The mineralogical analysis is performed using a Bruker AXS D8 X-ray diffractometer (XRD) (Billerica, MA, USA) operating on monochromatic Kα1 radiation from copper (40 kV, 40 mA, λ = 0.15406 nm). The Fourier-transform infrared (FTIR) spectra of raw clay and purified clay are recorded using a Bruker Alpha ATR (Billerica, MA, USA) spectrometer operating in the interval of 400–4000 cm−1 at a resolution of 2 cm−1. Potassium bromide (KBr) is used as a substance to dilute the samples. The Quantachrome instrument from Nova Instruments, Boynton Beach, FL, USA (a division of Anton Paar Quanta Tec Inc., Boynton Beach, FL, USA) is employed to generate nitrogen adsorption–desorption isotherms in order to determine the specific surface area. The data are recorded and evaluated with Quantachrome NovaWin version 11.06 software. Before conducting the analysis, all samples are subjected to vacuum degassing process at 105 °C for 12 h.
Axs d8 x ray diffractometer
The AXS D8 is an X-ray diffractometer manufactured by Bruker. It is designed to perform X-ray diffraction analysis, a technique used to study the atomic and molecular structure of materials.
Lab products found in correlation
16 protocols using axs d8 x ray diffractometer
Characterization of Raw Clay Minerals
The mineralogical analysis is performed using a Bruker AXS D8 X-ray diffractometer (XRD) (Billerica, MA, USA) operating on monochromatic Kα1 radiation from copper (40 kV, 40 mA, λ = 0.15406 nm). The Fourier-transform infrared (FTIR) spectra of raw clay and purified clay are recorded using a Bruker Alpha ATR (Billerica, MA, USA) spectrometer operating in the interval of 400–4000 cm−1 at a resolution of 2 cm−1. Potassium bromide (KBr) is used as a substance to dilute the samples. The Quantachrome instrument from Nova Instruments, Boynton Beach, FL, USA (a division of Anton Paar Quanta Tec Inc., Boynton Beach, FL, USA) is employed to generate nitrogen adsorption–desorption isotherms in order to determine the specific surface area. The data are recorded and evaluated with Quantachrome NovaWin version 11.06 software. Before conducting the analysis, all samples are subjected to vacuum degassing process at 105 °C for 12 h.
Characterization of Nanoparticle Synthesis
X-ray Powder Diffraction Analysis of Dental Sealers
Structural Characterization of Materials
Characterizing Zn(DDC)2 Inclusion Complexes
Structural and Morphological Characterization of Porous Scaffolds
Comprehensive Materials Characterization Protocol
Nanoparticle Characterization by DLS and TEM
Nanoparticle Characterization by XRD and TEM
Characterization of Luminescent Materials
and photoluminescence (PL) emission spectra were measured by the Ocean
Optics USB2000+ spectrometer. X-ray powder diffraction (XRD) measurements
were employed a Bruker AXS D8 X-ray diffractometer equipped with monochromatized
Cu Kα radiation (λ = 1.5418 Å). Transmission electron
microscopy (TEM) and energy-dispersive X-ray analysis (EDX) measurements
were performed by Tecnai G2 F20, FEI. Scanning electron
microscope (SEM) was measured by S-3400 N II, Hitach. The photoluminescence
(PL) emission spectra, CIE color coordinates, and color rendering
index (CRI) of the LEDs were measured in an integrating sphere equipped
with a high-accuracy array rapid spectroradiometer (Ocean Optics).
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