Nanoscope iiia controller
The Nanoscope IIIa controller is a versatile instrument designed for scanning probe microscopy applications. It provides the necessary control and data acquisition capabilities to operate atomic force microscopes (AFMs) and other scanning probe techniques. The Nanoscope IIIa controller is a core component of Bruker's scanning probe microscopy systems, enabling high-resolution imaging and analysis of a wide range of materials and surfaces.
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17 protocols using nanoscope iiia controller
Atomic Force Microscopy Imaging Protocol
Amyloid-β Aggregation Inhibition
dissolved in DMSO at concentrations ranging from 2.0 mg/mL to 3.3
mg/mL. Aβ42 (Bachem) was dissolved in TFA to obtain
a 1 mg/mL stock solution. In each experiment, appropriate peptide
aliquots were deposited in glass vials and dried under a gentle nitrogen
stream. Aggregation was initiated by hydrating the peptide with PBS
premixed with the compound under study. The final compound and peptide
concentrations were 100 μM and 50 μM, respectively. In
the control samples, PBS was premixed with DMSO volumes equivalent
to those present in the compound aliquots employed for the experiments.
Aggregation was performed at room temperature.
For AFM inspection,
sample aliquots of 20 μL were deposited on a freshly cleaved
mica surface and incubated for 7 min. Samples were then gently rinsed
with Milli-Q water and dried overnight under mild vacuum. Tapping
mode AFM images were acquired in air using a Dimension 3100 SPM (Bruker,
Karlsruhe, Germany) equipped with “G” scanning head
(maximum scan size 100 μm) and driven by a Nanoscope IIIa controller
(Bruker). Single-beam uncoated silicon cantilevers (type TESPA_V2,
Bruker) were used. The drive frequency was 300–320 kHz, and
the scan rate was 0.5 Hz.
Nanoparticle Morphological Analysis by AFM
Characterization of Polycation/miRNA Complexes
Tapping Mode Atomic Force Microscopy
Atomic Force Microscopy Characterization of TDP-43 Aggregates
Ferrlecit and Generic SFG Particle Characterization
Atomic Force Microscopy of SAP Solutions
Multimode AFM Analysis of Earthworm
Processing and analysis of images was carried out using NanoScope TM software (Bruker, version V614r1) . All images presented are raw data except for the first order two-dimensional flattening. Measurements were performed in air at room temperature and 50-60% relative humidity.
Atomic Force Microscopy with Nanoscope IIIa
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