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Dhs 1100

Manufactured by Anton Paar
Sourced in Austria

The DHS 1100 is a density and sound velocity measuring instrument developed by Anton Paar. It measures the density and sound velocity of liquids and gases with high accuracy and precision.

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6 protocols using dhs 1100

1

Structural Analysis of FeRh Thin Films

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Characterisation data for the sample is presented in Fig. 1. The crystalline structure of the FeRh films was confirmed by X-ray diffraction (XRD) analysis (Fig. 1d). The film is found to align in-plane at 45° to the cubic MgO substrate (see Fig. 2). This fulfils the lattice matching condition with a mismatch of < 2% for planes FeRh[001](011)||MgO[001](001). The volumetric expansion of the FeRh through the meta-magnetic phase transition was measured to be 0.75% when heated from 30 °C to 220 °C, with the expansion in the MgO lattice being 0.01%. Vibrating sample magnetometry (VSM) confirmed that the meta-magnetic transition occurs at 355 K, with maximum saturation magnetization Ms of 920 kA m−1 (at a temperature of 413 K) as shown in Fig. 1c.
Structural Analysis: Quasi-static XRD measurements on the FeRh sample were undertaken on a Rigaku SMARTLAB diffractometer equipped with an Anton-Paar DHS 1100 heated stage. A PEEK dome was used to maintain a pressure of 10–2 mbar and reduce sample oxidation. Alignment of the samples followed the pre-installed procedure on the diffractometer and the sample was allowed to thermalise after each heating step. Scattering from the dome was reduced by scanning a region of 2θ with no PEEK diffraction peaks, about FeRh (002).
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2

Structural Characterization of Thin Films

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The lattice parameters of the thin films were evaluated by XRD measurements with a four-axis diffractometer (Bruker AXS, d8 discover). A domed hot stage (Anton Paar, DHS 1100) evacuated with a rotary pump (~10 Pa) was used in the high temperature XRD measurement. A 200-kV TEM (JEOL Ltd., JEM-2010HC,) and an aberration-corrected STEM (JEOL Ltd., JEM-2100F) were used for cross-sectional observations of thin specimens prepared by ion milling.
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3

Thin-Film CuSCN and CsSnI3 XRD

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XRD was performed on thin films of CuSCN prepared from diethyl sulphide solution and a bilayer of CuSCN and B-γ-CsSnI3 prepared from 8 wt% (total solids) DMF solution deposited onto a glass substrate (13 × 13 mm2) spinning at 4000 rpm for 60 seconds. Measurements were made on a Panalytical X’Pert Pro MRD equipped with an Anton Paar DHS 1100 domed stage under a flow of N2. Simulated diffraction patterns were calculated using the program Mercury 3.122 using CIFs from the Inorganic Crystal Structure Database (ICSD).
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4

X-Ray Diffraction Characterization Methods

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The θ–2θ XRD patterns were measured by a high-resolution diffractometer (SmartLab, Rigaku) with Cu 1 radiation (λ = 1.5406 Å) monochromated by channel-cut Ge crystals. The pole figures were measured with a four-axis diffractometer (X’Pert PRO MRD, Panalytical). The high-temperature XRD measurement was performed by D8 Discover (Bruker) with a larger-area two-dimensional detector (VÅNTEC-500, Bruker) and a hot stage (DHS 1100, Anton Paar) with Cu Kα radiation (λ = 1.5418 Å).
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5

Hydrothermal Synthesis of TiO2 Nanowire Arrays

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TiO2 NW arrays were synthesized by a hydrothermal procedure adapted from Liu et al. [40 (link)]. All chemicals were used as supplied without further purification. In a typical synthesis, 250 μL titanium butoxide (Ti(nOBu)4), Sigma-Aldrich, St. Louis, MI, USA) was dropped into a mixture of 5 mL concentrated hydrochloric acid (37 wt%, analytical grade, Sigma-Aldrich) and 5 mL deionized water under vigorous stirring. Ultrasonically cleaned (isopropyl alcohol, acetone, ethanol) FTO substrates were placed vertically in a Teflon liner, which was filled with the growth solution and placed into a steel autoclave. The hydrothermal reaction was performed at 150 °C for 4.5 h. Afterwards, the autoclave was cooled down to room temperature. The FTO substrates, covered with TiO2 NW arrays, were rinsed with deionized water and dried with compressed air. Heat treatment of the samples was performed at 500 °C (50 °C/min ramp up to 500 °C) on an Anton Paar DHS 1100 (Anton Paar, Graz, Austria) heating stage. For the TiO2 NWs annealed in N2, a constant N2 atmosphere of 1.35 bar was applied during the experiment, whereas the other sample was annealed in air.
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6

Characterization of 2D Perovskite Flakes

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The RT XRD pattern of 2D perovskite SC flakes was collected using a Bruker-AXS D8 Advance x-ray diffractometer equipped with Cu Kα (λ = 1.5418 Å) x-ray source. The measurement was performed in the 2θ mode between 3° and 50° with a step size of 0.02° and the integration time of 1 s per step. The in situ temperature-dependent XRD pattern of (PEA)2PbI4 films between 30° and 85°C was measured using a Bruker D8 Discover equipped with Anton Paar DHS1100 vacuum heating chamber and a LYNXEYE detector. The measurement was performed in 2θ mode between 3° and 60° with a step size of 0.02° and integration time of 1 s per step. For each temperature measurement, the sample’s temperature was allowed to stabilize with a waiting time of about 20 min. The complex refractive indexes of the samples were measured by using a commercial spectroscopic ellipsometer (J.A. Woolam Company). Variable incidence angle measurements were performed from 65° to 75° with a step size of 5° to obtain accurate fitting parameters. Detailed fitting process refers to (50 ).
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