15 μL of phage lysate was applied to glow-discharged carbon-coated copper grids (Electron Microscopy Sciences; Carbon Film 150 Mesh, Copper) for two minutes before blotting off using a filter paper. The grids were washed three times with distilled water and stained with 2% (w/v) uranyl acetate. Imaging was performed with JEM-1011 electron microscope (JEOL USA, Inc., Peabody, MA, USA) equipped with a digital CDD camera (Model XR50, AMT Imaging, Woburn, MA, USA). All images were captured at 50,000–120,000x magnification. NucleAIzer software78 (link) was used for AI-based automatic segmentation of phage capsids (DNA-filled heads, empty heads or procapsids) to assess potential size differences between them. The automated segmentation picks were manually checked to ensure proper selection of heads/proheads/capsids, and ImageJ v1.5479 (link) was used to measure their areas. Segmentation was done for all images taken at 60,000× magnification.
Jem 1011 electron
Manufactured by JEOL
Sourced in United States
The JEM-1011 is a transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of samples at the nanoscale level. The JEM-1011 utilizes an electron beam to interact with the sample, allowing users to observe the internal structure and composition of materials with great detail.
Automatically generated - may contain errors
Lab products found in correlation
2 protocols using jem 1011 electron
1
Phage Capsid Morphology Analysis
2
Nanoplatelets Characterization by TEM and EDS
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
A few drops of a dilute NPL suspension in hexane were dropped on
a TEM grid (E. M. Sciences, Carbon film 300 mesh on copper) and inserted
into a JEOL JEM-1011 electron microscope, operated at 100 kV. Bright-field
TEM images were recorded, and the length and width of typically 50/75
NPLs were analyzed. To prepare the specimen for STEM-EDS analysis,
3 μL of sample (Batch3) was drop cast onto an ultrathin carbon/holey
carbon-coated Cu grid and analyzed by an image-Cs-corrected JEOL JEM-2200FS
TEM, operated at 200 kV, with in-column filter (Ω-type) and
Bruker XFlash 5060 SDD system. The presented elemental maps are unprocessed,
that is, obtained simply by integration of the Kα peaks of S
and Se and Lα peaks of Te and Cd.
a TEM grid (E. M. Sciences, Carbon film 300 mesh on copper) and inserted
into a JEOL JEM-1011 electron microscope, operated at 100 kV. Bright-field
TEM images were recorded, and the length and width of typically 50/75
NPLs were analyzed. To prepare the specimen for STEM-EDS analysis,
3 μL of sample (Batch3) was drop cast onto an ultrathin carbon/holey
carbon-coated Cu grid and analyzed by an image-Cs-corrected JEOL JEM-2200FS
TEM, operated at 200 kV, with in-column filter (Ω-type) and
Bruker XFlash 5060 SDD system. The presented elemental maps are unprocessed,
that is, obtained simply by integration of the Kα peaks of S
and Se and Lα peaks of Te and Cd.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!