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Thermo scientific k alpha xps

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Thermo Scientific™ K-Alpha™ XPS is a versatile X-ray Photoelectron Spectroscopy (XPS) instrument. It provides surface analysis capabilities to characterize the chemical composition and electronic state of materials.

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5 protocols using thermo scientific k alpha xps

1

Characterization of Graphene Oxide-Silver Nanoparticles

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Two-dimensional images were observed using transmission electron microscopy (TEM, JEM 2000EXII, JEOL, Tokyo, Japan). To compare the distribution of the particle size with the total counts, ImageJ software was used to analyze the full width at half maximum (FWHM).
The prepared samples were analyzed using X-ray diffraction (XRD, model D5005D, Siemens AG, Munich, Germany) to examine the crystal structure. The diffractogram was recorded at 2θ ranging from 5 to 80° at a scan rate of 4°/min with Cu Kα radiation. Fourier transform infrared spectroscopy (FT-IR) (model Horiba FT-730, Minami-ku, Kyoto, Japan) was used to evaluate the functional groups and chemical bonding of GO and GO–Ag NPs. Samples were scanned in the range of 800–4000 cm−1. A UV–visible spectrophotometer (V-650, Jasco, Tokyo, Japan) was applied to measure the light transmittance. The color was reflected in the absorption wavelength. X-ray photoelectron spectroscopy (Thermo Scientific™ K-Alpha™ XPS, Thermo Fisher Scientific, Waltham, MA, USA) was applied to examine the chemical composition of the samples. Zeta potential were recorded in triplicate using a dynamic laser scattering analyzer (Zetasizer, 2000 HAS, Malvern, Worcestershire, UK) at room temperature. Subsequently, the mass loss and the weight of the sample contents were detected using a thermogravimetric analyzer (TGA 2050, TA instrument, Inc., Tokyo, Japan).
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2

Physicochemical Characterization of Nanomaterials

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Steady-state/transient fluorescence spectrometer (Edinburgh Instruments, FLS-1000, UK), JEM-2100F transmission electron microscope (TEM) (JEOL, Japan), Thermo Scientific K-Alpha+ (XPS) (ThermoFisher), USB-2000 UV–vis spectrometer (Ocean Optics, USA), electronic balance (Shanghai Sunny Hengping Scientific Instrument Co., Ltd., FA2004N), PHS-3W pH meter (Inesa, China), ultrapure water machine (Thermo Fisher, GenPure UV), three-frequency constant-temperature CNC ultrasonic cleaner (KQ-300GVDV, Kunshan Ultrasonic Instrument Factory, Jiangsu Province), magnetic heating plate (IKA Company, RCT basic),
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3

Comprehensive Material Characterization

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Powder X-ray diffraction was carried out on a Bruker/D8-Advance diffractometer (Bruker, Ettingen, Germany) (Cu Kα radiation, λ = 0.15418 nm), the scanning range of data collection was 10–90° (2θ) and was in the continuous mode with step size of 0.02° (2θ). The morphology and structure were characterized by field emission electron microscopy (FESEM, FEI Quanta 250 FEG, Hillsboro, OR, USA) and transmission electron microscopy (TEM, JEOL, JEM-2100, Akishima, Tokyo, Japan). The Brunauer–Emmett–Teller (BET) specific surface area testing was performed on a Quantachrome Autosorb-iQ sorption analyzer (Quantachrome, Boynton Beach, FL, USA), and the pore size distribution was estimated by the Discrete Fourier Transform (DFT) method. X-ray photoelectron spectroscopy (XPS) characterization was carried out by Al-Kα radiation through Thermo Scientific K-Alpha+ XPS (Thermo Fisher Scientific, Waltham, MA, USA), the shift in the binding energy owing to the relative charge was corrected using the C 1 s peak at 284.8 eV as an internal standard. The thermal analysis was carried out on a thermogravimetric analyzer of Setaram evolution 2350 (Setaram, Lyon, France), heated from 30 °C to 600 °C in an air stream at a heating rate of 10°·min−1.
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4

XPS Analysis of GO-Cement Reduction

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The experiment used the Thermo Scientific K-Alpha XPS (Thermo Fisher Scientific, Waltham, MA, USA), from the United States, to perform XPS analysis on the samples. It was used to identify the material composition of GO-Cement before and after reduction. The intensity changes of the C=O, C-C, O-C=O, and C-O peaks in the cement powder before and after reduction were analyzed to investigate whether the GO-Cement sample was successfully reduced to rGO-Cement.
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5

Characterization of Nanocomposite Materials

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The crystal structure of prepared nanocomposites was characterized by X-ray diffraction (XRD) using Shimadzu X-ray diffractometer with Cu Kα (λ = 1.5406 Å) radiation was used to record the XRD patterns in 2θ mode with angular range 10°–80°. The surface morphology of the CoFe, CoFe-S, and CoFe-P nanocomposite was analyzed by a scanning electron microscope (SEM) (at 10 keV using Phenom, Oak Park, CA, USA). The X-ray photoelectron spectrometer (Thermo Scientific K-alpha, XPS) equipped with a monochromatic X-ray source at 1486.6 eV, corresponding to the Al K-alpha line, was used to perform XPS measurements on all the samples.
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