Icon xr

Icon XR (Bruker Karlsruhe, Germany) was used to perform the atomic force microscopy on in PeakForce Tapping Mode to measure the nanomechanical properties of the membranes. At each measurement point, the AFM modus records and evaluates force-distance curves. Along with height adhesion, stiffness and deformation were measured at the same time. Bruker Scanasyst-Air tips (k = 0.4 N m⁻¹) with a tip radius of 2 nm were used. The membranes were glued to 15 mm AFM steel-discs with adhesive carbon tape (Plano) and measured at ambient conditions. For all membranes, the image size for the AFM test was set to 1 µm and they were measured at 0.977 Hz with 512 × 512 pixels.

All ¹H-NMR spectra were obtained on Bruker AVANCE III 400 MHz or 500 MHz NMR spectrometers (Q. One Instruments Ltd.). Multiplicity was indicated as follows: s (singlet), d (doublet), t (triplet), m (multiple), dd (doublet of doublets). All coupling constants (J) are reported in Hertz (Hz). Mass spectra were in general recorded on QSTAR Elite (ABI). A UV-3100PC spectrophotometer (MAPADA) with background correction was applied to measure the optical absorption spectra. NIR-II Fluorescence spectrophotometry was performed with an Edinburgh instrument FLS980 fluorescence spectrophotometer. Transmission electron microscopy (TEM) images were acquired through DTM-961002 of JEOL Ltd. Atomic Force Microscopy (AFM) images were acquired through Bruker ICON-XR. Sodium dodecyl sulfate-polyacrylamide gel electrophoresis (SDS-PAGE) was performed on the American BIO-RAD electrophoresis system.