the P4VP-IX with a maximum degree of halogenation, the thickness and
weight of samples before and after halogenation treatment were measured
by ellipsometry and microbalance (Mettler Toledo XPR6UD5, 0.5 μg
accuracy), respectively. The accuracy of the balance is sufficient
for the thin-film samples with masses on the order of 1 mg.
The weight of the polymer thin-film coating prior to halogenation
is calculated by subtracting the weight of the uncoated substrate
(clean silicon wafer) from the coated substrate. After halogenation,
residual uncomplexed halogens were extracted by rinsing with pure
hexanes or blowing a stream of Ar over the surface. The samples were
also placed in a desiccator for 24 h to remove any physically absorbed
halogen species. The samples were then reweighed. The volume of the
films was calculated using the substrate area and measured film thickness
(see below for details on ellipsometry measurements).