X pert pro pw3040 60 diffractometerwith

Manufactured by Malvern Panalytical

The X'Pert Pro PW3040/60 diffractometer is a versatile laboratory instrument designed for X-ray diffraction analysis. It is capable of performing a range of measurements, including phase identification, quantitative analysis, and structural characterization of crystalline materials.

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Lab products found in correlation

Spotlight 400 ftir spectrometer, by PerkinElmer (1 mentions) Jsm it100, by JEOL (1 mentions)

Close spelling variants of this product

X’Pert PRO (767 citations) X’Pert (42 citations) X’Pert Pro PW3040/60 (12 citations) PW3040/60 (10 citations) X’pert Pro diffractometerwith (3 citations)

2 protocols using x pert pro pw3040 60 diffractometerwith

In Situ XRD Analysis of Li2O2 Formation

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XRD measurements
were taken using a PANalytical X’Pert Pro PW3040/60 diffractometer
with Cu Kα radiation operating at 45 kV and 40 mA in a 2θ
range of 31–65°. Scans (each ∼30 min in duration)
were recorded for the batteries during a complete (dis)charge cycle
with a current density of 0.3 mA/cm². Refinement of the
diffraction data was performed using the Rietveld method as implemented
in the FullProf program. To more accurately fit the zero position
(effectively positioned at a different height in the cathode) of the
Li₂O₂ diffraction pattern, peaks arising from
the current collector as well as carbon paper were excluded from the
fits.

Li Z., Ganapathy S., Xu Y., Heringa J.R., Zhu Q., Chen W, & Wagemaker M. (2017). Understanding the Electrochemical Formation and Decomposition of Li2O2 and LiOH with Operando X-ray Diffraction. Chemistry of Materials, 29(4), 1577-1586.

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Synthesis and Characterization of Metal-Organic Frameworks

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MIL-100 (Cr), MIL-100
(Fe), MIL-101 (Cr), and aluminum fumarate (AlFu) MOFs were synthesized
according to previous literature.^{30 (link)−33 (link)} The details of the synthesis
are shown in the Supporting Information (SI).
Powder X-ray diffraction patterns of the synthesized MOFs
were obtained by a PANalytical X’Pert Pro pw3040/60 diffractometer
with Cu Kα radiation operating at 45 kV and 40 mA. Brunauer–Emmett–Teller
(BET) surface area of the samples was collected on a Micromeritics
Tristar II at 77 K, and all samples were pretreated at 200 C for 15
h before measurement. Fourier transform infrared spectra (FTIR) of
powder samples was directly measured by a PerkinElmer Spotlight 400
FT-IR spectrometer with a range of 650–2500 cm^–1. The morphology and particle size of the samples were determined
by scanning electron microscopy (SEM, JEOL, JSM-IT100). X-ray photoelectron
spectra (XPS) was collected using a ThermoFisher Al K-alpha apparatus
and scans were performed by a 400 μm spot size with an energy
step size of 0.2 eV. The thermal stability of four MOFs was investigated
by thermogravimetric analysis (TGA) using a Mettler-Toledo/STDA 851e
apparatus with a heating rate of 5 C/min.

Ma C., Liu H., Wolterbeek H.T., Denkova A.G, & Serra Crespo P. (2022). Effects of High Gamma Doses on the Structural Stability of Metal–Organic Frameworks. Langmuir, 38(29), 8928-8933.

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