Model x pert pro

X-ray diffraction patterns of Turface samples were obtained from oriented samples on glass slides [44] using a PANalytical X-ray diffractometer (Model X′Pert PRO; Natick, MA) using Co radiation. Data were from 2 to 80° 2θ, counting for 1s every 0.02° 2θ with a total scan time of 30.5 min. Data analysis was performed using X′Pert HighScore Plus software (Version 2.2, PANalytical B.V.).

The XRD patterns were obtained using a X-ray diffractometer (PANalytical Model X’pert PRO, Royston, UK). Film samples with dimensions of 4.0 cm × 1.5 cm were cut and fixed in a circular clamp of the instrument. The analysis was carried out directly and the conditions were as follows: (i) voltage and current: 40 kV and 40 mA, respectively; (ii) scan range from 3° to 30°; (iii) step: 0.1° and (iv) speed 1°/min, equipped with a secondary monochromator of graphite beam. The samples were stored at 25 °C and 50% Relative humidity (RH) and analyzed in triplicate.

The ZnO nanocrystals grown on bare/patterned ITO were structurally characterized using an X-ray diffractometer (PANalytical X’pert Pro model) having Cu Kα radiation (λ = 1.54 Å) in the 2θ range 20° to 80° using grazing incidence X-ray diffraction (GIXRD). The setup consists of an X-ray mirror, a Ni filter, and a PIXcel3D detector in scanning line mode. The surface morphology of the prepared samples was investigated by using a field emission scanning electron microscopy (FESEM) using a Zeiss Supra 40 device. A JEOL 2200FS transmission electron microscope (TEM) was used to investigate the crystallinity of the NCs.

All the chemicals utilized in this study were procured from commercially available sources and used without requiring additional modifications. Solvents were distilled before use. Fourier transform infrared (FT-IR) spectra were obtained using a Bruker Vector-22 infrared spectrometer with KBr pellets. Melting points were measured using a Buchi 535 melting point apparatus. The SEM and EDX analyses were performed using a TESCAN Vega Model scanning electron microscope. XRD patterns were obtained using a X'pert Pro model from Panalytical (Holland). TGA experiments were conducted using a TGA 209F1 thermoanalyzer instrument from Netzsch, (Germany). TEM of the samples were determined using a Zeiss EM10C Transmission Electron Microscope (Germany). NMR spectra were recorded Bruker Avance III HD spectrometer on a 500 or 300 MHz spectrometer for the ¹H nucleus, and a 125.7 or 75 MHz spectrometer for the ¹³C nucleus, using CDCl₃ or DMSO-d₆ as solvent.

Structural analysis of the pulps was performed using the X-ray diffraction technique (XRD, PANalytical, X’Pert Pro model, Almelo, The Netherlands) in a Bragg-Brentano geometry with CuKα radiation (λ = 1.5406 Å) at 45 KV and 40 mA equipped with X’Celerator detector. The diffractograms were obtained with a range of 0.0501° in an angular amplitude 2θ from 10 to 40°. Crystallinity index values were calculated according to the Segal peak height method [27 (link)].

The size and PDI of the NPs were measured directly by dynamic light scattering (DLS), and the ζ-potential was determined by electrophoretic mobility of the NPs, using a Zetasizer (Nano-ZS (Malvern Panalytical Ltd., Malvern, UK) without further dilution or pH adjustments (pH 5.5 ± 0.3). The morphology was observed by TEM (JEM-1400Flash, JEOL Ltd., Tokyo, Japan) and FE-SEM (JSM-7610F, Oxford X-Max 20, JEOL Ltd., Tokyo, Japan). LC and EE of the FVR-MCS-ALG-NPs were determined using an indirect method after ultracentrifugation at 4 °C and 105,000 × g speed for 1 h. The absorbance was measured at 363 nm, and the amount of the free FVR from the supernatant was calculated against the standard curve (Agilent Cary 60, Agilent Technology, Santa Clara, CA, USA). The LC (Equation (1)) and EE (Equation (2)) of the FVR-MCS-ALG-NPs were calculated as follows:

where Wt is the initial amount of FVR added in the formulation, Ws is free FVR in the supernatant, and Wnp is the weight of the NPs after lyophilization.
The thermal properties were determined using a thermogravimetric analyzer (TG 209 F3 Tarsus^®, Netzsch, Germany) in a nitrogen atmosphere at 20 °C/min. The crystalline structure was analyzed using a wide-angle X-ray diffractometer (XRD, PANalytical X’Pert Pro model, Kassel-Waldau, Germany), operated at a speed of 0.2° 2θ/step at room temperature.