Smartlab intelligent x ray diffraction system

The crystallinity index of both species’ banana pseudostem CNFs was determined using X-ray diffraction (Rigaku SmartLab Intelligent X-ray Diffraction System, Tokyo, Japan) under the following conditions: monochromatic Cu K radiation of 15.418 nm; 40 kV, 40 mA with a step size of 0.02° and time/step around 20 s from 3° to 100° (2). An empirical technique was used to calculate the crystallinity index (CrI) using the following equation [26 (link)]: $$\mathrm{CrI} = \frac{\left({\mathrm{I}}_{002} - {\mathrm{I}}_{\mathrm{am}}\right)}{{\mathrm{I}}_{002}} \times 100$$
where I₀₀₂ is the maximum intensity of the (002) lattice diffraction at 2θ = 22.5° and I_am is the intensity of the scattered diffraction by the amorphous part of the sample at 2θ = 18°.

The samples were characterized by different analytical techniques. Simultaneous TG/DSC analysis was performed on a NETZSCH STA 449 C Jupiter system. Optical image was captured on a Nikon Microphot-FXA microscope. SEM observations were made on a JEOL JSM-6700F field-emission SEM. TEM images, SAED pattern, EELS, and EDS were obtained on a JEOL JEM-2100F STEM (200 kV, field-emission gun) system equipped with an Oxford INCA x-sight EDS and an ENFINA 1000 EELS. XPS spectra were acquired on a Thermo Scientific Escalab 250Xi spectrometer. XRD measurement was conducted using a Rigaku SmartLab Intelligent X-ray diffraction system with filtered Cu K_α radiation (λ = 1.5406 Å, operating at 45 kV and 200 mA). Raman measurement was taken using a Horiba Jobin Yvon LabRAM HR system with a laser wavelength of 488 nm. The nitrogen adsorption and desorption isotherms were obtained at 77 K with a Micromeritics ASAP 2020 volumetric adsorption analyzer.