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Fesem gemini 500

Manufactured by Zeiss
Sourced in Germany

The FESEM Gemini 500 is a field emission scanning electron microscope (FESEM) manufactured by Zeiss. It provides high-resolution imaging capabilities for a wide range of materials and applications. The FESEM Gemini 500 utilizes a field emission electron source to generate a focused electron beam, enabling detailed analysis and observation of samples at the nanoscale level.

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5 protocols using fesem gemini 500

1

Nanofiber Membrane Characterization

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Nanofibers were imaged by a field emission scanning electron microscopy (Zeiss-Gemini-500-FESEM). The diameter of nanofibers was determined by analyzing the SEM images using Adobe Acrobat (Adobe, San Jose, CA). The pore size of the nanofiber membranes was measured using a capillary flow porometer (PMI, CFP-1100-AEHXL).
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2

Cross-section Imaging of Dried Films

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Electron microscopy images were obtained using a Zeiss Gemini500 FESEM. Samples were prepared by cutting dried films with a razor blade, mounting on a cross-section sample holder, and sputter-coated with gold prior to imaging.
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3

Microstructural Characterization via SEM and EDS

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Microstructural characterization was conducted utilizing scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) (FESEM Gemini 500 by Zeiss, Oberkochen, Germany; EDS detector X-Max80 by Oxford Instruments, Abingdon, Oxfordshire, UK). The samples were not coated due to subsequent surface sensitive measurements. Utilization of an acceleration voltage of 1 kV yielded high-quality secondary electron images without inducing surface charging. However, for acquiring backscattered images, 15 kV acceleration voltage was used in variable-pressure mode. This reduced vacuum condition facilitated charge equalization at the surface through interactions with gas molecules.
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4

Capacitive Pressure Sensor Characterization

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The surface morphology of the bottom electrode was characterized by field emission-scanning electron microscopy (Zeiss FESEM Gemini 500). The capacitance of the pressure sensor (10 mm × 10 mm) was measured by an LCR meter (Hioki IM3536) at a frequency of 1 kHz, unless specified otherwise. A force gauge (HLB Test Stand+HP-500N, Mxmoonfree Co., Ltd) was used to apply and record the pressure. Signals from two capacitors for robotic hand application were measured by the Arduino nano board69 . The repeatability test was performed by using a linear rail guide slide actuator. Areal capacitances were measured by sandwiching the ionic gel between two flat PET/ITO electrodes. Smoothening of the noisy data (stage 3 in Fig. 6f) was achieved by applying an FFT filter with 5 points of window in Origin.
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5

Seed Epidermal Morphology Analysis

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SEM was used to examine epidermal morphology of dry seeds. Wild-type and cellox mutants seeds were mounted without any preparation on aluminum stubs and observed by Scanning Electron Microscopy (FESEM Gemini 500, Zeiss) equipped whit Peltier MK3 Coolstage (Zeiss) at 10 kV, 20Pa (VP), 4°C. The SEM observations were carried out at different magnifications (400 X, 1000 X and 3000 X).
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