The morphology of the obtained NCs was studied by atomic force microscopy (AFM) and transmission electron microscopy (TEM) according to our previous protocols [7 (link),21 (link)]. The AFM observations were conducted using a NanoScope Dimension V instrument with an RT ESP tube scanner (Veeco Instruments, Plainview, NY, USA) Samples were analyzed at 0.5 Hz scanning speed using a low-resonance-frequency pyramidal silicon cantilever resonating at 250–331 kHz at a constant force of 20–80 N/m. The resonance amplitude was adjusted manually to the lowest possible amplitude enabling stable imaging within the contamination layer on the surface. We prepared the samples by adsorption of an NC droplet on mica that was freshly cleaved. After 18 h, the excess substrate was removed by rinsing the mica plates in double distilled water for 1 min and drying for 2 h at room temperature. The TEM imaging of NCs was performed with an Field Electron and Ion Company (FEI) Tecnai G2 20 X-TWIN electron microscope (FEI, Brno, Czech Republic) by placing a few drops of diluted NCs on a Cu-Ni grid and leaving the specimens to dry for 20 h at room temperature.
Nanoscope dimension 5
Manufactured by Veeco
Sourced in United States
The NanoScope Dimension V is a lab equipment product from Veeco. It is a scanning probe microscope that can be used to analyze surface topography and properties at the nanoscale level. The core function of the NanoScope Dimension V is to provide high-resolution imaging and measurement capabilities for nanoscale materials and structures.
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2 protocols using nanoscope dimension 5
1
Nanomaterial Characterization by Microscopy
2
Multiscale Characterization of Metallic Nanostructures
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Scanning electron microscopy (SEM) images are obtained with an LEO 1530 Gemini field
emission scanning electron microscope (Carl Zeiss AG, Oberkochen, Germany). The In Lense
detector is used for imaging all samples, and the gun’s acceleration voltage is set
between 2 and 3 kV.
Atomic force microscopy (AFM) images are recorded using a Nanoscope Dimension V (Veeco,
USA) instrument with a Dimension 3100 controller. The instrument is operated in the
tapping mode with OTESPA-R3 cantilevers (Bruker). The resulting images are evaluated with
NanoScope Analysis software. Moreover, a slope analysis was performed on each sample to
verify the sharpness of the fabricated Au discs. Details of the slope analysis are
presented in theSupporting Information .
Additionally, 3D reconstructed optical images taken with a laser scanning microscope
(Olympus, LEXT) are used to show the uniformity of the samples regarding the periodicity
and geometry of the discs. This laser scanning microscope allows a fast qualitative
evaluation of the fabricated samples. A 100× objective was used with N.A. 0.95 and a
z-scanning pitch of 120 nm. Additionally, a 1.3× digital zoom was used to obtain a
better view of the Au discs imaged.
emission scanning electron microscope (Carl Zeiss AG, Oberkochen, Germany). The In Lense
detector is used for imaging all samples, and the gun’s acceleration voltage is set
between 2 and 3 kV.
Atomic force microscopy (AFM) images are recorded using a Nanoscope Dimension V (Veeco,
USA) instrument with a Dimension 3100 controller. The instrument is operated in the
tapping mode with OTESPA-R3 cantilevers (Bruker). The resulting images are evaluated with
NanoScope Analysis software. Moreover, a slope analysis was performed on each sample to
verify the sharpness of the fabricated Au discs. Details of the slope analysis are
presented in the
Additionally, 3D reconstructed optical images taken with a laser scanning microscope
(Olympus, LEXT) are used to show the uniformity of the samples regarding the periodicity
and geometry of the discs. This laser scanning microscope allows a fast qualitative
evaluation of the fabricated samples. A 100× objective was used with N.A. 0.95 and a
z-scanning pitch of 120 nm. Additionally, a 1.3× digital zoom was used to obtain a
better view of the Au discs imaged.
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