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Dension icon

Manufactured by Bruker
Sourced in Switzerland

The Dension Icon is a high-performance analytical instrument designed for essential X-ray characterization. It features advanced technologies to deliver reliable and precise data for a wide range of applications.

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2 protocols using dension icon

1

Characterization of Graphene Oxide Membranes

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Fourier Transform Infrared (FTIR) spectra was recorded on a Thermo Scientific Nicolet IS20 FTIR Spectrometer, using KBr as a reference. X‐ray photoelectron spectroscopy (XPS) experiments was performed in an ultrahigh‐vacuum system (Thermo escalab 250Xi), and high‐resolution spectra were obtained by curve fitting of the synthetic peak components using the Avantage software. The surface topography images were obtained by an atomic force microscope (AFM, Bruker Dension Icon). The microstructure of GO membranes was characterized using a field‐emission scanning electron microscope (HITACHI S‐4800). The X‐ray diffraction (XRD) of samples were recorded using a Bruker D8 focus diffractometer using Cu Kα radiation (λ = 1.5406 Å). 1H NMR spectroscopy was recorded on a Bruker Advance 600 MHz NMR spectrometer using chloroform‐d as the solvent. High performance liquid chromatography (HPLC) was accomplished on a ThermoFisher vanquish HPLC System, using a Diacel Corporation Inc. Chiralpak IF‐3 column (3 µm particle size, 4.6 mm I.D. × 150 mm). Circular dichroism spectroscopy (CD) characterization was performed using a CD spectrometer (J‐815, JASCO, Japan).
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2

Synthesis and Characterization of D-alanine-modified Pillar[5]arene

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The D-alanine-modified water-soluble pillar[5]arene DAWP5 was produced in our laboratory as described (Supplementary Scheme 1). Other reagents were purchased from commercial suppliers and used as received. The NMR spectra were recorded on a Bruker Avance III HD 600 MHz spectrometer (Bruker Co., Ltd., Zurich, Switzerland), and the chemical shifts are expressed in ppm (δ) downfield relative to TMS, as an internal standard. The UV–vis absorption spectra were performed on a Shimadzu UV-1800 spectrometer (Shimadzu Corp., Kyoto, Japan). Transmission electron microscope (TEM) investigations were carried out on a Tecnai G2 F20 S-TWIN instrument. Zeta-potential measurements were performed on a Zetasizer Nano S (Malvern instruments Ltd, UK). Atomic force microscopy (AFM) investigations were carried out on a Bruker Dension Icon (Bruker Co., Ltd., Zurich, Switzerland). Dynamic light scattering (DLS) measurements were carried out on a Mastersizer 2000 system (Malvern instruments Ltd, UK).
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