NF mats were characterized by transmission electron microscopy (TEM) using a Philips CM120 instrument operating at an accelerating voltage of 120 kV and by scanning electron microscopy (SEM) with a TESCAN MIRA3 FEG-SEM microscope after sample metallization (2 nm Pt or Cr).
Mira3 feg sem microscope
Manufactured by TESCAN
Sourced in Czechia
The MIRA3 FEG-SEM microscope is a high-performance scanning electron microscope (SEM) that utilizes a field emission gun (FEG) as the electron source. It is designed to provide high-resolution imaging and advanced analytical capabilities for a wide range of applications.
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Lab products found in correlation
2 protocols using mira3 feg sem microscope
1
Nanomaterial Characterization by TEM and SEM
2
Ultrastructural Imaging of Samples
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Samples were fixed with 200 µL pre-cold paraformaldehyde solution (2.5% w/v) (Sigma-Aldrich GmbH, Germany) and lyophilized after ultracentrifugation. Subsequently, samples were gold-sputtered and visualized under a Mira-3 FEG SEM microscope (Tescan, Czech Republic) [45 ].
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