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16 protocols using axs d8 x ray diffractometer

1

Characterization of Raw Clay Minerals

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The elemental analyses of raw clay are performed by X-ray fluorescence (XRF) using an Oasis 9900 spectrometer (Thermo Fisher, Waltham, MA, USA). Ignition loss is measured by calcination at 1000 °C.
The mineralogical analysis is performed using a Bruker AXS D8 X-ray diffractometer (XRD) (Billerica, MA, USA) operating on monochromatic Kα1 radiation from copper (40 kV, 40 mA, λ = 0.15406 nm). The Fourier-transform infrared (FTIR) spectra of raw clay and purified clay are recorded using a Bruker Alpha ATR (Billerica, MA, USA) spectrometer operating in the interval of 400–4000 cm−1 at a resolution of 2 cm−1. Potassium bromide (KBr) is used as a substance to dilute the samples. The Quantachrome instrument from Nova Instruments, Boynton Beach, FL, USA (a division of Anton Paar Quanta Tec Inc., Boynton Beach, FL, USA) is employed to generate nitrogen adsorption–desorption isotherms in order to determine the specific surface area. The data are recorded and evaluated with Quantachrome NovaWin version 11.06 software. Before conducting the analysis, all samples are subjected to vacuum degassing process at 105 °C for 12 h.
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2

Characterization of Nanoparticle Synthesis

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The XRD patterns were recorded on a Bruker AXS D8 X-ray Diffractometer operated at 40 mA and 40 kV using a Cu Kα source. Field emission scanning electron microscopy (FESEM) was carried out using a JEOL JSM-7610F Plus Field Emission SEM. The diameter distributions of the particles in the samples were measured using Image J software. The atomic composition of the samples was analysed using energy dispersive X-ray (EDAX) analysis (Peltier cooled, Octane plus model (30 mm2 and 127 eV resolution)). The Brunauer–Emmett–Teller (BET) surface area analysis was carried out using a BET Surface Area Analyzer Model/Supplier: Autosorb I; Quantachrome Corp. The photoluminescence (PL) lifetime was calculated using FLS920, Edinburgh Instruments, Scotland.
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3

X-ray Powder Diffraction Analysis of Dental Sealers

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The crystalline structure and chemical composition were investigated by an X-ray powder diffraction analysis (XRD) system (Bruker-AXS D8 X-ray diffractometer, Germany). After setting the freshly mixed sealer specimens, the disc specimens were ground progressively by an agate mortar and pestle till a finer powder was obtained. An amount of 0.2 g of powder from each group was placed between two pieces of magic tape on the X-ray diffractometer. The test was conducted in continuous mode at an angle 2 range of (0–60°) with a scanning rate of 4°/minute under 30.0 mA at 40.0 kV. The attained XRD patterns were interpreted using the model pattern on the Joint Committee on Powder Diffraction Standard (JCPDS) databases [40 ].
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4

Structural Characterization of Materials

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The XRD pattern was performed over a 2θ range from 5° to 60° on an AXS/D8 X-ray diffractometer (Bruker, Cambridge, UK) equipped with graphite monochromatized high-intensity Cu-Kα radiation (λ = 0.154 nm, 40 kV, 100 mA). The scan rate was 2°/min.
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5

Characterizing Zn(DDC)2 Inclusion Complexes

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X-ray powder diffraction patterns of Zn (DDC)2, SBE-CD, HP-CD raw materials, inclusion complexes, as well as the physical mixtures were recorded using a Bruker AXS D8 X-ray diffractometer (Karlsruhe, Germany) at a voltage of 20 kV and a 5 mA current. The scanning rate employed was 0.18 s at room temperature, over the range of 11–30° 2θ. The resultant diffraction patterns were analysed using the DIFFRAC plus XRD commander software.
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6

Structural and Morphological Characterization of Porous Scaffolds

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The XRD measurement were carried out with a Bruker AXSD-8 X-ray diffractometer with monochromatic CK, radiation (=1.5406) radiation source. Data were collected from two theta (degree) ranges of 20–60 at a scan rate 0.1 min−1 (degree per min). Fourier transform infrared FT-IR-Bruker 27, Germany instrument was employed to identify functional groups. The morphological characteristics of porous scaffolds were observed by using field emission scanning electron microscopy (FE-SEM) using (FEI Quanta-250 FEG) instrument with an accelerating voltage of 200 kV.
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7

Comprehensive Materials Characterization Protocol

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X-ray diffraction (XRD) patterns were collected on a Bruker-AXS D8 X-ray diffractometer equipped with CuKα radiation. X-ray photoelectron spectra were recorded using a VG-ADES400X spectrometer as the excitation source and the degree of vacuum was 1 × 10−8 Pa. The microstructure was examined by high-resolution transmission electron microscopy (HR-TEM) (JEM-2100F) operated at 200 kV. The SEM-EDS of the sample was analyzed using a Hitachi S-4700 scanning electron microscope at a working voltage of 5 kV. The optical absorbance spectra of the as-prepared samples were recorded on a UV-vis spectrophotometer (TU-1901) equipped with a diffuse reflectance accessory using BaSO4 as the reflectance standard. The microstructure and morphology of the products were characterized using an S-4700 scanning electron microscope (Japan) operated at 5 kV. The Brunauer–Emmett–Teller (BET) surface areas, pore volumes (VP) and the distribution of pore size were derived from the nitrogen adsorption at 77 K using a Quantachrome Nova Win II instrument.
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8

Nanoparticle Characterization by DLS and TEM

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The mean particle size, the polydispersity index (PDI), and the zeta potential of nanoparticles were measured by dynamic light scattering (DLS) (Malvern Zetasizer Nano ZS, Malvern Instrument, Malvern, UK). All measurements were carried out in triplicate and performed at 25 °C. Nanoparticle morphology was observed under transmission electron microscopy (TEM) (JEOL-2100F electron microscope, Akishima, Japan). The X-ray diffraction patterns of the unprocessed MMB4 DMS, the unprocessed MDZ, MMB4-NCs, and MDZ-NPs were obtained by using a Bruker aXS D8 X-ray diffractometer (Bruker, Billerica, MA). Each sample was scanned over an angular range 2θ from 3° to 40° with a scan speed of 0.1 s per step.
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9

Nanoparticle Characterization by XRD and TEM

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The crystal structure of the nanoparticles was characterized using a Bruker AXS D8 X-ray diffractometer (XRD) working in Bragg Brentano geometry at a Cu Kα wavelength. The morphology of the nanoparticles was analyzed using an FEI Morgagni 268 transmission electron microscope (TEM) operating at 60 kV.
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10

Characterization of Luminescent Materials

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The transmittance
and photoluminescence (PL) emission spectra were measured by the Ocean
Optics USB2000+ spectrometer. X-ray powder diffraction (XRD) measurements
were employed a Bruker AXS D8 X-ray diffractometer equipped with monochromatized
Cu Kα radiation (λ = 1.5418 Å). Transmission electron
microscopy (TEM) and energy-dispersive X-ray analysis (EDX) measurements
were performed by Tecnai G2 F20, FEI. Scanning electron
microscope (SEM) was measured by S-3400 N II, Hitach. The photoluminescence
(PL) emission spectra, CIE color coordinates, and color rendering
index (CRI) of the LEDs were measured in an integrating sphere equipped
with a high-accuracy array rapid spectroradiometer (Ocean Optics).
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