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84 protocols using s 5500

1

Quantifying Nanochannel DNA Attachment

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To quantify the procedure for nanochannel processing based on milling conditions using FIB, the appearance of the processed nanochannel was observed using a field emission scanning electron microscope (FE-SEM) (SUPRA 40VP, Carl Zeiss, Jena, Germany). An ultra-high-resolution FE-SEM (S-5500, Hitachi High-Technologies, Tokyo, Japan) was used to observe the appearance of the lambda DNAs attached to the nanochip according to the electrophoresis conditions. Furthermore, a confocal laser scanning microscope (LSM 510 META, Carl Zeiss, Jena, Germany) was used to observe the fluorescent-stained lambda DNAs. Fluorescent images were processed using a median noise filter to eliminate background noise. The acquired fluorescent images were compared for each channel, using Image J software to identify any differences in light intensity relating to the amount of lambda DNAs attached to each nanochannel. This resulted in the quantification of the amount of lambda DNAs attached to the interface according to the electrophoresis signal conditions.
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2

Characterization of Thin Film Composition

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The crystalline phases of the fabricated thin films on glass were
characterized by X-ray diffraction (XRD) analysis using an Ultima
IV (Rigaku) with Cu Kα radiation. For XRD analysis, the deposition
amount was maintained in the range of approximately 50–100
μg cm–2 to maximize the diffraction intensity.
Inductively coupled plasma-atomic emission spectrometry (ICP-AES)
by a PS3520VDDII (Hitachi High-Tech Science) instrument was used to
estimate the material mass loading of the fabricated thin films. The
samples were deposited on Si substrates (cleaved to a size of ∼4
cm2) under the aforementioned conditions. The actual geometrical
surface area of the Si substrate was determined by image analysis
using ImageJ.25 (link) The samples were completely
dissolved in dilute nitric acid and hydrogen peroxide before ICP-AES
measurements. Field-emission scanning electron microscopy (S5500;
HITACHI High-Tech) was used to examine the morphology and thickness
of the fabricated thin films. The film surfaces were examined by atomic
force microscopy (AFM) in the tapping mode using a Nanoscope V (Bruker)
instrument; AFM data were analyzed using the Gwyddion software.
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3

Characterization of Thin Film Optical Properties

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Top surface structures of the fabricated films were obtained with a field emission-scanning electron microscope (FE-SEM) (S5500, Hitachi High-Technologies, Tokyo, Japan). The water droplet contact angle was measured with a contact angle meter (LSE-ME2, NiCK, Saitama, Japan). The volume of the water droplet was 0.6 μL. The optical properties were characterized by an optical system equipped with a halogen light source (MC-2563, Otsuka Electronics, Osaka, Japan) and a spectromultichannel photodetector (MSPD-7000, Otsuka Electronics, Osaka, Japan) to obtain the reflection spectrum of each film. The optical setup is detailed in Figure S1. To estimate the extent of CoTPP aggregation in the film, we obtained the reflection spectrum of each film prepared above in a N2 gas flow. The UV-vis transmission spectrum of 5 μM CoTPP-THF solution was also recorded by a UV-vis spectrophotometer (V-530, JASCO, Tokyo, Japan) for comparison.
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4

Morphological Analysis of PVDF Fibers

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Scanning Tunneling Electron Microscopy (STEM) model S5500 (Hitachi High-Tech, Schaumburg, IL) was used to examine the morphology of the pure PVDF electrospun fibers and the five groups of PPy-coated PVDF fibers after polymerization for the various preselected time intervals. All specimens were coated with silver-palladium and imaged under 30 kV applied voltage at 3,000x and 15,000x magnifications. The collected micrographs were then analyzed to quantify orientation distribution of electrospun PVDF fibers, before and after PPy coating, using ImageJ (v1.8.0, NIH Image, Bethesda, MD) to evaluate the impact of PPy polymerization on the alignment of the PVDF fibers.
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5

Comprehensive Nanoparticle Characterization Protocol

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Phase analysis of the target and the nanoparticles was performed using an X-ray diffractometer (XRD, Philips, X’Pert-PRO-MRD, Netherlands) with a Cu-kα1⁄kα2 ratio of 0.514 radiation at 55 kV and 22 mA. All patterns were recorded over the angular range 10 ≤ /deg ≤90 with a step size of  = 0.06 deg. The particle size and morphology were observed using scanning electron microscopy (SEM, Hitachi High-technologies, S-5500, Japan). Transmission electron microscopy (TEM, JEOL, JEM-2010F, Japan) was used to characterize the lattice fringe at high resolution with an acceleration voltage of 200 kV. The optical properties of the colloidal nanoparticles were analyzed by photoluminescence spectrophotometry (PL, Hitachi High-technologies, F-7000, Japan) with a 150 V Xe lamp and UV-vis (Jasco Corporation, V-670, Japan) at room temperature. Elemental analysis of the point-mode was performed by energy-dispersive X-ray spectroscopy (EDS, EDAX, Genesis APEX2 system, U.S.A.) combined with TEM, while area-mode analysis was produced by EDS (Horiba, ENERGY EX-250, Japan). Except for X-ray diffraction analysis, the colloidal nanoparticles used for all characterization throughout the study were filtered with a 0.22 μm pore-size filter.
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6

Electron Microscopy of AgNP-Treated Cells

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Cells treated with L-AgNPs,
plant extract, and L-AgNPs/LL were washed with PBS and fixed with
4% formaldehyde and 1% glutaraldehyde in PBS at room temperature.
The samples were then rinsed twice with 0.1 M phosphate buffer and
placed in 1% osmium tetroxide for 1 h. The drying of the samples was
carried out in a series of ethanol. The samples were finally placed
on copper grids to be observed by SEM using a Hitachi S-5500 (Hitachi
High-Technologies Europe GmbH, Krefeld, Germany).56 (link)
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7

Fabrication of PEDOT:PSS Thin Films with Cu2Se Nanowires

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The fabrication process of PEDOT:PSS thin films containing
Cu2Se NWs is schematically shown in Figure 1. First, a pH-neutral PEDOT:PSS solution
(100 μL, N-1005, Orgacon) was dropped, spin-coated (1500 rpm,
45 s), and annealed (80 °C, 20 min) on a glass substrate of 10
mm × 10 mm, which was cleaned and hydrophilized by piranha solution
(a mixture of H2SO4 and H2O2). The PEDOT:PSS layer was formed in this way. Second, Cu2Se NWs (0.18 mg) dispersed in ethanol (30 μL) were deposited,
spin-coated, and annealed (80 °C, 5 min) on the substrate. The
NW layer was accumulated n times. Finally, the PEDOT:PSS
solution (100 μL) was dropped, spin-coated, and annealed (80
°C, 20 min) on the substrate again. The thin film thus obtained
is abbreviated as NW-n in this paper. NW-0 (without
Cu2Se NWs) was prepared by spin-coating PEDOT:PSS once.
The reference thin film was also prepared using EtOH solution without
Cu2Se NWs instead of the EtOH dispersion of Cu2Se NWs (“NW-0-EtOH-8”). The crystal structures of NWs
and thin films were characterized by X-ray diffraction (XRD) with
an X-ray diffractometer (Rigaku, Smartlab) and scanning electron microscopy
(SEM)–energy-dispersive X-ray spectroscopy (EDX) with a field
emission SEM (Hitachi High-Technologies, S-5500), respectively.
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8

Characterization of Aqueous PVP Solutions

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The conductivities of the prepared aqueous solutions were measured using a conductivity meter (HORIBA Co. Ltd., LAQUA (F-74) with conductivity measurement cell (3,552-10D)) at 25 °C.
The surface tension was estimated using the standard pendant drop method, wherein a droplet (15 μL) formed using a 20 G needle was photographed for 10 s after the formation of the droplet using a contact angle analyzer (B100W, Asumi-giken) followed by analysis of the image using the Young–Laplace equation 28 (link). The measurement was repeated five times. Before the measurement, the syringe and needle were washed thoroughly using isopropyl alcohol followed by repetitive filling and expelling of the sample solution from the needle (Supplementary Fig. 8).
The viscosity or rheological behavior of the PVP solutions was evaluated using a rotating rheometer (TA Instruments, ARES G2). The viscosities of the solutions were measured at shear rates between 10−1 and 103 s−1. The electrospun samples were characterized by SEM (HITACHI High-Technologies, S3600N and S-5500). Au was deposited less than 4 nm estimated by quartz thickness monitor on the prepared electrospun samples with a desktop magnetron sputtering system (HITACHI High-Technologies, MC1000) to obtain clear SEM images. A total of ~ 100 fibers were randomly selected from the SEM images for calculating the average diameter and standard deviation.
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9

Characterization of Coated Microspheres

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The morphologies of the PSt microspheres before and after PANI coating were observed using a field emission scanning electron microscope (FE-SEM) (S-5500, Hitachi High-Technologies). The X-ray diffraction (XRD) analysis was carried out on an X’pert Pro (PANalytical) with Cu Ka radiation.
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10

Comprehensive Structural and Electronic Characterization of CMMTOs

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The crystalline structures of
the CMMTOs were analyzed by measuring the XRD patterns (Ultima IV,
Rigaku, Cu Kα radiation, 1.6 kW). The nitrogen adsorption isotherms
(Autosorb, Anton Paar) of the CMMTOs were measured, and the surface
areas and pore size distributions were obtained using the BET method
and BJH method, respectively. SAXS and XAFS measurements were conducted
to examine the mesoscopic structure and electronic state of CMSbTOs,
respectively (see the Supporting Information for details). The morphologies of the CMMTOs and Pt/CMSbTOs were
observed using SEM (S-5500, Hitachi High-Tech, acceleration voltage
of 2 kV) and TEM (JEM-2100F, JEOL). TEM-EDS analysis was performed
on thin sections of Pt/CMSbTO particles fabricated by using the FIB
method. The concentrations of the doped elements in the CMMTOs and
the Pt loadings of the Pt/CMSbTOs were determined by using ICP-OES
(PS3520UVDD II, Hitachi High-Tech). The electrical conductivities
of the CMMTOs were measured using a compression cell61 (link) and potentiostat (SP-300, Biologic) at a compression pressure
of 2.4 MPa.
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