Morphology and size of the nanocrystals in developed dispersions were analyzed using an NTEGRA Prima Atomic Force Microscope (NT-MDT, Moscow, Russia). The sample preparation included dilution of the dispersion F5, F6, or F8 in ultra-purified water (1:100 v/v), after which the 10 µL of the sample was placed on the circular mica substrate (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, CA, USA) and dried in a vacuum dryer (30 min, 25 °C). The measurements were conducted using intermittent-contact AFM mode using NT-MDT NSGO1 silicon cantilevers (N-type, Antimony doped, Au reflective coating), with a nominal force constant of 5.1 N/m. The cantilever driving frequency was around 150 kHz during the measurements. For the analysis of the taken topography and “error signal” AFM images, the software Image Analysis 2.2.0 (NT-MDT) was used.
Nsgo1 silicon cantilevers
Manufactured by NT-MDT
NSGO1 silicon cantilevers are a type of laboratory equipment used in scanning probe microscopy. They are designed for atomic force microscopy (AFM) applications. The cantilevers are made of silicon and feature a sharp tip at the end, which is used to interact with the surface of a sample during imaging or measurement.
Automatically generated - may contain errors
5 protocols using nsgo1 silicon cantilevers
1
Nanocrystal Morphology Analysis via AFM
2
Microscopic Analysis of Nanoemulsion Microstructure
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Optical microscopy under polarized light was employed to investigate the signs of anisotropy in the transient phases and nanoemulsion samples (×100 magnification) with Olympus BX53P polarizing microscope, and the obtained images were analyzed with the cellSens Entry version 1.14 software (Olympus, Tokyo, Japan).
To gain a direct access into the microstructure, i.e., to determine its morphological properties and to confirm the mean droplet size data, the representative nanoemulsion samples F1 and F2 prepared with different cosurfactants were investigated using Ntegra prima atomic force microscope (NT-MDT). Prior to measurements, 10 μL of diluted nanoemulsions (1:100 or 1:1000 v/v) were placed on the circular mica substrate discs (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, CA, USA) and dried under vacuum for 24 h at 25 °C. Measurements were carried out in the air using intermittent-contact AFM mode. For this purpose, NT-MDT NSGO1 silicon cantilevers (N-type, Antimony doped, Au reflective coating) were used. The nominal force constant of these cantilevers was 5.1 N/m. During the measurements cantilever driving frequency was around 150 kHz. Both topography and “error signal” AFM images were taken, and later analyzed using Image Analysis 2.2.0 (NT-MDT) software.
To gain a direct access into the microstructure, i.e., to determine its morphological properties and to confirm the mean droplet size data, the representative nanoemulsion samples F1 and F2 prepared with different cosurfactants were investigated using Ntegra prima atomic force microscope (NT-MDT). Prior to measurements, 10 μL of diluted nanoemulsions (1:100 or 1:1000 v/v) were placed on the circular mica substrate discs (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, CA, USA) and dried under vacuum for 24 h at 25 °C. Measurements were carried out in the air using intermittent-contact AFM mode. For this purpose, NT-MDT NSGO1 silicon cantilevers (N-type, Antimony doped, Au reflective coating) were used. The nominal force constant of these cantilevers was 5.1 N/m. During the measurements cantilever driving frequency was around 150 kHz. Both topography and “error signal” AFM images were taken, and later analyzed using Image Analysis 2.2.0 (NT-MDT) software.
3
Atomic Force Microscopy of Nanosuspensions
4
Atomic Force Microscopy of Nanoparticles
5
Morphological Analysis of Microemulsions by AFM
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Morphology of blank and AC-loaded microemulsions was observed using AFM. 48 h prior to the investigation, 10 μL of the sample was directly deposited onto a small, circular mica disc (Highest Grade V1 AFM Mica Discs; Ted Pella Inc., Redding, California) and dried in desiccator. Measurements were performed with NTEGRA prima AFM (NT-MDT, Moscow, Russia) operating in intermittent-contact AFM mode in air. For this purpose, NT-MDT NSGO1 silicon cantilevers (N-type, Antimony doped, Au reflective coating) were used.
Nominal force constant of these cantilevers is 5.1 N/m, while their resonance frequency lies in the range 87-230 kHz. During the measurements cantilever driving frequency was 156 kHz, and line scanning frequency was 1 Hz. Both topography and "error signal" AFM images were taken and later analyzed using the software Image Analysis 2.2.0 (NT-MDT, Moscow, Russia).
Nominal force constant of these cantilevers is 5.1 N/m, while their resonance frequency lies in the range 87-230 kHz. During the measurements cantilever driving frequency was 156 kHz, and line scanning frequency was 1 Hz. Both topography and "error signal" AFM images were taken and later analyzed using the software Image Analysis 2.2.0 (NT-MDT, Moscow, Russia).
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!