650 FEG). HAADF image and elemental mappings were performed on FEI Talos F200S microscope equipped with Super‐X EDX system, operated at 200 kV. In situ  TEM was performed by a TEM‐STM in situ sample holder (Zep Tools Co. Ltd., China) on a FEI Talos F200S TEM. Microtensile tests were carried out under displacement control by an Instron 5848 Microtester. Elastic moduli was determined in the linear elastic region of the stress–strain curves.
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10

Characterizing Recycled Concrete Microstructure

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After curing for 28 days, the concrete specimens were crushed, and small piece of concrete containing recycled coarse aggregate were taken and dried to constant weight after termination of hydration. After spraying gold treatment, the micromorphology of the interface area was analyzed by Quanta 650 FEG (FEI Company, Hillsboro, OR, USA) scanning electron microscope. Small pieces without coarse aggregate were dried to a constant weight and tested for pore structure using AutoPore V9600 mercury porosimeter (Micromeritics, Norcross, GA, USA).
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