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Solver pro

Manufactured by NT-MDT

Solver PRO is a scanning probe microscope (SPM) designed for high-resolution imaging and analysis of surfaces at the nanoscale. It provides precise control and measurement of surface topography, electrical, magnetic, and other properties with atomic-level resolution. The Solver PRO is a versatile instrument suitable for a wide range of applications in materials science, nanotechnology, and life sciences.

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26 protocols using solver pro

1

Atomic Force Microscopy of PLGA Nanoformulations

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The empty PLGA and nanoformulations were prepared for the Atomic Force Microscopy (AFM) experiments with a final concentration of 5 mg/mL. 20 μL drops of each suspension were deposited on 20 mm diameter mica discs sprayed with argon to avoid excess conglomeration of the NPs and the excess solvent was allowed to evaporate at room temperature. A NT-MDT Solver Pro microscope (Moscow, Russia), with single crystal silicon-antimony doped probe and a gold-coated tip (NSG-01 from NT-MDT) was used to collect images. The microscope was calibrated by a calibration grating (TGQ1 from NT-MDT) in order to reduce nonlinearity and hysteresis in the measurements. Scanning was performed in intermittent mode, with a frequency of 3 to 1 Hz. and the resolution of all the images acquired was 15 nm. The images were processed with the program Gwyddion and a statistical analysis over on the diameters of 30 different nanoparticles of each type was conducted to compare results to DLS data.
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2

Atomic Force Microscopy of TiO2 Nanotubes

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Topographic
features of TiO2 NTs were examined by atomic force microscopy
(Solver PRO, NT-MDT, Russia) in tapping mode in air. Samples were
scanned with the standard Si cantilever with a force constant of 22
N/m and at a resonance frequency of 325 kHz (the tip radius was 10
nm, and the tip length was 95 μm). Average surface roughness
(Ra) was measured from representative images on a 1 × 1 μm2 area, and the scan rate was set at 1.3 Hz. The results are
shown as the average Ra from five different areas.
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3

Atomic Force Microscopy of Paper

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Changes in surface morphology of paper samples were analyzed by Atomic force microscope (AFM) Solver PRO (NT-MDT, Moscow, Russia) in non-contact mode in air. Samples were cut into small pieces, and the surface was scanned by a standard Si cantilever with a force constant of 22 Nm−1 and at a resonance frequency of 325 kHz. The cantilever’s tip radius was 10 nm, the tip length was 95 µm, and the scan rate was set at 1.2 Hz. Every measurement was repeated at least five times. Average surface roughness (Sa) was measured from representative images on 5 × 5, 2 × 2, and 1 × 1 µm2 areas with the Nova AFM software (NT-MDT, Moscow, Russia). Paper 2 in untreated state was too rough to be analyzed with our AFM device.
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4

Nanogel Physical Characterization by DLS and AFM

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The hydrodynamic diameters as well as ζ-potentials and the polydispersity index of nanogels NG-c + and NG-u were determined by dynamic light scattering (DLS) measurements using a Zetasizer Nano ZS from Malvern Instruments. The reported data are an average value of three measurements of the same sample: for NG-c + , the sample was dissolved in acidic solution (pH = 4.5); whereas NG-u one was dissolved in alkaline solution (pH = 10.5). Atomic force microscopy (AFM) analysis was performed using a NT-MDT Solver Pro instrument operating in non-contact mode with silicon tips.
Samples were prepared by dropping nanogel latexes onto silicon substrate and drying. AFM images on 1 × 1 μm areas were recorded for the preliminary morphologic evaluation; 500 × 500 nm image were then cropped and height line profile performed for single nanostructure. The evaluation of the surface morphology and nanogel size were obtained by flattening of the images (first order) using NTMDT software.
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5

Visualizing HEP/VEGF-SNC Formation on Bone Substitutes

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In order to analyze the formation of HEP/VEGF-SNCs on the bone substitutes, samples were fixed with 4% paraformaldehyde (PFA) for 10 min at 4 °C. After dehydration, the specimens were observed by mean of SEM (either with Hitachi TM1000 or FEG Sirion XL; FEI) in conventional high vacuum mode with a secondary electron detector. A commercial stand-alone AFM microscope Solver Pro (Nt-Mdt Inc., Moscow, Russia) was used to acquire AFM images. Tapping imaging mode was used, with NSG 10 cantilever with a typical resonance frequency of 105 kHz, and a spring constant of 2 N m−1. The image resolution was set to 512 × 512, with a scanning rate of 1 Hz. Images were analyzed using the open source software Gwyddion 2.24 [52 (link)].
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6

Topographical Characterization of Treated Cloves

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An AFM (Solver PRO, NT-MDT, Moscow, Russia) was used to characterize the topology of the samples. Pieces approximately 4 mm × 4 mm in size and 1 mm in thickness were excised from the surface of treated and untreated cloves while using a scalpel and mounted onto aluminum holders using carbon tape. All of the measurements were performed in tapping mode using ATEC-NC-20 tips (Nano and More GmbH, Wetzlar, Germany) with a resonance frequency of 210–490 kHz and the force constant of 12–110 N/m.
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7

Graphene FET Characterization Protocol

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Atomic force microscopy (Solver-PRO, NT-MDT, Moscow, Russia) was used to estimate the surface roughness of the graphene channel. The quality of FET channels was investigated by microRaman spectroscopy (Centaur HR, Nanoscan Technology, Dolgoprudny, Moscow region, Russia) with a 100× objective (NA = 0.9) at a 532 nm wavelength with a laser power of 0.5 mW. Current voltage characteristics (CVC) were measured using Ag/AgCl (Science Products GmbH) as a liquid gate electrode with a semiconductor parameter analyzer IPPP1/5 (MNIPI, Minsk, Belarus) connected to the source and drain electrodes.
The NT-proBNP was dissolved in 0.1×PBS with the addition of Tween (0.01%) to avoid sticking of proteins to the tube wall. Solutions of biomarker were prepared of different concentrations from 1 fg/mL to 10 ng/mL [21 (link)]. Artificial saliva (AS) was ordered from “Apoteka Beograd” (Belgrade, Serbia) and dissolved 10 times in 0.01×PBS. NT-proBNP was dissolved in AS the same way as described above for PBS.
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8

AFM Analysis of Surface Morphology

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The surface morphology of the samples was analyzed with an AFM (Solver PRO, NT-MDT, Moscow, Russia). Images were recorded in a tapping mode using ATEC-NC-20 tips (Nano And More GmbH, Germany). A resonance frequency of the tip and the force constant were 210–490 kHz and 12–110 Nm−1, respectively. An average surface roughness of the samples (Ra) was determined by using the program Spip 5.1.3 (Image Metrology A/S). The average surface roughness was calculated from the images taken over an area of 5 × 5 µm2.
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9

Assessing Sterilization Effects on Nanotubes

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To observe changes in the morphological features of NTs , SEM (Jeol JSM-7600F, USA) analysis was employed. The analysis was done at accelerating voltage of 8keV and the samples with cells were prior to SEM analysis sputtered with gold (5 nm coating). Changes in surface morphology of the 100 nm NT surfaces and Ti surfaces after different sterilization techniques were analysed by atomic force microscopy (AFM, Solver PRO, NT-MDT, Russia) in tapping mode in air. Samples were scanned with a standard Si cantilever with a force constant of 22 N/m and at a resonance frequency of 325 kHz (tip radius was 10 nm and the tip length was 95 µm). The average surface roughness (Ra) was measured from representative images of 1x1 µm 2 area and at a scan rate set at 1.3 Hz.
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10

Surface Morphology Analysis by AFM

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The surface morphology was examined by Atomic Force Microscopy (AFM). An AFM (Solver PRO, NT-MDT, Moscow, Russia) was used to determine variations of the surface morphology and roughness around the center of the impact point of the plasma jet with the polymer surface. The measurements were performed in the semi-contact mode. Images with a size of 2 × 2 µm2 were recorded.
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