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2010f s tem

Manufactured by JEOL
Sourced in Japan

The JEOL 2010F(s) TEM is a high-performance transmission electron microscope (TEM) designed for advanced materials analysis. It offers a maximum accelerating voltage of 200 kV and is capable of providing high-resolution imaging and analytical capabilities.

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4 protocols using 2010f s tem

1

STEM-EELS Imaging of Bacterial-Mineral Precipitates

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Bacterial-mineral suspensions in (as described above) were imaged using STEM-EELS to determine the elemental composition and redox state of intracellular precipitates. Aliquots of the bacterial-mineral suspension were pelleted after 24 h and fixed using a BalTec HPM010 high-pressure freezer and freeze substitution using 2% OsO4, embedded in Spurr’s resin, sectioned to 60 nm and mounted on gold TEM grids10 (link). STEM-EELS images were collected using a JEOL 2010F STEM at 200 kV and a resolution of 0.5 eV to image the O-K edge and the Fe-L2,3 edges.
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2

Visualizing Norovirus Virus-Like Particles

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For viewing under TEM, 100 μg ml−1 Norovirus VLPs in 0.15 M NaCl (Sigma Aldrich, St. Louis, MO) containing various surfactant concentrations were adsorbed onto nickel grids with a carbon support film (Ladd Research, Williston, VT). A droplet of VLP solution was applied to each grid for 2 minutes to allow for adsorption. Excess liquid was then removed, followed by 5–10 seconds of negative staining with 2% uranyl acetate. For the images in Fig. 7, the grid-mounted samples were imaged by field emission TEM using a 2010F S/TEM (JEOL, Tokyo, Japan) at 200 kV. For the images in Fig. 8, the grids were imaged by conventional TEM using a 2000FX S/TEM (JEOL, Tokyo, Japan) at 200 kV.
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3

Comprehensive Characterization of Nanomaterials

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The samples were characterized by different analytic techniques. XRD was performed on a Philips X'Pert Pro Super X-ray diffractometer equipped with graphite-monochromatized Cu Ka radiation (λ = 1.54178 Å). Scanning electron microscope (SEM, Zeiss Supra 40) and JEOL 2010F(s) TEM were applied to investigate the size and morphology. The HRTEM images, EELS, SAED, and EDX elemental mappings were taken on JEMARM 200F Atomic Resolution Analytical Microscope with an acceleration voltage of 200 kV. XPS was performed by an X-ray photoelectron spectrometer (ESCALab MKII) with an excitation source of mg Kα radiation (1253.6 eV). ICP data were obtained by an Optima 7300 DV instrument. Ultraviolet photoelectron spectroscopy was carried out at the BL11U beamline of National Synchrotron Radiation Laboratory in Hefei, China. The X-ray absorption spectra of Ni and S K-edges were obtained at the beamline 4B7A station of Beijing Synchrotron Radiation Facility (China).
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4

Characterization of Synthesized Nanocrystals

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The as-synthesized samples were examined by X-ray powder diffraction was carried out on a Bruker D2 Phaser X-ray diffractometer with Cu Ka radiation (λ=1.5406 Å) at 30 kV and a current of 10 mA. The morphology of the as-synthesized samples was determined by using a JEOL 2010F(s) TEM. The HRTEM observation and SAED were taken on the same machine with an acceleration voltage of 200 kV. The energy-dispersive X-ray spectra were collected with an INCA X-ray microanalysis system equipped on the JEOL 2010F(s) microscope. All samples were prepared by dropping the ethanol suspension containing uniformly dispersed nanocrystals onto the carbon-coated copper grids and dried at room temperature naturally. Raman spectra were performed using a Raman microscope (Renishaw) excited with a 514 nm excitation laser. The Fourier transform infrared (FTIR) spectra were measured on a Thermo Fisher/Nicolet 6,700 FTIR spectrometer at room temperature.
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