Jsm 7500f field emission sem
The JSM-7500F is a Field Emission Scanning Electron Microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of materials. The JSM-7500F utilizes a field emission electron source to generate a high-brightness electron beam, enabling the acquisition of detailed, high-magnification images with excellent resolution.
5 protocols using jsm 7500f field emission sem
Extracellular Vesicle Visualization Protocol
Structural Characterization of Materials
Synthesis and Characterization of Silver Nanoparticle-Coated Substrates
Cellulose Structure Analysis by SEM
Scanning Electron Microscopy of Tissues
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