The processed wrinkle structure was characterized by an atomic force microscope (Dimension ICON, Bruker Corp., Karlsruhe, Germany) in PeakForce mode, which is a featured mode of Bruker Corp. that could provide the highest resolution. Then, the results were analyzed by Nanoscope Analysis 1.5 software (Bruker Corp., Karlsruhe, Germany). The transmittance of the samples was measured using UV–vis spectroscopy with a UV-3600 spectrophotometer (Shimadzu, Kyoto, Japan). The output voltage of the TENG was measured via a digital oscilloscope (Agilent DSO-X 2014A, Agilent Technologies Inc., Santa Clara, CA, USA) using a 100 MΩ probe (HP9258, Prokit's Industries Co., Ltd., New Taipei City, Taiwan, China), and the current was amplified by a SR570 low-noise current amplifier (Stanford Research Systems, Inc., Sunnyvale, CA, USA). The upper surface of the TENG was fixed. Then, a sinusoidal signal with an amplitude of 1.5 V was generated from the signal-source module of the oscilloscope and amplified by an amplifier (YE5871A, SINOCERA, Shanghai, China) to power the modal shaker (JZK-10, SINOCERA, Shanghai, China), which provided a periodic and stable external force to the device.
Sr570 low noise current amplifier
Manufactured by Stanford Research Systems
Sourced in United States
The SR570 is a low-noise current amplifier designed to amplify and measure small current signals. It features a wide input current range, programmable gain, and low-noise performance. The SR570 is suitable for applications that require accurate measurement of small currents.
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3 protocols using sr570 low noise current amplifier
1
Characterization of Wrinkle Structure and TENG Performance
2
Characterizing Ni Foam Morphology and Electrical Output
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The surface morphology of the Ni foam and micro roughness silicone films were characterized using a field-emission scanning electron microscope (FE-SEM, TESCAN, MIRA 3). The electrical output analysis of voltage and current was performed using an electrometer (Keithley 6514 Instruments Inc., USA) and SR 570 low noise current amplifier (Stanford research Systems, USA), respectively. The external force for measuring the electrical output was applied using a linear motor (LinMot, Inc., Switzerland). A software platform using LabVIEW was built for real-time data acquisition and electrical analysis. A grounded home-made Faraday cage was set up for electrical measurements.
3
Electrical Characterization of Samples
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The short-circuit current was measured by a SR570 Low-Noise Current Amplifier (Stanford Research Systems, USA). The output voltage was tested through the NI-9215 (National Instruments) under a load resistance of 100 MΩ.
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