Manganese dioxides with four crystal structures, α, β, γ and δ, used in this study were prepared by a hydrothermal method according to a procedure reported in our previous study38 (link). X-ray diffraction (XRD) equipped with Cu Kα (λ = 0.15406 nm) radiation source was applied to analyze the bulk crystalline phase of MnO2 using a computerized PANalytical X’Pert Pro diffractometer system. High Resolution-Transmission electron microscopy (HR-TEM) was performed on a FEI Tecnai G2 F20 electron microscope operating at 200 kV with supplied software for automated electron tomography. The samples were dispersed in ethyl alcohol and sonicated for 30 min, and then transferred to carbon-coated copper grids. Excess solution was evaporated at room temperature. Brunauer-Emmet-Teller (BET) adsorption isotherm measurements were carried out using a Quantachrome Quadrasorb SI-MP system. The BET areas and average particle sizes for the four manganese oxides are listed in Table 1 .
Xpert pro diffractometer system
Manufactured by Malvern Panalytical
Sourced in Netherlands
The XPERT-PRO diffractometer system is a lab equipment product from Malvern Panalytical. It is a versatile X-ray diffraction (XRD) instrument designed for a wide range of material analysis applications. The XPERT-PRO system provides high-quality data and reliable performance for researchers and scientists working in various fields.
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Lab products found in correlation
8 protocols using xpert pro diffractometer system
1
Synthesis and Characterization of MnO2 Polymorphs
2
Characterization of ZnO Nanowire Arrays
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The crystalline structure of the synthesized ZnO nanowire arrays was analyzed by XRD using XPERT-PRO diffractometer system (PANalytical, St. Laurent, QC, Canada) with Cu Kα radiation (λ = 1.54056 Å) at 45 kV and 35 mA, by scanning from 20° to 90° (2θ) using a step size of 0.05° and 1.0 s per step. The morphology and size of the grown ZnO nanowires were characterized by FE-SEM (LEO 1550, Zeiss, Toronto, ON, Canada). Finally, the ultraviolet-visible (UV-Vis) transmission spectra of the synthesized ZnO nanowire arrays were recorded by the HP Hewlett Packard 8452A Diode Array Spectrophotometer (HP, Mississauga, ON, Canada) over the wavelength range of 200–800 nm.
3
PXRD Analysis of Material Samples
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PXRD patterns were analysed using an X'Pert PRO diffractometer system (Panalytical, Netherlands) with a Cu Kα radiation (1.54060 Å). The tube voltage and current were set at 45 kV and 40 mA respectively and the divergence slit and antiscattering slit were set at 0.48° during illumination on the 10 mm sample size, analysed from 5° and 50° in 2θ with a step size of 0.017°. The PXRD patterns obtained experimental were refined using X'Pert High Score software.
4
Multilayer Thin Film Characterization
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The thicknesses of the Cu2O, TiO2, ZnO, and ZTO films were measured
using a Film Sense FS-XY150 ellipsometer. All coatings were modeled using a Tauc–Lorentz
model, and the ZnO and TiO2 coatings were also fit using a Cauchy model, which
showed a good agreement with the thickness estimates obtained using the Tauc–Lorentz
model. The measured thicknesses are presented in Table S1 of thesupplementary
material .
Grazing incidence x-ray diffraction (GIXRD) was performed from 2-theta values of 5°–80°
at a scan rate of 0.02°/s with a PANalytical X’PERT PRO diffractometer system and Cu Kα
radiation (wavelength of 1.5406 Å). X-ray photoelectron spectroscopy (XPS) was performed
with a VG Scientific ESCALAB 250 XPS system and an Al Kα x-ray source. The C1s peaks were
aligned to 284.6 eV to calibrate the spectra, and spectrum analysis was carried out with
the CasaXPS software. Contact angle measurements were performed using 10
μl droplets of deionized water. Two droplets were dispensed onto each
coating, and a high-definition photo of each droplet was taken. The contact angle on each
side of each droplet was measured using an ImageJ’s angle tool, and a mean contact angle
was calculated for each material.
using a Film Sense FS-XY150 ellipsometer. All coatings were modeled using a Tauc–Lorentz
model, and the ZnO and TiO2 coatings were also fit using a Cauchy model, which
showed a good agreement with the thickness estimates obtained using the Tauc–Lorentz
model. The measured thicknesses are presented in Table S1 of the
material
Grazing incidence x-ray diffraction (GIXRD) was performed from 2-theta values of 5°–80°
at a scan rate of 0.02°/s with a PANalytical X’PERT PRO diffractometer system and Cu Kα
radiation (wavelength of 1.5406 Å). X-ray photoelectron spectroscopy (XPS) was performed
with a VG Scientific ESCALAB 250 XPS system and an Al Kα x-ray source. The C1s peaks were
aligned to 284.6 eV to calibrate the spectra, and spectrum analysis was carried out with
the CasaXPS software. Contact angle measurements were performed using 10
μl droplets of deionized water. Two droplets were dispensed onto each
coating, and a high-definition photo of each droplet was taken. The contact angle on each
side of each droplet was measured using an ImageJ’s angle tool, and a mean contact angle
was calculated for each material.
5
XRD Analysis of TQ, Solid-TQ-SNEDDS, and Avicel
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A typical XRD pattern was obtained at room temperature using copper Kα radiation (1.54060 A) at 45 kV and 40 mA via the X’Pert PRO diffractometer system (Panalytical, Netherlands) for pure TQ, solid-TQ-SNEDDS, and avicel. The analyses of each sample were conducted at a scan speed of 2 min−1 using an aluminum sample container continuously scanning between 5 and 40° in 2θ at 2 min−1 speed [47 (link)].
6
X-ray Diffraction Analysis of Lipid Complexes
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The XRD pattern of pure TQ, freeze dried TQ-loaded PNC, sucrose, Capmul and stearic acid were recorded via. X'Pert PRO diffractometer system (Panalytical, Netherlands) with a Copper Kα radiation (1.54060 A) [31] . The tube voltage and current were fixed at 45 kV and 40 mA respectively. Each samples was placed in an aluminum container and measured by a continuous scan between 5 and 40° in 2θ with a step size of 0.017 [2] .
7
Characterization of Nanomaterial Properties
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The crystalline phase structure and size of the products were determined from X-ray powder diffraction (XRPD) using Panalytical X'pert-Pro diffractometer system in the 2θ range from 10° to 80° with Cu Kα radiation (λ = 1.5418 Å). The morphology of the as prepared samples was observed using scanning electron microscope (Quanta 200 3D) equipped with EDS measurement. The UV-Visible absorption spectra of the samples were recorded on T90+ UV/Vis Spectrophotometer (PG instruments Ltd). The FT-IR spectra of the prepared samples were recorded by using Shimadzu Prestige-21 infra-red spectrophotometer. The particle size of the samples was determined by the dynamic light scattering (DLS) technique using a Zetasizer nano ZS 90, Malvern make. All the measurements were performed at room temperature.
8
XRPD Analysis of Solid DIPEC Formulations
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X-ray powder diffraction (XRPD) was performed on the freeze-dried samples of solid DIPEC (EPO/S100/IND) and physical mixtures. An automated XPERT-PRO diffractometer system (PANalytical, Almelo, the Netherlands) was used in reflection mode. All samples were measured without crushing or any other sample processing. A copper tube with the generator set at 45 kV and 40 mA was used. Using a transmission spinner, it was possible to improve the counting statistics by spinning the sample using a rotation time of 4.0 s. In the incident beam path, 0.04 rad soller slit and a programmable divergence slit of 10 mm were applied. In the diffracted beam path, 0.04 rad soller slit and programmable anti-scatter slit were installed. The detector used for data collection was an X'Celerator RTMS detector, with an active length of 2.122 o . The data were collected in continuous scan mode with a scan range of 4.0040-40.001 o and a step size of 0.0167 o . The counting time was 499.745 s. X'Pert Data Collector version 2.2a (PANalytical, Almelo, the Netherlands) was used for data collection and X'Pert Data Viewer version 1.2.a (PANalytical, Almelo, the Netherlands) was used for data visualization and treatment.
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