Tap300al g
The TAP300Al-G is a benchtop scanning electron microscope (SEM) designed for high-resolution imaging and analysis of samples. It features a tungsten electron source, a maximum accelerating voltage of 30 kV, and can achieve a resolution of up to 5 nm. The instrument is equipped with a 300 mm X-Y motorized stage and can accommodate a variety of sample types.
5 protocols using tap300al g
Characterization of Scratch-etched Silicon Wafers
Atomic Force Microscopy Surface Scratching
Characterizing Surface Topography and Protein Coatings
A collagen-coated surface treated with Alexa Fluor 594 NHS ester was imaged in PBS using a Leica SP5 X confocal microscope with a 100× objective (NA 1.4) and a scanner zoom factor of 4. Images were obtained in a 512 × 512 pixel format. The fluorescent-fibronectin-coated surface was imaged in HBSS in the same manner. The orthogonal view is a single slice reconstructed from z-stack images.
Characterizing Morphology of np-Au via AFM
AFM Nanoindentation of Phage Fibers
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