S 5500
The S-5500 is a scanning electron microscope (SEM) designed and manufactured by Hitachi. It is a high-resolution SEM capable of magnifications up to 1,000,000x. The S-5500 is equipped with advanced imaging capabilities and can produce detailed images of small-scale structures and features.
Lab products found in correlation
84 protocols using s 5500
Quantifying Nanochannel DNA Attachment
Characterization of Thin Film Composition
characterized by X-ray diffraction (XRD) analysis using an Ultima
IV (Rigaku) with Cu Kα radiation. For XRD analysis, the deposition
amount was maintained in the range of approximately 50–100
μg cm–2 to maximize the diffraction intensity.
Inductively coupled plasma-atomic emission spectrometry (ICP-AES)
by a PS3520VDDII (Hitachi High-Tech Science) instrument was used to
estimate the material mass loading of the fabricated thin films. The
samples were deposited on Si substrates (cleaved to a size of ∼4
cm2) under the aforementioned conditions. The actual geometrical
surface area of the Si substrate was determined by image analysis
using ImageJ.25 (link) The samples were completely
dissolved in dilute nitric acid and hydrogen peroxide before ICP-AES
measurements. Field-emission scanning electron microscopy (S5500;
HITACHI High-Tech) was used to examine the morphology and thickness
of the fabricated thin films. The film surfaces were examined by atomic
force microscopy (AFM) in the tapping mode using a Nanoscope V (Bruker)
instrument; AFM data were analyzed using the Gwyddion software.
Characterization of Thin Film Optical Properties
Morphological Analysis of PVDF Fibers
Comprehensive Nanoparticle Characterization Protocol
Electron Microscopy of AgNP-Treated Cells
plant extract, and L-AgNPs/LL were washed with PBS and fixed with
4% formaldehyde and 1% glutaraldehyde in PBS at room temperature.
The samples were then rinsed twice with 0.1 M phosphate buffer and
placed in 1% osmium tetroxide for 1 h. The drying of the samples was
carried out in a series of ethanol. The samples were finally placed
on copper grids to be observed by SEM using a Hitachi S-5500 (Hitachi
High-Technologies Europe GmbH, Krefeld, Germany).56 (link)
Fabrication of PEDOT:PSS Thin Films with Cu2Se Nanowires
Cu2Se NWs is schematically shown in
(100 μL, N-1005, Orgacon) was dropped, spin-coated (1500 rpm,
45 s), and annealed (80 °C, 20 min) on a glass substrate of 10
mm × 10 mm, which was cleaned and hydrophilized by piranha solution
(a mixture of H2SO4 and H2O2). The PEDOT:PSS layer was formed in this way. Second, Cu2Se NWs (0.18 mg) dispersed in ethanol (30 μL) were deposited,
spin-coated, and annealed (80 °C, 5 min) on the substrate. The
NW layer was accumulated n times. Finally, the PEDOT:PSS
solution (100 μL) was dropped, spin-coated, and annealed (80
°C, 20 min) on the substrate again. The thin film thus obtained
is abbreviated as NW-n in this paper. NW-0 (without
Cu2Se NWs) was prepared by spin-coating PEDOT:PSS once.
The reference thin film was also prepared using EtOH solution without
Cu2Se NWs instead of the EtOH dispersion of Cu2Se NWs (“NW-0-EtOH-8”). The crystal structures of NWs
and thin films were characterized by X-ray diffraction (XRD) with
an X-ray diffractometer (Rigaku, Smartlab) and scanning electron microscopy
(SEM)–energy-dispersive X-ray spectroscopy (EDX) with a field
emission SEM (Hitachi High-Technologies, S-5500), respectively.
Characterization of Aqueous PVP Solutions
The surface tension was estimated using the standard pendant drop method, wherein a droplet (15 μL) formed using a 20 G needle was photographed for 10 s after the formation of the droplet using a contact angle analyzer (B100W, Asumi-giken) followed by analysis of the image using the Young–Laplace equation 28 (link). The measurement was repeated five times. Before the measurement, the syringe and needle were washed thoroughly using isopropyl alcohol followed by repetitive filling and expelling of the sample solution from the needle (Supplementary Fig. 8).
The viscosity or rheological behavior of the PVP solutions was evaluated using a rotating rheometer (TA Instruments, ARES G2). The viscosities of the solutions were measured at shear rates between 10−1 and 103 s−1. The electrospun samples were characterized by SEM (HITACHI High-Technologies, S3600N and S-5500). Au was deposited less than 4 nm estimated by quartz thickness monitor on the prepared electrospun samples with a desktop magnetron sputtering system (HITACHI High-Technologies, MC1000) to obtain clear SEM images. A total of ~ 100 fibers were randomly selected from the SEM images for calculating the average diameter and standard deviation.
Characterization of Coated Microspheres
Comprehensive Structural and Electronic Characterization of CMMTOs
the CMMTOs were analyzed by measuring the XRD patterns (Ultima IV,
Rigaku, Cu Kα radiation, 1.6 kW). The nitrogen adsorption isotherms
(Autosorb, Anton Paar) of the CMMTOs were measured, and the surface
areas and pore size distributions were obtained using the BET method
and BJH method, respectively. SAXS and XAFS measurements were conducted
to examine the mesoscopic structure and electronic state of CMSbTOs,
respectively (see the
observed using SEM (S-5500, Hitachi High-Tech, acceleration voltage
of 2 kV) and TEM (JEM-2100F, JEOL). TEM-EDS analysis was performed
on thin sections of Pt/CMSbTO particles fabricated by using the FIB
method. The concentrations of the doped elements in the CMMTOs and
the Pt loadings of the Pt/CMSbTOs were determined by using ICP-OES
(PS3520UVDD II, Hitachi High-Tech). The electrical conductivities
of the CMMTOs were measured using a compression cell61 (link) and potentiostat (SP-300, Biologic) at a compression pressure
of 2.4 MPa.
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