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The JSM-5200 is a scanning electron microscope (SEM) manufactured by JEOL. It is a versatile instrument designed for high-resolution imaging of a wide range of samples. The JSM-5200 utilizes a thermionic emission electron gun and can achieve a maximum magnification of up to 300,000x. It is equipped with various detectors, including a secondary electron detector and a backscattered electron detector, allowing for the examination of surface topography and composition of the sample.
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