Agilent Eos, Gemini diffractometer
Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2014 ▸ ) Tmin = 0.747, Tmax = 1.000
17587 measured reflections
5402 independent reflections
4006 reflections with I > 2σ(I)
Rint = 0.044
The Eos Gemini diffractometer is a versatile laboratory instrument designed for X-ray diffraction analysis. It provides high-quality data collection and analysis capabilities for a wide range of samples, including powders, single crystals, and thin films. The core function of the Eos Gemini is to accurately measure the diffraction patterns of materials, which can be used to determine their crystal structure, phase composition, and other important properties.
Agilent Eos, Gemini diffractometer
Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2014 ▸ ) Tmin = 0.747, Tmax = 1.000
17587 measured reflections
5402 independent reflections
4006 reflections with I > 2σ(I)
Rint = 0.044
Agilent Eos Gemini diffractometer
Absorption correction: multi-scan (CrysAlis PRO and CrysAlis RED, Agilent (2012 ▶ ). Tmin = 0.881, Tmax = 1.000
11343 measured reflections
6209 independent reflections
5042 reflections with I > 2σ(I)
Rint = 0.019
Agilent Eos Gemini diffractometer
Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2014 ▸ ) Tmin = 0.541, Tmax = 1.000
16532 measured reflections
4076 independent reflections
3888 reflections with I > 2σ(I)
Rint = 0.033
Agilent Agilent (Eos, Gemini) diffractometer
Absorption correction: multi-scan (CrysAlis RED; Agilent, 2012 ▶ ) Tmin = 0.582, Tmax = 1.000
7059 measured reflections
2250 independent reflections
2065 reflections with I > 2σ(I)
Rint = 0.037
Agilent Eos Gemini diffractometer
Absorption correction: multi-scan (CrysAlis PRO and CrysAlis RED; Agilent, 2012 ▶ ) Tmin = 0.429, Tmax = 1.000
4327 measured reflections
2710 independent reflections
2365 reflections with I > 2σ(I)
Rint = 0.032
Agilent Eos, Gemini diffractometer
Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2012 ▶ ) Tmin = 0.896, Tmax = 1.000
22680 measured reflections
6047 independent reflections
4745 reflections with I > 2σ(I)
Rint = 0.029
Agilent Eos Gemini diffractometer
Absorption correction: multi-scan (CrysAlis PRO and CrysAlis RED; Agilent, 2012 ▶ ) Tmin = 0.598, Tmax = 1.000
28568 measured reflections
13782 independent reflections
10981 reflections with I > 2σ(I)
Rint = 0.035
Agilent Eos Gemini diffractometer
Absorption correction: multi-scan (CrysAlis PRO and CrysAlis RED; Agilent, 2012 ▶ ) Tmin = 0.162, Tmax = 1.000
7163 measured reflections
4131 independent reflections
3490 reflections with I > 2σ(I)
Rint = 0.033
Agilent Eos Gemini diffractometer
Absorption correction: multi-scan (CrysAlis PRO and CrysAlis RED; Agilent, 2012 ▶ ) Tmin = 0.756, Tmax = 1.000
3374 measured reflections
2168 independent reflections
1934 reflections with I > 2σ(I)
Rint = 0.025
Agilent Eos Gemini diffractometer
Absorption correction: multi-scan (CrysAlis PRO and CrysAlis RED; Agilent, 2012 ▶ ) Tmin = 0.865, Tmax = 1.000
11535 measured reflections
6843 independent reflections
6396 reflections with I > 2σ(I)
Rint = 0.039
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